Radio Frequency Integrated Circuit Design - Webs

134 Radio Frequency Integrated Circuit Design
Figure 5.36 Track width versus gap or space to result in Z = 50� for coupled microstrip
lines and coplanar waveguide.
5.24 High-Frequency Measurement of On-Chip Passives and
Some Common De-Embedding Techniques
So far, we have considered inductors, transformers, and their Z parameters. In this
section, we will discuss how to obtain those Z parameters from measurements. A
typical set of test structures for measuring an inductor in a pad frame is shown
in Figure 5.37. High-frequency ground-signal-ground probes will be landed on
these pads so that the S parameters of the structure can be measured. However,
while measuring the inductor, the pads themselves will also be measured, and
Figure 5.37 Example of high-frequency structures used for measuring on-chip passives.