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Application and Optimisation of the Spatial Phase Shifting ...

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160 Improvements on SPS<br />

uncertain, frequently occur at locations that are different in <strong>the</strong> v <strong>and</strong> h fields. This gets clear when we<br />

express <strong>the</strong> probability <strong>of</strong> finding a "bad" pixel (denoted by subscript b) at (x,y) in ei<strong>the</strong>r speckle pattern<br />

by P vb (x,y) <strong>and</strong> P hb (x,y) <strong>and</strong> that <strong>of</strong> finding a bad pixel in both speckle patterns by P bb (x,y). Then we have<br />

Pbb ( x, y) ≅ Pvb ( x, y) Phb<br />

( x, y)<br />

, (6.24)<br />

which is exact when c=0. Provided both P vb (x,y) <strong>and</strong> P hb (x,y) are distinctly smaller than unity, this means<br />

that it is possible to replace most <strong>of</strong> <strong>the</strong> bad pixels from one speckle pattern by valid pixels from <strong>the</strong> o<strong>the</strong>r<br />

one. There are <strong>of</strong> course always several points (even for c = 0) where bad pixels in both speckle fields<br />

coincide. But in any case, <strong>the</strong> number <strong>of</strong> bad points in <strong>the</strong> phase map can be minimised by suitable<br />

merging <strong>of</strong> ϕ O,v (x,y) <strong>and</strong> ϕ O,h (x,y).<br />

The merging process is carried out by analysing M I (x,y) in <strong>the</strong> interferograms between <strong>the</strong> reference wave<br />

(ideally linearly polarised at 45°) <strong>and</strong> <strong>the</strong> vertically or horizontally polarised object wave [Cre88],<br />

2<br />

I , vi 1vi 3vi 2vi 1vi 3vi<br />

M ( x, y) = 3( I − I ) + ( 2I − I − I )<br />

2<br />

2<br />

(6.25)<br />

M ( x, y) = 3( I − I ) + ( 2I − I − I ) ,<br />

I , hi 1hi 3hi 2hi 1hi 3hi<br />

where α=120°/sample <strong>and</strong> <strong>the</strong> index i refers to <strong>the</strong> initial object state, for reasons to become clear shortly.<br />

It should be emphasised that <strong>the</strong>se M I are derived from <strong>the</strong> "sine" <strong>and</strong> "cosine" terms <strong>of</strong> (3.17), which<br />

must <strong>the</strong>n be used for <strong>the</strong> subsequent phase determination; if o<strong>the</strong>r α, or phase-calculation formulae, are<br />

used, <strong>the</strong> respective "sine" <strong>and</strong> "cosine" terms have to be inserted under <strong>the</strong> square root. Due to <strong>the</strong> low<br />

correlation between <strong>the</strong> v <strong>and</strong> h speckle patterns, <strong>the</strong> two maps <strong>of</strong> M I,vi (x,y) <strong>and</strong> M I,hi (x,y) will also be<br />

different, <strong>and</strong> <strong>the</strong> higher <strong>of</strong> <strong>the</strong> two values ought to indicate <strong>the</strong> prospect <strong>of</strong> a more accurate phase<br />

measurement. Admittedly, (6.25) is not as reliable in SPS as in TPS [Su 94] due to <strong>the</strong> underlying speckle<br />

structure that may yield bogus modulation when <strong>the</strong> pixel triplet crosses speckle "boundaries"; but as far<br />

as a comparison <strong>of</strong> M I,vi (x,y) <strong>and</strong> M I,hi (x,y) is concerned, this approach still works ra<strong>the</strong>r well, as we shall<br />

see.<br />

The interferograms are recorded by a CCD camera behind a polariser in <strong>the</strong> vertical or horizontal position;<br />

setting <strong>the</strong> plane <strong>of</strong> polarisation <strong>of</strong> <strong>the</strong> reference wave to ideally 45° assures P vb (x,y)P hb (x,y). For each<br />

point (x,y) in both interferograms we determine M I,vi (x,y) <strong>and</strong> M I,hi (x,y) <strong>and</strong> <strong>the</strong> phase distributions<br />

ϕ O,vi (x,y) <strong>and</strong> ϕ O,hi (x,y). Then, starting with ϕ O,vi (x,y), we replace all phase values in this map by those<br />

from ϕ O,hi (x,y) at all <strong>the</strong> locations where M I,vi (x,y) < M I,hi (x,y). Thus, a pixel is considered "bad" in <strong>the</strong><br />

sense <strong>of</strong> (6.24) when a better measurement is available. The locations <strong>of</strong> replaced pixels are stored in a<br />

binary mask B i (x,y).<br />

Repeating this modulation analysis for <strong>the</strong> final object state would lead to a slightly different map B f (x,y)<br />

due to speckle decorrelation by <strong>the</strong> object deformation <strong>and</strong> statistical temporal fluctuations like camera<br />

noise. Therefore, B i (x,y) is used for <strong>the</strong> final object state too. That is, <strong>the</strong> phase values in <strong>the</strong> map<br />

ϕ O,vf (x,y) are replaced by those <strong>of</strong> <strong>the</strong> map ϕ O,hf (x,y) at <strong>the</strong> same locations where <strong>the</strong> replacement is done<br />

2

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