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Application and Optimisation of the Spatial Phase Shifting ...

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122 Comparison <strong>of</strong> noise in phase maps from TPS <strong>and</strong> SPS<br />

The conversion factor from phase to displacement is λ/288° or λ/(205 grey levels), which means that one<br />

wavelength <strong>of</strong> in-plane displacement generates 0.8 sawtooth fringes. This has an important consequence:<br />

even "good" sawtooth images with low phase σ ∆ϕ error yield a large displacement error σ d after <strong>the</strong><br />

conversion. Indeed, as Fig. 5.8 shows, <strong>the</strong> ordinate scale <strong>of</strong> previously 0.146 λ for <strong>the</strong> out-<strong>of</strong>-plane<br />

measurements changes to σ d,max 0.36 λ.<br />

0.35<br />

σ d /λ<br />

0.30<br />

5<br />

0<br />

0.25<br />

5<br />

0.20<br />

0<br />

0.15<br />

5<br />

0.10<br />

0<br />

0.05<br />

0.00<br />

N x<br />

0 5 10 15<br />

20 30 40 50<br />

5<br />

60 70 90 100<br />

0<br />

0 2 4 6 8 d s /d p<br />

10<br />

0 2 4 6 8 d s /d p<br />

10<br />

Fig. 5.8: σ d for ESPI displacement measurements with SPS (left) <strong>and</strong> TPS (right) as a function <strong>of</strong> speckle size for<br />

in-plane displacements. The parameter for each curve is N x , <strong>the</strong> number <strong>of</strong> vertical fringes per 1024<br />

pixels, as indicated in <strong>the</strong> legend box.<br />

Since no object tilts are involved here, <strong>the</strong> image decorrelation is exclusively <strong>of</strong> type (ii). Evidently, this<br />

does not change <strong>the</strong> qualitative course <strong>of</strong> <strong>the</strong> plots: <strong>the</strong>y strongly resemble those <strong>of</strong> Fig. 5.5. Again, a<br />

speckle size between 2.5 <strong>and</strong> 4 d p is found to be a good choice for SPS <strong>and</strong> about 1 d p for TPS. The<br />

evaluation <strong>of</strong> σ d with TPS <strong>and</strong> SPS, respectively, for various N y , led to similar performance as for N x .<br />

On comparing <strong>the</strong> σ d obtained here with those from Chapter 5.4, it turns out that here <strong>the</strong> σ d are about 2.5<br />

times as large as in 5.4, particularly for <strong>the</strong> SPS measurements, where <strong>the</strong> factor is nearly exact. This is a<br />

direct consequence <strong>of</strong> <strong>the</strong> reduced sensitivity (40% that <strong>of</strong> <strong>the</strong> out-<strong>of</strong>-plane configuration) <strong>and</strong> tells us<br />

that <strong>the</strong> σ ∆ϕ in <strong>the</strong> underlying sawtooth images are very similar in both cases. The displacement<br />

information is encoded in <strong>the</strong> interferograms in <strong>the</strong> same way, but by different displacements, for <strong>the</strong> out<strong>of</strong>-plane<br />

<strong>and</strong> in-plane configurations. Hence it is not surprising that also <strong>the</strong> σ ∆ϕ are on a comparable<br />

level. This result confirms that we now have reasonable performance data for smooth-reference ESPI setups<br />

with TPS <strong>and</strong> SPS at our disposal.

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