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Application and Optimisation of the Spatial Phase Shifting ...

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76 Electronic or Digital Speckle Pattern Interferometry<br />

whenever <strong>the</strong> integration interval is symmetrical. The static method is referred to as <strong>the</strong> step method <strong>and</strong><br />

<strong>the</strong> dynamically phase shifting approach is known as integrating-bucket or simply bucket method<br />

[Wya75].<br />

The equation system (3.12) or (3.59) is set up under <strong>the</strong> assumption that <strong>the</strong> unknowns do not change<br />

from frame to frame, i.e. are temporally constant. While this is very likely to be correct for I b <strong>and</strong> M I , it is<br />

difficult to assure for ϕ O , which is why vibration-isolating optical tables, phase stabilisation facilities<br />

<strong>and</strong>/or short exposure times are very common with this method. The interferograms I n (x,y,t n ) must be<br />

recorded as quickly as possible to diminish influences by object changes or phase fluctuations in <strong>the</strong><br />

interferometer, <strong>and</strong> <strong>the</strong> possibilities to carry out TPS measurements <strong>of</strong> rapidly moving objects or under<br />

external disturbances are limited. Fig. 3.19 presents sawtooth phase maps from experiments under various<br />

conditions. While TPS delivers good phase measurements under temporally stable conditions, a vibrating<br />

interferometer (here: table without air cushion) can cause wrong phase shifts <strong>and</strong> thus loss <strong>of</strong> direction<br />

information. With locally different phase shifts, as caused by turbulent air in <strong>the</strong> beam paths, also <strong>the</strong><br />

qualitative correctness <strong>of</strong> <strong>the</strong> image may get lost.<br />

Fig. 3.19: Sawtooth phase maps as results <strong>of</strong> deformation measurement with TPS under: stable experimental<br />

conditions (left), vibrations (centre), <strong>and</strong> air turbulences (right).<br />

Much work has been done to cope with <strong>the</strong> various error sources: phase-shift miscalibrations [Moo80,<br />

Schwi83, Che85, Joe94, Sla95, Och98], vibrations [dGro96, Dec96, Dec98, Hun98], unequal <strong>and</strong>/or<br />

uncalibrated phase steps [Gre84, Oka91, Far94, Ryu97, Wei99], nonsinusoidal intensity pr<strong>of</strong>ile [Hib95],<br />

<strong>and</strong> in a wider context, variable bias intensity [Ono96, Sur97b], or variable fringe visibility [Lar96]. There<br />

have also been attempts to reduce <strong>the</strong> data acquisition time by 2+1-frame methods [Ker90, Col92, Fac93,<br />

Ng 96] or high-speed devices [Cog99, Hun99]. Many <strong>of</strong> <strong>the</strong>se efforts are concerned with <strong>the</strong> sensitivity <strong>of</strong><br />

TPS to time-dependent phase fluctuations, which shows that <strong>the</strong>se are indeed a major obstacle.<br />

3.3.1 Speckle "size" in interferograms<br />

The experimental determination <strong>of</strong> <strong>the</strong> mean speckle size is usually done by calculating <strong>the</strong><br />

autocorrelation function <strong>of</strong> <strong>the</strong> speckle intensity field <strong>and</strong> determining <strong>the</strong> full or half width <strong>of</strong> its central<br />

peak. As <strong>the</strong> speckles get smaller, this digital method grows imprecise because <strong>the</strong> peak is <strong>the</strong>n only a few<br />

pixels wide <strong>and</strong> requires fitting a curve to it to estimate its width with subpixel accuracy. When dealing<br />

with speckle interferograms however, <strong>the</strong>re is a simpler method: one can conveniently determine <strong>the</strong><br />

speckle size from <strong>the</strong> power spectrum <strong>of</strong> an interferogram, in which <strong>the</strong> speckle size is "doubled" by

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