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M27512DEVICE OPERATIONThe six modes of operations of the M27512 are listedin the Operating Modes. A single 5V power supplyis required in the read mode. All inputs are TTLlevels except for OE/vpp and 12Von A9 for ElectronicSignature.READ MODEThe M27512 has two control functions, both of whichmust be logically active in order to obtain data atthe outputs. Chip Enable (CE) is the power controland should be used for device selection. OutputEnable (OE/Vpp) is the output control andshould be used to gate data to the output pins, independentof device selection. Assuming that addressesare stable, the address access time (tAcclis equal to the delay from (;E to output (tccl. Datais available at the outputs after dela~ tOE fromthe falling edge of OE, assuming that CE has beenlow and addresses have been stable for at leasttACC-tOE'STANDBY MODEThe M27512 has a standby mode which reducesthe maximum active power current from 125 mAto 40 mAo The M27512 is placed in the standbymode by applying a TTL high signal to the CE input.When in the standby mode, the outputs arein a high impedance state, independent of theDE/Vpp input.TWO LINE OUTPUT CONTROLBecause EPROMs are usually used in largermemory arrays; the product features a 2 line controlfunction which accommodates the use of multiplememory connection. The two line control functionallows:a) the lowest possible memory power dissipationb) complete assurance that output bus contentionwill not occur.For the most efficient use of these two control lines,CE should be decoded and used as the primarydevice selecting function, while OE/vpp should bemade a common connection to all devices in thearray and connected to the READ line from the systemcontrol bus. This assures that all deselectedmemory devices are in their low power standbymode and that the output pins are only active whendata is desired from a particular memory device.SYSTEM CONSIDERATIONSThe power switching characteristics of NMOS-E3EPROMs require careful decoupling of the devices.The supply current, Icc, has three segments thatare of interest to the system designer: the standbycurrent level, the active current level, and transientcurrent peaks that are produced by the failingand rising edges of (;E. The magnitude of thistransient current peaks is dependent on the outputcapacitive and inductive loading of the device.The associated transient voltage peaks can be suppressedby complying with the two line output con-trol and by properly selected decoupling capacitors.It is recommended that a 1 /LF ceramic capacitorbe used on every device between Vee andGND. This should be a high frequency capacitorof low inherent inductance and should be placedas close to the device as possible. In addition, a4.7 /LF bulk electrolytic capacitor should be usedbetween Vee and GND for every eight devices.The bulk capacitor should be located near wherethe power supply is connected to the array. Thepurpose of the bulk capacitor is to overcome thevoltage drop caused by the inductive effects of PCBtraces.PROGRAMMINGCaution: exceeding 14Von pin 22 (OENpp) willpermanently damage the M27512.When delivered, and after each erasure, all bits ofthe M27512 are in the "1" state. Data is introducedby selectively programming "Os" into the desiredbit locations. Although only "Os" will beprogrammed, both "1s" and "Os" can be presentin tile data word. The only way to change a "0"to Ii "1" is by ultraviolet light erasureJ.he M27512is in the programming mode when OENpp inputis at 12.5V and (;E is at TTL-low. The data to beprogrammed is applied 8 bits in parallel to the dataoutput pins. The levels required for the address anddata inputs are TTL. The M27512 can usePRESTO· Programming Algorithm that drasticalyreduces the programming time (typically less than50 seconds) nevertheless to achieve compatibilitywith all programming equipments, standard FASTProgramming Algorithm can be used as well.FAST PROGRAMMING ALGORITHMFast Programming Algorithm rapidly programsM27512 EPROMs using an efficient and reliablemethod suited to the production programming environment.Programming reliability is also ensuredas the incremental program margin of each byteis continually monitored to determine when·it hasbeen successfully programmed. A flowchart of theM27512 Fast Programming Algorithm is shown inthe next page. The Fast Programming Algorithmutilizes two different pulse types: initial and overprogram.The duration of the initial CE pulse (s) isone millisecond, which will then be followed by alonger overprogram pulse of length 3X msec. (Xis an iteration counter and is equal to the numberof the initial one millisecond pulses applied to a particularM27512 location), before a correct verify occurs.Up to 25 one-millisecond pulses per byte areprovided for before the over program pulse is applied.The entire sequence .2!.Jlrogram pulses isperformed at Vee =6Vand OENpp =12.5V (byteverifications at Vee = 6V and OENpp = VII). Whenthe Fast Programming cycle has been completed,all bytes should be compared to the original datawith Vee = 5V.5/1577
M27512DEVICE OPERATIONS (Continued)FAST PROGRAMMING ALGORITHM FLOW CHARTFAILDEVICEFAILED5·6\816/1578
Page 2 and 3:
MEMORY PRODUCTSDATABOOK1st EDITIONJ
Page 4:
TABLE OF CONTENTSGENERAL INDEX Page
Page 7 and 8:
GENERAL INDEXPageROM DEVICES ......
Page 10 and 11:
GENERAL INFORMATIONThe SGS-THOMSON
Page 12 and 13:
SELECTION GUIDECMOS UV EPROMPart Nu
Page 14 and 15:
SELECTION GUIDECMOS OTP ROMPart Num
Page 16 and 17:
SELECTION GUIDEZEROPOWERPart Number
Page 18 and 19:
SELECTION GUIDEFAST STATIC RAMPart
Page 20 and 21:
12 32Kx8 NMOS M27256FUV EPROMPRODUC
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VFSRAMPRODUCTDESCRIPTIONSGS-THOMSON
Page 24:
EPROM DEVICESNMOS UV EPROM23
Page 27 and 28: ET2716/M2716BLOCK DIAGRAM~ VPP'5V+-
Page 29 and 30: ET2716/M2716AC TEST CONDITIONSOutpu
Page 31 and 32: ET2716/M2716ERASINGThe M/ET2716 is
Page 33 and 34: ET2716/M2716SWITCHING TIME WAVEFORM
Page 36 and 37: M2732A32K (4K x 8) NMOS UV ERASABLE
Page 38 and 39: M2732AREAD OPERATIONDC AND AC CONDI
Page 40 and 41: M2732APROGRAMMING OPERATION(l) (T a
Page 42: M2732APROGRAMMING OPERATION (Contin
Page 45 and 46: M2764ABLOCK DIAGRAMDATA OUTPUT00- 0
Page 47 and 48: M2764AREAD OPERATION (Continued)AC
Page 49 and 50: M2764ADEVICE OPERATION (Continued)T
Page 51 and 52: M2764APROGRAMMING WAVEFORMSV1HADDRE
Page 53 and 54: M2764AORDERING INFORMATIONPart Numb
Page 55 and 56: M27128ABLOCK DIAGRAMVceO--GND o--
Page 57 and 58: M27128AREAD OPERATION (Continued)AC
Page 59 and 60: M27128ADEVICE OPERATION (Continued)
Page 61 and 62: M27128APROGRAMMING WAVEFORMSIVIHADD
Page 63 and 64: M27128AORDI:RING INFORMATIONPart Nu
Page 65 and 66: M27256BLOCK DIAGRAMVeco----GNOo-
Page 67 and 68: M27256READ OPERATION (Continued)AC
Page 69 and 70: M27256DEVICE OPERATION (Continued)P
Page 71 and 72: M27256PROGRAMMING WAVEFORMSPROGRAMP
Page 73 and 74: M27256ORDERING INFORMATIONPart Numb
Page 75 and 76: M27512BLOCK DIAGRAMVee o-----?GNOO-
Page 77: M27512AC TEST CONDITIONSOutput Load
Page 81 and 82: M27512DEVICE OPERATION (Continued)M
Page 83 and 84: M27512PROGRAMMING OPERATION (T amb=
Page 85 and 86: M27512M27512 DESIGN INNOVATIONS FOR
Page 87 and 88: M27512Figure 7 - M27512 Sensing sch
Page 90: EPROM DEVICESCMOS UV EPROM89
Page 93 and 94: ETC2716BLOCK DIAG~AM+-- vpp+-- vcc+
Page 95 and 96: ETC2716AC TEST CONDITIONSOutput Loa
Page 97 and 98: ETC2716ERASING~he ETC?716 !s erased
Page 99 and 100: ETC2716SWITCHING TIME WAVEFORMSR.ed
Page 102 and 103: ETC273232K BIT (4K x 8) CMOS UV ERA
Page 104 and 105: ETC2732READ OPERATIONDC CHARACTERIS
Page 106 and 107: ETC2732DEVICE OPERATIONThe five mod
Page 108 and 109: ETC2732PROGRAMMING WAVEFOR'''SNote:
Page 110 and 111: ETC2732SWITCHING TIME WAVEFORMSRead
Page 112 and 113: TS27C64AQ64K (8K x 8) CMOS UV ERASA
Page 114 and 115: TS27C64AQREAD OPERATIONDC CHARACTER
Page 116 and 117: TS27C64AQDEVICE OPERATIONThe seven
Page 118 and 119: TS27C64AQAC TEST CONDITIONSInput ri
Page 120: TS27C64AQORDERING INFORMATIONPart N
Page 123 and 124: TS27C256QBLOCK DIAGRAMVee 0----.GND
Page 125 and 126: TS27C256QAC TEST CONDITIONSOutput L
Page 127 and 128: TS27C256QERASINGThe TS27C256 is era
Page 129 and 130:
TS27C256QHIGH SPEED PROGRAMMING FLO
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,1,;'"
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ST27C1001BLOCK DIAGRAMv P P cr-----
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M27C1024BLOCK DIAGRAMVpp 0----:---+
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M27C1024AC TEST CONDITIONSOutput Lo
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M27C,1024PROGRAM INHIBITProgramming
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M27C1024PROGRAMMING WAVEFORMSVIHADD
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M27C1024ORDERING INFORMATIONPart Nu
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ST2764AP64K (8K x 8) NMOS ONE TIME
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ST2764APREAD OPERA nONDC AND AC CON
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ST2764APDEVICE OPERATIONThe seven m
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ST2764APPROGRAMMING OPERATION (Tamb
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ST2764APFAST PROGRAMMING FLOWCHART9
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ST27128AP128K (16K x 8) NMOS ONE TI
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ST27128APREAD OPERATIONDC AND AC CO
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ST27128APDEVICE OPERATIONThe seven
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ST27128APPROGRAMMING OPERATION (Tam
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ST27128APFAST PROGRAMMING FLOWCHART
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ST27256P256K (32K x 8) NMOS ONE TIM
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ST27256PREAD OPERATIONDC AND AC CON
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ST27256PDEVICE OPERATIONThe eight m
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ST27256PPROGRAMMING OPERATION (Tamb
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ST27256PFAST PROGRAMMING FLOWCHARTF
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EPROM DEVICESCMOS OTP ROM175
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TS27C64AFN-TS27C64APBLOCK DIAGRAMVe
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TS27C64AFN-TS27C64APAC TEST CONDITI
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TS27C64FN-TS27C64APPROGRAMMINGOPERA
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TS27C64AFN-TS27C64APHIGH SPEED PROG
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TS27C64AFN~TS27C64APORDERING INFORM
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ST27C256FN-ST27C256PBLOCK DIAGRAMVc
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ST27C256FN·ST27C256PAC TEST CONDIT
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ST27C256FN-ST27C256PPROGRAMMING CHA
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ST27C256FN·ST27C256PHIGH SPEED PRO
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ST27C256FN-ST27C256PORDERING INFORM
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SGS-1HOMSON~ ., L ~D©ffi1@rn[brn©
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M8571ELECTRICAL CHARACTERISTICS (0
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M8571S-BUS DESCRIPTION (Continued)A
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M8571S·BUS INTERFACEThe serial, 3-
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M8571MASTER. READS AFTER SETTING WO
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M8571ORDERING INFORMATIONPort Numbe
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M9306BLOCK DIAGRAM00DI---+-+-+-+---
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M93D6FUNCTIONAL DESCRIPTIONThe inpu
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M9306ORDERING INFORMATIONPart Numbe
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M9346BLOCK DIAGRAMDl~-r------------
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M9346FUNCTIONAL DESCRIPTIONThe inpu
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M9346INSTRUCTION SETInstruction S8
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M9346TIMING DIAGRAMS (Continued)INS
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EEPROM DEVICESCMOS EEPROM227
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ST24C02BLOCK DIAGRAMseL--~~--~-----
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ST24C02FIG. 2A· DATA TRANSFER SEQU
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ST24C02ELECTRICAL CHARACTERISTICSAC
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ST24C02FIG. 4A· PAGE WRITEBUS ACTI
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TS59C111 K BIT SERIAL CMOS EEPROM
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TS59C11READ OPERATIONDC CHARACTERIS
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TS59C11The READ instruction is the
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TS59C11FIG. 5b - ERAL (Erase all) M
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~ SGS-1HOMSONIt.. ~ L [j\I'A]O©OO@
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TS93C46READ OPERATIONDC CHARACTERIS
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TS93C46INSTRUCTION TIMINGSREADSK ~u
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~TS93C46ORDERING INFORMATIONPart Nu
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ST93C56BLOCK DIAGRAMPROTECTREGISTER
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M2316H16K-BIT READ ONLY MEMORY• S
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M2316HSTATIC ELECTRICAL CHARACTERIS
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M2332M233332K-BIT READ ONLY MEMORY
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M2332/M2333DC AND OPERATING CHARACT
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~ SGS-11I0MSONA., L ~D©[Ri@~[lJ~©
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M2364DC AND OPERATING CHARACTERISTI
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M236564K-BIT READ ONLY MEMORY• PI
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M2365DC AND OPERATING CHARACTERISTI
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STATIC RAM DEVICES275
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MK48Z02N2(B)-12115/20/25DESCRIPTION
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MK48Z02112(B)-12115/20/25WRITE MODE
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MK48Z02/12(B)-12/15/20/25FIGURE 6.
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MK48Z02/12(B)-12/15/20/25FIGURE 7.
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MK48Z02112(B}-12115/20/25AC TEST CO
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MK48C02A/12A(K, N)·15/20/252K x 8
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MK48C02AI12A(K,N)-15/20/25OPERATION
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MK48C02A/12A(K, N)-15/20/25DATA RET
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MK48C02A112A(K,N)-15/20/25FIGURE 6.
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MK48C02A112A(K,N)-15/20/25AC TEST C
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MK48T02/12(B)-12/15120/252K x 8 ZER
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MK48T02/12(B)-12/15/20/25OPERATIONR
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MK48T02N 2(8)-12/15/20/25CLOCK OPER
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MK48T02112(B)-12/15/20/25The FT bit
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MK48T02112(B)-12115/20/25PREDICTING
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MK48T02112(B)-12/15/20/25~redlctlng
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MK48TD2/12(B)-12115/20/25ABSOWTE MA
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M K48Z08/18/09/19(B)·15/201258K x
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MK48Z08/18/09/19(B)-15/20/25OPERATI
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MK48Z08118/09/19(B)-15/20/25AC ELEC
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MK48Z08118/09119(B)-15/20/25DATA RE
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MK48Z08118/09119(B)-15/20/25ABSOWTE
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MK48Z08/18/09/19(B)-15/20/25PACKAGE
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MKI48Z02112(B)-15/20/25DESCRIPTIONT
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M KI48Z02112(B)-15/20J25WRITE MODET
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MKI48Z02/12(B.)-15/20/25FIGURE.6. P
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MKI48Z02/12(B)-15/20/25FIGURE 7. MK
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MKI48Z02112(B)-1S/20/2SAC TEST COND
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~ SGS-THOMSON..""! L ~o©oo@rn[!J~
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MK48T08 (8)-10/12/15/20READ MODEThe
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MK48T08 (8)-10/12/15/20AC ELECTRICA
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MK48T08 (8)-10/12/15/20CLOCK OPERAT
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MK48T08 (B)-10112/15/20FIGURE 8. FR
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MK48T08 (8)-10/12/15/20rhe t 10/0 f
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MK48T08 (8)-10/12/15/20PACKAGE DESC
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STATIC RAM DEVICESCACHE TAG RAM353
Page 357 and 358:
MK41 HSO(N, P)-20/25/35FIGURE 2. CO
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MK41H80(N,P)-20/25/35APPLICATIONThe
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MK41H80(N,P)-20/25/35ABSOWTE MAXIMU
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MK41 H80(N ,P)-20/25/35NORMALIZED D
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MK41H8O(N,P),-2OI2513522 PIN "P" PA
Page 367 and 368:
MK4202(Q)-20TRUTH TABLERS S E WHi -
Page 369 and 370:
MK4202(Q)-20DEVICE DESCRIPTION AND
Page 371 and 372:
MK4202(Q)-20READ MODEThe MK4202 is
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MK4202(Q)-20COMPARE CYCLE TIMINGEle
Page 375 and 376:
MK4202(Q)-20FIGURE 5. W WRITE CYCLE
Page 377 and 378:
MK4202(Q)-20FIGURE 10. CHIP SELECT
Page 379 and 380:
MK4202(Q)-20FIGURE 15. LATE WRITE·
Page 381 and 382:
MK4202(Q)-20FIGURE 21. RESET CYCLEr
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MK4202(Q)-20AC TEST CONDITIONSInput
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MK48H74(N,P,E)·35/45/55DESCRIPTION
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MK48H74(N,P,E)-35/45/55WRITE MODETh
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MK48H74(N, P, E)-35/45/S5COMPARE MO
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MK48H74(N,P,E)-35/45/55APPLICATIONT
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MK48H74(N,P,E)-35/45/55AC TEST COND
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STATIC RAM DEVICESFIFO395
Page 399 and 400:
MK4501(N,K)-65/80/10112115/20a rate
Page 401 and 402:
MK4501 (N, K)-65/80/1 0112/15/20REA
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MK4501 (N, K)-65/80/10/12/15/20RESE
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M K4501(N, K)-65/80110/12115/20SING
Page 407 and 408:
MK4501(N,K)-65/80110112/15/20EXPANS
Page 409 and 410:
MK4501(N, K)-65/80110/12/15/20COMPO
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MK4501 (N, K)-65/80110112115/20FIGU
Page 414 and 415:
~ SGS-1HOMSON,."'! I. ~u©oo@rn[brn
Page 416 and 417:
MK4503(N,K)-50/65/80/10/12/15/20WRI
Page 418 and 419:
MK4S03(N ,K)-SO/6S/80/1 0/12/1S/20F
Page 420 and 421:
MK4503(N ,K)-50/65/80110112/15/20RE
Page 422 and 423:
MK4S03(N, K)-S0/6S/80110112/1S/20HA
Page 424 and 425:
MK4S03(N ,K)-SO/6S/80110112I1S/20EX
Page 426 and 427:
MK4503(N, K)-50/65/80/10112/15/20CO
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MK4S03(N, K)-SO/6S/80/1 0/1211 S/20
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MK4511(N,K)-12/15/20512 x 8 CMOS Bi
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MK4511(N,K)-12115/20READ MODEThe MK
Page 434 and 435:
MK4511(N,K)-12115/20DUAL PORT OPERA
Page 436 and 437:
MK4511 (N,K)-12115/20IMPLEMENTATION
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MK4511(N,K)-12/15/20ABSOWTE MAXIMUM
Page 440:
MK4511(N,K)-12115/20FIGURE 11. MK45
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M K4505M/4505S(N)-25/33/50DESCRIPTI
Page 445 and 446:
MK4505M/4505S(N)-25/33/50AC ELECTRI
Page 447 and 448:
MK4505M/4505S(N)-25/33/50FIGURE S.
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M K4505M/4505S(N)-25/33/50FIGURE 9.
Page 451 and 452:
MK4505M/4505S(N)-25/33/50SIMULTANEO
Page 453 and 454:
MK4505M/4505S{N)-25/33/50FIGURE 13.
Page 455 and 456:
MK4505M/4505S(N)-25/33/50ABSOWTE MA
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MK4S0SM/4S0SS(N)-2S/33/S020 PIN uN"
Page 459 and 460:
MK4S264/4S26S(N)-SS/70FIGURE 2. DEV
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MK45264/45265(N)-55nOAC ELECTRICAL
Page 463 and 464:
MK45264/45265(N)-55noReadlWriteThe
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MK45264/45265(N)-55noFIGURE 8. FULL
Page 467 and 468:
MK4S264/4S26S(N)-SSnoFIGURE 13. TRA
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MK45264/45265(N)-55noFIGURE 18. WRI
Page 471 and 472:
MK4S264/4S26S(N)-SSI7OAC TEST CONDI
Page 473 and 474:
MK45264/45265(~)-5snoWidth Expansio
Page 475 and 476:
MK45264/45265(N)-55noORDERING INFOR
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MK41H661M K41 H67(N, P)-20/25/3516K
Page 480 and 481:
MK41H66/MK41 H67(N, P)-20/25/35WRIT
Page 482 and 483:
MK41H66/MK41H67(N,P)-20/25135APPLIC
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MK41H66/MK41H67{N,P)-20/25/35NORMAL
Page 486 and 487:
MK41 H66/MK41 H67(N ,P)-20/25/35ORD
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MK41H681MK41H69(N,P)-20/25/354K x 4
Page 490 and 491:
MK41 H68/MK41 H69(N, P)-20/25/35WRI
Page 492 and 493:
MK41H68/MK41 H69(N ,P)-20/25/35APPL
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MK41 H68/MK41 H69(N ,P)-20/25/35NOR
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MK41H68/MK41H69(N,P)-20/25/35ORDERI
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t==' SGS-1HOMSON. ..,1. ~o©oo@rn[]
Page 500 and 501:
MK41 H79(N,P)·20125/35WRITE MODETh
Page 502 and 503:
MK41 H79(N, P)-20/25/35ITANDBY MODE
Page 504 and 505:
MK41 H79(N ,P)-20/25/35"C TEST COND
Page 506 and 507:
MK41H79(N,P)-20/25/35~ORMALIZED DC
Page 508 and 509:
MK41 H87(N)-25/35/4564K x 1 CMOS ST
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MK41H87(N)-25/35/45WRITE MODEThe MK
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MK41H87(N)-25/35/45STANDBY MODEThe
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MK41 H87(N)-25/35/45AC TEST CONDITI
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.35, 45, 55, AND 70 ns ADDRESS ACCE
Page 518 and 519:
MK48H64/MK48H65(N,P)-35/45/55noREAD
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MK48H64/MK48H65(N,P)-35/45/55noWRIT
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MK48H64/MK48H65(N,P)-35/45/55noABSO
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SALES OFFICESAUSTRALIANSW 2027 EDGE
Page 527:
Information furnished is believed t
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