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M27C1024PROGRAMMING OPERATION (Tamb=25°C ±5°C, V ee(1)=6.25V ±O.25V, Vpp(l) = 12.5V ±O.5V)DC AND OPERATING CHARACTERISTIC:SymbolParameterTest Conditions(See note 1)ValuesMin. Typ. Max.UnitILl Input Current (<strong>Al</strong>l Inputs) VIN = VIL or VIH 10 ~AVIL Input Low Level (<strong>Al</strong>l Inputs) -0.1 0.8 VVIH Input High Level 2.0 Vee+ 0.5 VVOL Output Low Voltage During Verify IOL=2.1 mA 0.45 VVOH Output High Voltage During Verify IOH= -400 ~A 2.4 Vlee2 Vee Supply Current 20 50 mAIpP2 Vpp Supply Current (Program) CE=VIL 50 mAVIO A9 Electronic Signature Voltage 11.5 12.5 VAC CHARACTERISTICSSymbolParameterTest ConditionsValues(See note 1) Min. Typ. Max. UnittAS Address Setup Time 2 /istOES OE Setup Time 2 /istos Data Setup Time 2 /is ,tAH Address Hold Time 0 /istOH Data Hold Time 2 /istOFP(2) Output Enable Output Float Delay 0 130 nstvps Vpp Setup Time 2 /istves Vee Setup Time 2 /isteEs CE Setup Time 2 /istpw PGM Initial Program Pulse Width 95 100 105 /istOE Data Valid from OE 100 nsNotes:I. Vee must be applied simultaneously or before Vpp and removed simultaneously or after Vpp.2. This parameter is only sampled and not 100% tested.Output Float is defined as the point where data is no longer driven (see timing diagram).7/10139
M27C1024PROGRAMMING WAVEFORMSVIHADDRESSESVILVIHDATAVILXlASIIDATAPROGRAMADDRE':>':> ':>TABLEIN ':>TABLEIIVERIFY1\ JHZI \DATA OUT VALID /~JIKlOS IDH IDFPIAHVpp12.S VSVJ IVPSVee6VSV/lvesaVIHVIL1\leESVIHPGMOEVILV1HVIL5-10658IpW~ IOE -.:..::..."\Notes:1. The input timing reference level is O.BV for a VIL and 2V for a VIH.2. tOE and tOPF are characteristics of the device but must be accommodated by the programmer.3. When programming the M27C1024 a O.1~F capacitor is required across Vpp and GROUND to suppress spurious voltage transientswhich can damage the device.8/10140
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MEMORY PRODUCTSDATABOOK1st EDITIONJ
Page 4:
TABLE OF CONTENTSGENERAL INDEX Page
Page 7 and 8:
GENERAL INDEXPageROM DEVICES ......
Page 10 and 11:
GENERAL INFORMATIONThe SGS-THOMSON
Page 12 and 13:
SELECTION GUIDECMOS UV EPROMPart Nu
Page 14 and 15:
SELECTION GUIDECMOS OTP ROMPart Num
Page 16 and 17:
SELECTION GUIDEZEROPOWERPart Number
Page 18 and 19:
SELECTION GUIDEFAST STATIC RAMPart
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12 32Kx8 NMOS M27256FUV EPROMPRODUC
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VFSRAMPRODUCTDESCRIPTIONSGS-THOMSON
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EPROM DEVICESNMOS UV EPROM23
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ET2716/M2716BLOCK DIAGRAM~ VPP'5V+-
Page 29 and 30:
ET2716/M2716AC TEST CONDITIONSOutpu
Page 31 and 32:
ET2716/M2716ERASINGThe M/ET2716 is
Page 33 and 34:
ET2716/M2716SWITCHING TIME WAVEFORM
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M2732A32K (4K x 8) NMOS UV ERASABLE
Page 38 and 39:
M2732AREAD OPERATIONDC AND AC CONDI
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M2732APROGRAMMING OPERATION(l) (T a
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M2732APROGRAMMING OPERATION (Contin
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M2764ABLOCK DIAGRAMDATA OUTPUT00- 0
Page 47 and 48:
M2764AREAD OPERATION (Continued)AC
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M2764ADEVICE OPERATION (Continued)T
Page 51 and 52:
M2764APROGRAMMING WAVEFORMSV1HADDRE
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M2764AORDERING INFORMATIONPart Numb
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M27128ABLOCK DIAGRAMVceO--GND o--
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M27128AREAD OPERATION (Continued)AC
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M27128ADEVICE OPERATION (Continued)
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M27128APROGRAMMING WAVEFORMSIVIHADD
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M27128AORDI:RING INFORMATIONPart Nu
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M27256BLOCK DIAGRAMVeco----GNOo-
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M27256READ OPERATION (Continued)AC
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M27256DEVICE OPERATION (Continued)P
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M27256PROGRAMMING WAVEFORMSPROGRAMP
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M27256ORDERING INFORMATIONPart Numb
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M27512BLOCK DIAGRAMVee o-----?GNOO-
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M27512AC TEST CONDITIONSOutput Load
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M27512DEVICE OPERATIONS (Continued)
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M27512DEVICE OPERATION (Continued)M
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M27512PROGRAMMING OPERATION (T amb=
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M27512M27512 DESIGN INNOVATIONS FOR
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M27512Figure 7 - M27512 Sensing sch
Page 90: EPROM DEVICESCMOS UV EPROM89
Page 93 and 94: ETC2716BLOCK DIAG~AM+-- vpp+-- vcc+
Page 95 and 96: ETC2716AC TEST CONDITIONSOutput Loa
Page 97 and 98: ETC2716ERASING~he ETC?716 !s erased
Page 99 and 100: ETC2716SWITCHING TIME WAVEFORMSR.ed
Page 102 and 103: ETC273232K BIT (4K x 8) CMOS UV ERA
Page 104 and 105: ETC2732READ OPERATIONDC CHARACTERIS
Page 106 and 107: ETC2732DEVICE OPERATIONThe five mod
Page 108 and 109: ETC2732PROGRAMMING WAVEFOR'''SNote:
Page 110 and 111: ETC2732SWITCHING TIME WAVEFORMSRead
Page 112 and 113: TS27C64AQ64K (8K x 8) CMOS UV ERASA
Page 114 and 115: TS27C64AQREAD OPERATIONDC CHARACTER
Page 116 and 117: TS27C64AQDEVICE OPERATIONThe seven
Page 118 and 119: TS27C64AQAC TEST CONDITIONSInput ri
Page 120: TS27C64AQORDERING INFORMATIONPart N
Page 123 and 124: TS27C256QBLOCK DIAGRAMVee 0----.GND
Page 125 and 126: TS27C256QAC TEST CONDITIONSOutput L
Page 127 and 128: TS27C256QERASINGThe TS27C256 is era
Page 129 and 130: TS27C256QHIGH SPEED PROGRAMMING FLO
Page 131 and 132: ,1,;'"
Page 133 and 134: ST27C1001BLOCK DIAGRAMv P P cr-----
Page 135 and 136: M27C1024BLOCK DIAGRAMVpp 0----:---+
Page 137 and 138: M27C1024AC TEST CONDITIONSOutput Lo
Page 139: M27C,1024PROGRAM INHIBITProgramming
Page 143 and 144: M27C1024ORDERING INFORMATIONPart Nu
Page 146 and 147: ST2764AP64K (8K x 8) NMOS ONE TIME
Page 148 and 149: ST2764APREAD OPERA nONDC AND AC CON
Page 150 and 151: ST2764APDEVICE OPERATIONThe seven m
Page 152 and 153: ST2764APPROGRAMMING OPERATION (Tamb
Page 154 and 155: ST2764APFAST PROGRAMMING FLOWCHART9
Page 156 and 157: ST27128AP128K (16K x 8) NMOS ONE TI
Page 158 and 159: ST27128APREAD OPERATIONDC AND AC CO
Page 160 and 161: ST27128APDEVICE OPERATIONThe seven
Page 162 and 163: ST27128APPROGRAMMING OPERATION (Tam
Page 164 and 165: ST27128APFAST PROGRAMMING FLOWCHART
Page 166 and 167: ST27256P256K (32K x 8) NMOS ONE TIM
Page 168 and 169: ST27256PREAD OPERATIONDC AND AC CON
Page 170 and 171: ST27256PDEVICE OPERATIONThe eight m
Page 172 and 173: ST27256PPROGRAMMING OPERATION (Tamb
Page 174 and 175: ST27256PFAST PROGRAMMING FLOWCHARTF
Page 176: EPROM DEVICESCMOS OTP ROM175
Page 179 and 180: TS27C64AFN-TS27C64APBLOCK DIAGRAMVe
Page 181 and 182: TS27C64AFN-TS27C64APAC TEST CONDITI
Page 183 and 184: TS27C64FN-TS27C64APPROGRAMMINGOPERA
Page 185 and 186: TS27C64AFN-TS27C64APHIGH SPEED PROG
Page 187 and 188: TS27C64AFN~TS27C64APORDERING INFORM
Page 189 and 190: ST27C256FN-ST27C256PBLOCK DIAGRAMVc
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ST27C256FN·ST27C256PAC TEST CONDIT
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ST27C256FN-ST27C256PPROGRAMMING CHA
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ST27C256FN·ST27C256PHIGH SPEED PRO
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ST27C256FN-ST27C256PORDERING INFORM
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SGS-1HOMSON~ ., L ~D©ffi1@rn[brn©
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M8571ELECTRICAL CHARACTERISTICS (0
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M8571S-BUS DESCRIPTION (Continued)A
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M8571S·BUS INTERFACEThe serial, 3-
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M8571MASTER. READS AFTER SETTING WO
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M8571ORDERING INFORMATIONPort Numbe
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M9306BLOCK DIAGRAM00DI---+-+-+-+---
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M93D6FUNCTIONAL DESCRIPTIONThe inpu
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M9306ORDERING INFORMATIONPart Numbe
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M9346BLOCK DIAGRAMDl~-r------------
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M9346FUNCTIONAL DESCRIPTIONThe inpu
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M9346INSTRUCTION SETInstruction S8
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M9346TIMING DIAGRAMS (Continued)INS
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EEPROM DEVICESCMOS EEPROM227
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ST24C02BLOCK DIAGRAMseL--~~--~-----
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ST24C02FIG. 2A· DATA TRANSFER SEQU
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ST24C02ELECTRICAL CHARACTERISTICSAC
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ST24C02FIG. 4A· PAGE WRITEBUS ACTI
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TS59C111 K BIT SERIAL CMOS EEPROM
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TS59C11READ OPERATIONDC CHARACTERIS
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TS59C11The READ instruction is the
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TS59C11FIG. 5b - ERAL (Erase all) M
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~ SGS-1HOMSONIt.. ~ L [j\I'A]O©OO@
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TS93C46READ OPERATIONDC CHARACTERIS
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TS93C46INSTRUCTION TIMINGSREADSK ~u
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~TS93C46ORDERING INFORMATIONPart Nu
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ST93C56BLOCK DIAGRAMPROTECTREGISTER
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M2316H16K-BIT READ ONLY MEMORY• S
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M2316HSTATIC ELECTRICAL CHARACTERIS
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M2332M233332K-BIT READ ONLY MEMORY
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M2332/M2333DC AND OPERATING CHARACT
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~ SGS-11I0MSONA., L ~D©[Ri@~[lJ~©
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M2364DC AND OPERATING CHARACTERISTI
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M236564K-BIT READ ONLY MEMORY• PI
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M2365DC AND OPERATING CHARACTERISTI
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STATIC RAM DEVICES275
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MK48Z02N2(B)-12115/20/25DESCRIPTION
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MK48Z02112(B)-12115/20/25WRITE MODE
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MK48Z02/12(B)-12/15/20/25FIGURE 6.
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MK48Z02/12(B)-12/15/20/25FIGURE 7.
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MK48Z02112(B}-12115/20/25AC TEST CO
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MK48C02A/12A(K, N)·15/20/252K x 8
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MK48C02AI12A(K,N)-15/20/25OPERATION
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MK48C02A/12A(K, N)-15/20/25DATA RET
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MK48C02A112A(K,N)-15/20/25FIGURE 6.
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MK48C02A112A(K,N)-15/20/25AC TEST C
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MK48T02/12(B)-12/15120/252K x 8 ZER
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MK48T02/12(B)-12/15/20/25OPERATIONR
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MK48T02N 2(8)-12/15/20/25CLOCK OPER
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MK48T02112(B)-12/15/20/25The FT bit
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MK48T02112(B)-12115/20/25PREDICTING
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MK48T02112(B)-12/15/20/25~redlctlng
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MK48TD2/12(B)-12115/20/25ABSOWTE MA
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M K48Z08/18/09/19(B)·15/201258K x
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MK48Z08/18/09/19(B)-15/20/25OPERATI
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MK48Z08118/09/19(B)-15/20/25AC ELEC
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MK48Z08118/09119(B)-15/20/25DATA RE
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MK48Z08118/09119(B)-15/20/25ABSOWTE
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MK48Z08/18/09/19(B)-15/20/25PACKAGE
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MKI48Z02112(B)-15/20/25DESCRIPTIONT
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M KI48Z02112(B)-15/20J25WRITE MODET
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MKI48Z02/12(B.)-15/20/25FIGURE.6. P
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MKI48Z02/12(B)-15/20/25FIGURE 7. MK
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MKI48Z02112(B)-1S/20/2SAC TEST COND
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~ SGS-THOMSON..""! L ~o©oo@rn[!J~
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MK48T08 (8)-10/12/15/20READ MODEThe
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MK48T08 (8)-10/12/15/20AC ELECTRICA
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MK48T08 (8)-10/12/15/20CLOCK OPERAT
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MK48T08 (B)-10112/15/20FIGURE 8. FR
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MK48T08 (8)-10/12/15/20rhe t 10/0 f
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MK48T08 (8)-10/12/15/20PACKAGE DESC
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STATIC RAM DEVICESCACHE TAG RAM353
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MK41 HSO(N, P)-20/25/35FIGURE 2. CO
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MK41H80(N,P)-20/25/35APPLICATIONThe
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MK41H80(N,P)-20/25/35ABSOWTE MAXIMU
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MK41 H80(N ,P)-20/25/35NORMALIZED D
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MK41H8O(N,P),-2OI2513522 PIN "P" PA
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MK4202(Q)-20TRUTH TABLERS S E WHi -
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MK4202(Q)-20DEVICE DESCRIPTION AND
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MK4202(Q)-20READ MODEThe MK4202 is
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MK4202(Q)-20COMPARE CYCLE TIMINGEle
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MK4202(Q)-20FIGURE 5. W WRITE CYCLE
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MK4202(Q)-20FIGURE 10. CHIP SELECT
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MK4202(Q)-20FIGURE 15. LATE WRITE·
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MK4202(Q)-20FIGURE 21. RESET CYCLEr
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MK4202(Q)-20AC TEST CONDITIONSInput
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MK48H74(N,P,E)·35/45/55DESCRIPTION
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MK48H74(N,P,E)-35/45/55WRITE MODETh
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MK48H74(N, P, E)-35/45/S5COMPARE MO
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MK48H74(N,P,E)-35/45/55APPLICATIONT
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MK48H74(N,P,E)-35/45/55AC TEST COND
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STATIC RAM DEVICESFIFO395
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MK4501(N,K)-65/80/10112115/20a rate
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MK4501 (N, K)-65/80/1 0112/15/20REA
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MK4501 (N, K)-65/80/10/12/15/20RESE
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M K4501(N, K)-65/80110/12115/20SING
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MK4501(N,K)-65/80110112/15/20EXPANS
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MK4501(N, K)-65/80110/12/15/20COMPO
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MK4501 (N, K)-65/80110112115/20FIGU
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~ SGS-1HOMSON,."'! I. ~u©oo@rn[brn
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MK4503(N,K)-50/65/80/10/12/15/20WRI
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MK4S03(N ,K)-SO/6S/80/1 0/12/1S/20F
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MK4503(N ,K)-50/65/80110112/15/20RE
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MK4S03(N, K)-S0/6S/80110112/1S/20HA
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MK4S03(N ,K)-SO/6S/80110112I1S/20EX
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MK4503(N, K)-50/65/80/10112/15/20CO
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MK4S03(N, K)-SO/6S/80/1 0/1211 S/20
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MK4511(N,K)-12/15/20512 x 8 CMOS Bi
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MK4511(N,K)-12115/20READ MODEThe MK
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MK4511(N,K)-12115/20DUAL PORT OPERA
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MK4511 (N,K)-12115/20IMPLEMENTATION
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MK4511(N,K)-12/15/20ABSOWTE MAXIMUM
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MK4511(N,K)-12115/20FIGURE 11. MK45
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M K4505M/4505S(N)-25/33/50DESCRIPTI
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MK4505M/4505S(N)-25/33/50AC ELECTRI
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MK4505M/4505S(N)-25/33/50FIGURE S.
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M K4505M/4505S(N)-25/33/50FIGURE 9.
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MK4505M/4505S(N)-25/33/50SIMULTANEO
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MK4505M/4505S{N)-25/33/50FIGURE 13.
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MK4505M/4505S(N)-25/33/50ABSOWTE MA
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MK4S0SM/4S0SS(N)-2S/33/S020 PIN uN"
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MK4S264/4S26S(N)-SS/70FIGURE 2. DEV
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MK45264/45265(N)-55nOAC ELECTRICAL
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MK45264/45265(N)-55noReadlWriteThe
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MK45264/45265(N)-55noFIGURE 8. FULL
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MK4S264/4S26S(N)-SSnoFIGURE 13. TRA
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MK45264/45265(N)-55noFIGURE 18. WRI
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MK4S264/4S26S(N)-SSI7OAC TEST CONDI
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MK45264/45265(~)-5snoWidth Expansio
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MK45264/45265(N)-55noORDERING INFOR
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MK41H661M K41 H67(N, P)-20/25/3516K
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MK41H66/MK41 H67(N, P)-20/25/35WRIT
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MK41H66/MK41H67(N,P)-20/25135APPLIC
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MK41H66/MK41H67{N,P)-20/25/35NORMAL
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MK41 H66/MK41 H67(N ,P)-20/25/35ORD
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MK41H681MK41H69(N,P)-20/25/354K x 4
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MK41 H68/MK41 H69(N, P)-20/25/35WRI
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MK41H68/MK41 H69(N ,P)-20/25/35APPL
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MK41 H68/MK41 H69(N ,P)-20/25/35NOR
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MK41H68/MK41H69(N,P)-20/25/35ORDERI
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t==' SGS-1HOMSON. ..,1. ~o©oo@rn[]
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MK41 H79(N,P)·20125/35WRITE MODETh
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MK41 H79(N, P)-20/25/35ITANDBY MODE
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MK41 H79(N ,P)-20/25/35"C TEST COND
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MK41H79(N,P)-20/25/35~ORMALIZED DC
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MK41 H87(N)-25/35/4564K x 1 CMOS ST
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MK41H87(N)-25/35/45WRITE MODEThe MK
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MK41H87(N)-25/35/45STANDBY MODEThe
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MK41 H87(N)-25/35/45AC TEST CONDITI
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.35, 45, 55, AND 70 ns ADDRESS ACCE
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MK48H64/MK48H65(N,P)-35/45/55noREAD
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MK48H64/MK48H65(N,P)-35/45/55noWRIT
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MK48H64/MK48H65(N,P)-35/45/55noABSO
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SALES OFFICESAUSTRALIANSW 2027 EDGE
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Information furnished is believed t
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