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Application and Optimisation of the Spatial Phase Shifting ...

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142 Improvements on SPS<br />

0.12<br />

σ d /λ<br />

0.10<br />

0.08<br />

0.06<br />

0.04<br />

0.02<br />

0.00<br />

0 0<br />

20 20<br />

50 50<br />

100 100<br />

1 10 B 100<br />

N x<br />

Fig. 6.6: σ d for ESPI displacement measurements by SPS with <strong>and</strong> without intensity correction as a function <strong>of</strong> B.<br />

White, phase calculation according to (6.5); black, phase calculation by (3.19). Selected N x as indicated in<br />

<strong>the</strong> legend box.<br />

We have seen before in Fig. 6.1 that <strong>the</strong> advantage <strong>of</strong> using <strong>the</strong> intensity correction will vanish at B30;<br />

<strong>the</strong>refore we look at (6.5) for B ∈ {3, 10, 30} only. On <strong>the</strong> o<strong>the</strong>r h<strong>and</strong>, without intensity correction <strong>the</strong><br />

lowest σ d occur around B30, which is why we select B ∈ {10, 30, 100} to investigate <strong>the</strong> phase<br />

calculation with (3.19). Fig. 6.6 confirms that <strong>the</strong> phase calculation by (3.19) (corresponding σ d : black<br />

symbols) produces <strong>the</strong> lowest σ d at B 30, while (6.5) (corresponding σ d : white symbols) operates most<br />

advantageously at B=3 <strong>and</strong> B=10 <strong>and</strong> slightly worse at B=30. As familiar by now, <strong>the</strong> differences <strong>of</strong> <strong>the</strong><br />

two calculation methods are most pronounced at low fringe densities: initially, a reduction <strong>of</strong> σ d by some<br />

5% can be attained by using <strong>the</strong> intensity correction; but as N x rises <strong>and</strong> decorrelation sets in, <strong>the</strong><br />

difference vanishes almost completely. Hence, in most situations it will suffice to set B 30 <strong>and</strong> to<br />

record interferograms only.<br />

6.2.2 Consideration <strong>of</strong> speckle phase gradients<br />

When <strong>the</strong> speckles are as small as 3 d p , <strong>the</strong> phase structure <strong>of</strong> speckle patterns cannot be measured with<br />

sufficient sampling resolution by <strong>the</strong> pixels - <strong>and</strong> less so with SPS -, so that <strong>the</strong>re is no possibility to go<br />

<strong>the</strong> same way as above with <strong>the</strong> intensities <strong>and</strong> use <strong>the</strong> speckle phases for error compensation. Yet<br />

remembering <strong>the</strong> findings <strong>of</strong> Chapter 2.2.5, <strong>the</strong> speckle phases seem to be less harmful for interferometry<br />

than <strong>the</strong> intensities anyway. Therefore we will use <strong>the</strong> simple assumption that not <strong>the</strong> speckle phase ϕ O ,<br />

but its gradient ϕ O,x be constant over <strong>the</strong> short sequence <strong>of</strong> pixels that we use for phase retrieval. This is<br />

quite rough an approximation but it may be seen from Fig. 2.14 that it holds reasonably for <strong>the</strong> brighter<br />

parts <strong>of</strong> <strong>the</strong> image that we are mainly interested in. Treating <strong>the</strong> phase gradients in this way is equivalent<br />

to assuming local linear miscalibrations <strong>of</strong> <strong>the</strong> phase shift, as detailed in Chapter 3.2.2. We may <strong>the</strong>n

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