178
179 8 References [Ada97] [Aebi97] [Aebi99] [Alb99] M. Adams, K. Hinsch, F. Lange, K. Wolff: Polarization effects in speckle correlation metrology, Opt. Eng. 36.8 (1997), 2225-2228 H. Aebischer, E. Mazza: Measurement <strong>of</strong> <strong>the</strong> nanometre deformation field in metallic microbars with microscopical ESPI, in: Optical Inspection <strong>and</strong> Micromeasurement II, Proc. SPIE 3098 (1997), 400- 410 H. Aebischer, S. Waldner: A simple <strong>and</strong> effective method for filtering speckle-interferometric phase fringe patterns, Opt. Comm. 162 (1999), 205-210 D. Albrecht: Estimation <strong>of</strong> <strong>the</strong> 2D measurement error introduced by in-plane <strong>and</strong> out-<strong>of</strong>-plane ESPI measurements, Opt. Las. Eng. 31 (1999), 63-81 [All63] L. Allen, D. Jones: An analysis <strong>of</strong> <strong>the</strong> granularity <strong>of</strong> scattered optical maser light, Phys. Lett. 7.5 (1963), 321-323 [Ara96] [Ara97] [Bah80] [Bar80] [Bar81] [Bar83] Y. Arai, S. Yokozeki, T. Yamada: High-speed fringe analysis method using frequency-demodulation technology, Opt. Eng. 35.8 (1996), 2341-2344 Y. Arai, S. Yokozeki, K. Shiraki, T. Yamada: High-precision two-dimensional spatial fringe analysis method, J. Mod. Opt. 44.4 (1997), 739-751 R. Bahuguna, K. Gupta, K. Singh: Expected number <strong>of</strong> intensity level crossings in a normal speckle pattern (Letter), JOSA 70.7 (1980), 874-876 R. Barakat: The level-crossing rate <strong>and</strong> above-level duration time <strong>of</strong> <strong>the</strong> intensity <strong>of</strong> a Gaussian r<strong>and</strong>om process, Inf. Sci. 20 (1980), 83-87 N. Baranova, B. Zel'dovich: Dislocations <strong>of</strong> <strong>the</strong> wave-front surface <strong>and</strong> zeros <strong>of</strong> <strong>the</strong> amplitude, Sov. Phys. JETP 53.5 (1981), 925-929 N. Baranova, A. Mamaev, N. Pilipetskii, V. Shkunov, B. Zel'dovich: Wave-front dislocations: topological limitations for adaptive systems with phase conjugation, JOSA 73.5 (1983), 525-528 [Bar85] R. Barakat: The statistical properties <strong>of</strong> partially polarized light, Opt. Act. 32.3 (1985), 295-312 [Bar87] R. Barakat: Second-order statistics <strong>of</strong> integrated intensities <strong>and</strong> <strong>of</strong> detected photoelectrons, J. Mod. Opt. 34.1 (1987), 91-102 [Bar88] R. Barakat: Level-crossing statistics <strong>of</strong> aperture-integrated isotropic speckle, JOSA A 5.8 (1988), 1244-1247 [Bar91] [Bar99] [Bas95] R. Barakat: Probability density <strong>of</strong> <strong>the</strong> radial gradient <strong>of</strong> aperture-averaged isotropic-speckle intensity (Letter), JOSA A 8.2 (1991), 450-451 B. Barrientos García, A. Moore, C. Pérez López, L. Wang, T. Tschudi: <strong>Spatial</strong> phase-stepped interferometry using a holographic optical element, Opt. Eng. 38.12 (1999), 2069-2074 I. Basistiy, M. Soskin, M. Vasnetsov: Optical wavefront dislocations <strong>and</strong> <strong>the</strong>ir properties, Opt. Comm. 119 (1995), 604-612 [Ber78] M. Berry: Disruption <strong>of</strong> wavefronts: statistics <strong>of</strong> dislocations in incoherent Gaussian r<strong>and</strong>om waves, J. Phys. A 11.1 (1978), 27-37 [Ber97] [Bie89] [Bon86] E. Berger, W. von der Linden, V. Dose, M. Ruprecht, A. Koch: Approach for <strong>the</strong> evaluation <strong>of</strong> speckle deformation measurements by application <strong>of</strong> <strong>the</strong> wavelet transformation, Appl. Opt. 36.29 (1997), 7455-7460 E. Bieber, W. Osten: Improvement <strong>of</strong> speckled fringe patterns by Wiener filtration, in: Interferometry '89, Proc. SPIE 1121 (1989), 393-399 D. Bone, H. Bachor, R. S<strong>and</strong>eman: Fringe-pattern analysis using a 2-D Fourier transform, Appl. Opt. 25.10 (1986); D. Bone, H. Bachor, R. S<strong>and</strong>eman: Spectral line interferometry with temporal <strong>and</strong> spatial resolution, Opt. Comm. 57 (1986), 39-44