Part-I - Controller General of Patents Designs and Trademarks

(12) PATENT APPLICATION PUBLICATION (21) Application No.1723/CHENP/2012 A
(19) INDIA
(22) Date of filing of Application :24/02/2012 (43) Publication Date : 21/06/2013
(54) Title of the invention : IMAGING MEASUREMENT SYSTEM WITH A PRINTED PHOTODETECTOR ARRAY
(51) International classification :G01T1/20
(31) Priority Document No :61/240443
(32) Priority Date :08/09/2009
(33) Name of priority country :U.S.A.
(86) International Application No
Filing Date
(87) International Publication No : NA
(61) Patent of Addition to Application
:NA
Number
:NA
Filing Date
(62) Divisional to Application Number
Filing Date
:PCT/IB2010/053557
:05/08/2010
:NA
:NA
(71)Name of Applicant :
1)KONINKLIJKE PHILIPS ELECTRONICS N.V.
Address of Applicant :GROENEWOUDSEWEG 1
EINDHOVEN 5621 BA NETHERLANDS
(72)Name of Inventor :
1)LEVENE Simha
2)ALTMAN Ami
3)WAINER Naor
4)RONDA Cornelis Reinder
5)HASKAL Eliav Itzhak
6)DE LEEUW Dagobert Michel
(57) Abstract :
Low cost large area photodetector arrays are provided. In a first embodiment the photodetectors comprise an inorganic
photoelectric conversion material formed in a single thick layer of material. In a second embodiment the photodetectors comprise
a lamination of several thin layers of an inorganic photoelectric conversion material the combined thickness of which is large
enough to absorb incoming x-rays with a high detector quantum efficiency. In a third embodiment the photodetectors comprise a
lamination of several layers of inorganic or organic photoelectric conversion material wherein each layer has a composite
scintillator coating.
No. of Pages : 46 No. of Claims : 15
The Patent Office Journal 21/06/2013 13995