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TS27C64AFN-TS27C64AP:AD OPERATION:; CHARACTERISTICS (T amb = T L to T H, Vcc = 5V ± 10%, GND = OV; Unless otherwise specified)Values;ymbol Parameter Test Conditions UnitMin. Typ.(1) Max.III Input Load Current VIN = Vcc or GND 10 pAILO Output Leakage Current ~UT=VCC or GND,CE=VIH 10 I'AVpp Vpp Read Voltage Vcc- 0.7 Vcc VVIL Input Low Voltage -0.1 0.8 VVIH Input High Voltage 2.0 Vcc+ 1 VVOL Output Low Voltage IOL=2.1 mA 0.45 VIOL=O I'A 0.1VOH Output High Voltage IOH= -400 I'A 2.4 VIOH=O I'A Vcc- 0.1ICC2 Vcc Supply Active Current CE = OE = VIL, Inputs = VIH or 10 30 mATTL LevelsVll, f=5 MHz, 1/0=0 mAICCSBI V CC Supply Standby Current CE=VIH 0.5 1 mAICCSB2 V cc Supply Standby Current CE=Vcc 10 100 pAIppi V pp Read Current Vpp=Vcc=5.5V 100 p.ANote: I. Typical conditions are for operation at: Tamb= + 25°C, VCC=5V, Vpp=VCC, and VSS=OVAC CHARACTERISTICS(1)(T amb = TL to T H)27C64A 27C64A 27C64A 27C64ASymbol Parameter Test Conditions ·15 ·20 ·25 ·30 UnitMin Max Min Max Min Max Min MaxIACC Address to Output Delay CE=OE=VIL 150 200 250 300 nstCE CE to Output Delay OE=VIL 150 200 250 300 nstOE Output Enable to CE=VIL 75 80 100 120 nsOutput DelaytDF(2,4) OE or CE High to CE=Vll 0 50 0 50 0 60 0 105 nstOH Output Hold from CE=OE=Vll 0 0 0 0 nsaddresses, CE or OEwhichever occured firstCAPACITANCE T amb = + 25°C, f = 1 MHz (Note 3)Symbol Parameter Test Conditions Min. Typ. Max. UnitCin Input Capacitance VIN=OV 4 6 pFCout Output Capacitance VOUT=OV 8 12 pFNotes: 1. VCC must be applied at the same time or before Vpp and removed after or at the same time as Vpp.Vpp may be connectedto VCC except during program.2. The tDF compare level is determined as follows:High to THREE·STATE, the measured VOH(DC) -o.tVlow to THREE-STATE the measured VOl(DC) +O.tV.3. Capacitance is guaran!aad BjI...jleriodic testing. T a"lb = + 25°C, f = 1 MHz.4. T DF, is specified from OE or CE whichever occurs irS!. This parameter is only sampled and not 100% tested.3/10179
TS27C64AFN-TS27C64APAC TEST CONDITIONSOutput Load: 1 TTL gate and CL = 100 pFInput Rise and Fall Times,;;20 nsInput pulse levels: 0.4SV to 2.4VTiming Measurement Reference LevelInputs, Outputs0.8V and 2VAC TESTING INPUT/OUTPUT WAVEFORMAC TESTING LOAD CIRCUIT2.4 => 1O)CTEST POINTS < .0.45 0.8 o.sI ~v6~~TEST1N9143.3KnII-_~I-_-O OUTI=:c= CL"DOpF$-&802CL INCLUDES JIG CAPACITANCEAC WAVEFORMSV,HADDRESS ES ADDRESS VALID)V1lITV,HV,LI'CEOEV,HV,LI'OE (3)'ACC (3)HIGH Z 11111.\\\\\\ v HIGH Z5-6809Notes:1. Typical values are for T amb = 25°C and nominal supply voltage2. This parameter is only sampled and not 100% tested.3. OE may be delayed !!ILto tACe - tOE after the falling edge CE without impact on tACC4. tDFis specified form OE or CE whichever occurs first.4/10180
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MEMORY PRODUCTSDATABOOK1st EDITIONJ
Page 4:
TABLE OF CONTENTSGENERAL INDEX Page
Page 7 and 8:
GENERAL INDEXPageROM DEVICES ......
Page 10 and 11:
GENERAL INFORMATIONThe SGS-THOMSON
Page 12 and 13:
SELECTION GUIDECMOS UV EPROMPart Nu
Page 14 and 15:
SELECTION GUIDECMOS OTP ROMPart Num
Page 16 and 17:
SELECTION GUIDEZEROPOWERPart Number
Page 18 and 19:
SELECTION GUIDEFAST STATIC RAMPart
Page 20 and 21:
12 32Kx8 NMOS M27256FUV EPROMPRODUC
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VFSRAMPRODUCTDESCRIPTIONSGS-THOMSON
Page 24:
EPROM DEVICESNMOS UV EPROM23
Page 27 and 28:
ET2716/M2716BLOCK DIAGRAM~ VPP'5V+-
Page 29 and 30:
ET2716/M2716AC TEST CONDITIONSOutpu
Page 31 and 32:
ET2716/M2716ERASINGThe M/ET2716 is
Page 33 and 34:
ET2716/M2716SWITCHING TIME WAVEFORM
Page 36 and 37:
M2732A32K (4K x 8) NMOS UV ERASABLE
Page 38 and 39:
M2732AREAD OPERATIONDC AND AC CONDI
Page 40 and 41:
M2732APROGRAMMING OPERATION(l) (T a
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M2732APROGRAMMING OPERATION (Contin
Page 45 and 46:
M2764ABLOCK DIAGRAMDATA OUTPUT00- 0
Page 47 and 48:
M2764AREAD OPERATION (Continued)AC
Page 49 and 50:
M2764ADEVICE OPERATION (Continued)T
Page 51 and 52:
M2764APROGRAMMING WAVEFORMSV1HADDRE
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M2764AORDERING INFORMATIONPart Numb
Page 55 and 56:
M27128ABLOCK DIAGRAMVceO--GND o--
Page 57 and 58:
M27128AREAD OPERATION (Continued)AC
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M27128ADEVICE OPERATION (Continued)
Page 61 and 62:
M27128APROGRAMMING WAVEFORMSIVIHADD
Page 63 and 64:
M27128AORDI:RING INFORMATIONPart Nu
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M27256BLOCK DIAGRAMVeco----GNOo-
Page 67 and 68:
M27256READ OPERATION (Continued)AC
Page 69 and 70:
M27256DEVICE OPERATION (Continued)P
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M27256PROGRAMMING WAVEFORMSPROGRAMP
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M27256ORDERING INFORMATIONPart Numb
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M27512BLOCK DIAGRAMVee o-----?GNOO-
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M27512AC TEST CONDITIONSOutput Load
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M27512DEVICE OPERATIONS (Continued)
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M27512DEVICE OPERATION (Continued)M
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M27512PROGRAMMING OPERATION (T amb=
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M27512M27512 DESIGN INNOVATIONS FOR
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M27512Figure 7 - M27512 Sensing sch
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EPROM DEVICESCMOS UV EPROM89
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ETC2716BLOCK DIAG~AM+-- vpp+-- vcc+
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ETC2716AC TEST CONDITIONSOutput Loa
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ETC2716ERASING~he ETC?716 !s erased
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ETC2716SWITCHING TIME WAVEFORMSR.ed
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ETC273232K BIT (4K x 8) CMOS UV ERA
Page 104 and 105:
ETC2732READ OPERATIONDC CHARACTERIS
Page 106 and 107:
ETC2732DEVICE OPERATIONThe five mod
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ETC2732PROGRAMMING WAVEFOR'''SNote:
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ETC2732SWITCHING TIME WAVEFORMSRead
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TS27C64AQ64K (8K x 8) CMOS UV ERASA
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TS27C64AQREAD OPERATIONDC CHARACTER
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TS27C64AQDEVICE OPERATIONThe seven
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TS27C64AQAC TEST CONDITIONSInput ri
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TS27C64AQORDERING INFORMATIONPart N
Page 123 and 124:
TS27C256QBLOCK DIAGRAMVee 0----.GND
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TS27C256QAC TEST CONDITIONSOutput L
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TS27C256QERASINGThe TS27C256 is era
Page 129 and 130: TS27C256QHIGH SPEED PROGRAMMING FLO
Page 131 and 132: ,1,;'"
Page 133 and 134: ST27C1001BLOCK DIAGRAMv P P cr-----
Page 135 and 136: M27C1024BLOCK DIAGRAMVpp 0----:---+
Page 137 and 138: M27C1024AC TEST CONDITIONSOutput Lo
Page 139 and 140: M27C,1024PROGRAM INHIBITProgramming
Page 141 and 142: M27C1024PROGRAMMING WAVEFORMSVIHADD
Page 143 and 144: M27C1024ORDERING INFORMATIONPart Nu
Page 146 and 147: ST2764AP64K (8K x 8) NMOS ONE TIME
Page 148 and 149: ST2764APREAD OPERA nONDC AND AC CON
Page 150 and 151: ST2764APDEVICE OPERATIONThe seven m
Page 152 and 153: ST2764APPROGRAMMING OPERATION (Tamb
Page 154 and 155: ST2764APFAST PROGRAMMING FLOWCHART9
Page 156 and 157: ST27128AP128K (16K x 8) NMOS ONE TI
Page 158 and 159: ST27128APREAD OPERATIONDC AND AC CO
Page 160 and 161: ST27128APDEVICE OPERATIONThe seven
Page 162 and 163: ST27128APPROGRAMMING OPERATION (Tam
Page 164 and 165: ST27128APFAST PROGRAMMING FLOWCHART
Page 166 and 167: ST27256P256K (32K x 8) NMOS ONE TIM
Page 168 and 169: ST27256PREAD OPERATIONDC AND AC CON
Page 170 and 171: ST27256PDEVICE OPERATIONThe eight m
Page 172 and 173: ST27256PPROGRAMMING OPERATION (Tamb
Page 174 and 175: ST27256PFAST PROGRAMMING FLOWCHARTF
Page 176: EPROM DEVICESCMOS OTP ROM175
Page 179: TS27C64AFN-TS27C64APBLOCK DIAGRAMVe
Page 183 and 184: TS27C64FN-TS27C64APPROGRAMMINGOPERA
Page 185 and 186: TS27C64AFN-TS27C64APHIGH SPEED PROG
Page 187 and 188: TS27C64AFN~TS27C64APORDERING INFORM
Page 189 and 190: ST27C256FN-ST27C256PBLOCK DIAGRAMVc
Page 191 and 192: ST27C256FN·ST27C256PAC TEST CONDIT
Page 193 and 194: ST27C256FN-ST27C256PPROGRAMMING CHA
Page 195 and 196: ST27C256FN·ST27C256PHIGH SPEED PRO
Page 197 and 198: ST27C256FN-ST27C256PORDERING INFORM
Page 200 and 201: SGS-1HOMSON~ ., L ~D©ffi1@rn[brn©
Page 202 and 203: M8571ELECTRICAL CHARACTERISTICS (0
Page 204 and 205: M8571S-BUS DESCRIPTION (Continued)A
Page 206 and 207: M8571S·BUS INTERFACEThe serial, 3-
Page 208 and 209: M8571MASTER. READS AFTER SETTING WO
Page 210: M8571ORDERING INFORMATIONPort Numbe
Page 213 and 214: M9306BLOCK DIAGRAM00DI---+-+-+-+---
Page 215 and 216: M93D6FUNCTIONAL DESCRIPTIONThe inpu
Page 217 and 218: M9306ORDERING INFORMATIONPart Numbe
Page 219 and 220: M9346BLOCK DIAGRAMDl~-r------------
Page 221 and 222: M9346FUNCTIONAL DESCRIPTIONThe inpu
Page 223 and 224: M9346INSTRUCTION SETInstruction S8
Page 225 and 226: M9346TIMING DIAGRAMS (Continued)INS
Page 228: EEPROM DEVICESCMOS EEPROM227
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ST24C02BLOCK DIAGRAMseL--~~--~-----
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ST24C02FIG. 2A· DATA TRANSFER SEQU
Page 235 and 236:
ST24C02ELECTRICAL CHARACTERISTICSAC
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ST24C02FIG. 4A· PAGE WRITEBUS ACTI
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TS59C111 K BIT SERIAL CMOS EEPROM
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TS59C11READ OPERATIONDC CHARACTERIS
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TS59C11The READ instruction is the
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TS59C11FIG. 5b - ERAL (Erase all) M
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~ SGS-1HOMSONIt.. ~ L [j\I'A]O©OO@
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TS93C46READ OPERATIONDC CHARACTERIS
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TS93C46INSTRUCTION TIMINGSREADSK ~u
Page 254:
~TS93C46ORDERING INFORMATIONPart Nu
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ST93C56BLOCK DIAGRAMPROTECTREGISTER
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M2316H16K-BIT READ ONLY MEMORY• S
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M2316HSTATIC ELECTRICAL CHARACTERIS
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M2332M233332K-BIT READ ONLY MEMORY
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M2332/M2333DC AND OPERATING CHARACT
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~ SGS-11I0MSONA., L ~D©[Ri@~[lJ~©
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M2364DC AND OPERATING CHARACTERISTI
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M236564K-BIT READ ONLY MEMORY• PI
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M2365DC AND OPERATING CHARACTERISTI
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STATIC RAM DEVICES275
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MK48Z02N2(B)-12115/20/25DESCRIPTION
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MK48Z02112(B)-12115/20/25WRITE MODE
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MK48Z02/12(B)-12/15/20/25FIGURE 6.
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MK48Z02/12(B)-12/15/20/25FIGURE 7.
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MK48Z02112(B}-12115/20/25AC TEST CO
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MK48C02A/12A(K, N)·15/20/252K x 8
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MK48C02AI12A(K,N)-15/20/25OPERATION
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MK48C02A/12A(K, N)-15/20/25DATA RET
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MK48C02A112A(K,N)-15/20/25FIGURE 6.
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MK48C02A112A(K,N)-15/20/25AC TEST C
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MK48T02/12(B)-12/15120/252K x 8 ZER
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MK48T02/12(B)-12/15/20/25OPERATIONR
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MK48T02N 2(8)-12/15/20/25CLOCK OPER
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MK48T02112(B)-12/15/20/25The FT bit
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MK48T02112(B)-12115/20/25PREDICTING
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MK48T02112(B)-12/15/20/25~redlctlng
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MK48TD2/12(B)-12115/20/25ABSOWTE MA
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M K48Z08/18/09/19(B)·15/201258K x
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MK48Z08/18/09/19(B)-15/20/25OPERATI
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MK48Z08118/09/19(B)-15/20/25AC ELEC
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MK48Z08118/09119(B)-15/20/25DATA RE
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MK48Z08118/09119(B)-15/20/25ABSOWTE
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MK48Z08/18/09/19(B)-15/20/25PACKAGE
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MKI48Z02112(B)-15/20/25DESCRIPTIONT
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M KI48Z02112(B)-15/20J25WRITE MODET
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MKI48Z02/12(B.)-15/20/25FIGURE.6. P
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MKI48Z02/12(B)-15/20/25FIGURE 7. MK
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MKI48Z02112(B)-1S/20/2SAC TEST COND
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~ SGS-THOMSON..""! L ~o©oo@rn[!J~
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MK48T08 (8)-10/12/15/20READ MODEThe
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MK48T08 (8)-10/12/15/20AC ELECTRICA
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MK48T08 (8)-10/12/15/20CLOCK OPERAT
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MK48T08 (B)-10112/15/20FIGURE 8. FR
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MK48T08 (8)-10/12/15/20rhe t 10/0 f
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MK48T08 (8)-10/12/15/20PACKAGE DESC
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STATIC RAM DEVICESCACHE TAG RAM353
Page 357 and 358:
MK41 HSO(N, P)-20/25/35FIGURE 2. CO
Page 359 and 360:
MK41H80(N,P)-20/25/35APPLICATIONThe
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MK41H80(N,P)-20/25/35ABSOWTE MAXIMU
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MK41 H80(N ,P)-20/25/35NORMALIZED D
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MK41H8O(N,P),-2OI2513522 PIN "P" PA
Page 367 and 368:
MK4202(Q)-20TRUTH TABLERS S E WHi -
Page 369 and 370:
MK4202(Q)-20DEVICE DESCRIPTION AND
Page 371 and 372:
MK4202(Q)-20READ MODEThe MK4202 is
Page 373 and 374:
MK4202(Q)-20COMPARE CYCLE TIMINGEle
Page 375 and 376:
MK4202(Q)-20FIGURE 5. W WRITE CYCLE
Page 377 and 378:
MK4202(Q)-20FIGURE 10. CHIP SELECT
Page 379 and 380:
MK4202(Q)-20FIGURE 15. LATE WRITE·
Page 381 and 382:
MK4202(Q)-20FIGURE 21. RESET CYCLEr
Page 383 and 384:
MK4202(Q)-20AC TEST CONDITIONSInput
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MK48H74(N,P,E)·35/45/55DESCRIPTION
Page 387 and 388:
MK48H74(N,P,E)-35/45/55WRITE MODETh
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MK48H74(N, P, E)-35/45/S5COMPARE MO
Page 391 and 392:
MK48H74(N,P,E)-35/45/55APPLICATIONT
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MK48H74(N,P,E)-35/45/55AC TEST COND
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STATIC RAM DEVICESFIFO395
Page 399 and 400:
MK4501(N,K)-65/80/10112115/20a rate
Page 401 and 402:
MK4501 (N, K)-65/80/1 0112/15/20REA
Page 403 and 404:
MK4501 (N, K)-65/80/10/12/15/20RESE
Page 405 and 406:
M K4501(N, K)-65/80110/12115/20SING
Page 407 and 408:
MK4501(N,K)-65/80110112/15/20EXPANS
Page 409 and 410:
MK4501(N, K)-65/80110/12/15/20COMPO
Page 411 and 412:
MK4501 (N, K)-65/80110112115/20FIGU
Page 414 and 415:
~ SGS-1HOMSON,."'! I. ~u©oo@rn[brn
Page 416 and 417:
MK4503(N,K)-50/65/80/10/12/15/20WRI
Page 418 and 419:
MK4S03(N ,K)-SO/6S/80/1 0/12/1S/20F
Page 420 and 421:
MK4503(N ,K)-50/65/80110112/15/20RE
Page 422 and 423:
MK4S03(N, K)-S0/6S/80110112/1S/20HA
Page 424 and 425:
MK4S03(N ,K)-SO/6S/80110112I1S/20EX
Page 426 and 427:
MK4503(N, K)-50/65/80/10112/15/20CO
Page 428 and 429:
MK4S03(N, K)-SO/6S/80/1 0/1211 S/20
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MK4511(N,K)-12/15/20512 x 8 CMOS Bi
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MK4511(N,K)-12115/20READ MODEThe MK
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MK4511(N,K)-12115/20DUAL PORT OPERA
Page 436 and 437:
MK4511 (N,K)-12115/20IMPLEMENTATION
Page 438 and 439:
MK4511(N,K)-12/15/20ABSOWTE MAXIMUM
Page 440:
MK4511(N,K)-12115/20FIGURE 11. MK45
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M K4505M/4505S(N)-25/33/50DESCRIPTI
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MK4505M/4505S(N)-25/33/50AC ELECTRI
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MK4505M/4505S(N)-25/33/50FIGURE S.
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M K4505M/4505S(N)-25/33/50FIGURE 9.
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MK4505M/4505S(N)-25/33/50SIMULTANEO
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MK4505M/4505S{N)-25/33/50FIGURE 13.
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MK4505M/4505S(N)-25/33/50ABSOWTE MA
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MK4S0SM/4S0SS(N)-2S/33/S020 PIN uN"
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MK4S264/4S26S(N)-SS/70FIGURE 2. DEV
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MK45264/45265(N)-55nOAC ELECTRICAL
Page 463 and 464:
MK45264/45265(N)-55noReadlWriteThe
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MK45264/45265(N)-55noFIGURE 8. FULL
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MK4S264/4S26S(N)-SSnoFIGURE 13. TRA
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MK45264/45265(N)-55noFIGURE 18. WRI
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MK4S264/4S26S(N)-SSI7OAC TEST CONDI
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MK45264/45265(~)-5snoWidth Expansio
Page 475 and 476:
MK45264/45265(N)-55noORDERING INFOR
Page 478 and 479:
MK41H661M K41 H67(N, P)-20/25/3516K
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MK41H66/MK41 H67(N, P)-20/25/35WRIT
Page 482 and 483:
MK41H66/MK41H67(N,P)-20/25135APPLIC
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MK41H66/MK41H67{N,P)-20/25/35NORMAL
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MK41 H66/MK41 H67(N ,P)-20/25/35ORD
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MK41H681MK41H69(N,P)-20/25/354K x 4
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MK41 H68/MK41 H69(N, P)-20/25/35WRI
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MK41H68/MK41 H69(N ,P)-20/25/35APPL
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MK41 H68/MK41 H69(N ,P)-20/25/35NOR
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MK41H68/MK41H69(N,P)-20/25/35ORDERI
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t==' SGS-1HOMSON. ..,1. ~o©oo@rn[]
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MK41 H79(N,P)·20125/35WRITE MODETh
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MK41 H79(N, P)-20/25/35ITANDBY MODE
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MK41 H79(N ,P)-20/25/35"C TEST COND
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MK41H79(N,P)-20/25/35~ORMALIZED DC
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MK41 H87(N)-25/35/4564K x 1 CMOS ST
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MK41H87(N)-25/35/45WRITE MODEThe MK
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MK41H87(N)-25/35/45STANDBY MODEThe
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MK41 H87(N)-25/35/45AC TEST CONDITI
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.35, 45, 55, AND 70 ns ADDRESS ACCE
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MK48H64/MK48H65(N,P)-35/45/55noREAD
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MK48H64/MK48H65(N,P)-35/45/55noWRIT
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MK48H64/MK48H65(N,P)-35/45/55noABSO
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SALES OFFICESAUSTRALIANSW 2027 EDGE
Page 527:
Information furnished is believed t
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