Part-I - Controller General of Patents Designs and Trademarks

(12) PATENT APPLICATION PUBLICATION (21) Application No.1032/CHENP/2012 A
(19) INDIA
(22) Date of filing of Application :01/02/2012 (43) Publication Date : 21/06/2013
(54) Title of the invention : X-RAY EXAMINATION DEVICE AND METHOD
(51) International classification :A61B6/03
(31) Priority Document No :09166693.3
(32) Priority Date :29/07/2009
(33) Name of priority country :EPO
(86) International Application No
Filing Date
(87) International Publication No : NA
(61) Patent of Addition to Application
:NA
Number
:NA
Filing Date
(62) Divisional to Application Number
Filing Date
:PCT/IB2010/053304
:20/07/2010
:NA
:NA
(71)Name of Applicant :
1)KONINKLIJKE PHILIPS ELECTRONICS N.V.
Address of Applicant :GROENEWOUDSEWEG 1
EINDHOVEN 5621 BA NETHERLANDS
(72)Name of Inventor :
1)PROKSA Roland
(57) Abstract :
The present invention relates to an X-ray examination device and a corresponding method. A fast and periodical modulation of the
X-ray flux within each detection interval is performed having a low X-ray flux at the beginning of the detection interval to ensure
that no detection channel is overloaded. With increasing the X-ray flux particularly the peripheral detection channels will run into
saturation which is detected. A saturated detector channel is stopped from further detecting radiation and the time of effective
radiation detection without saturation is measured for correcting those detection signals. From all detection signals after any
correction of detection signals from saturated detection channels an X-ray image can be reconstructed.
No. of Pages : 20 No. of Claims : 11
The Patent Office Journal 21/06/2013 13676