Part-I - Controller General of Patents Designs and Trademarks

(12) PATENT APPLICATION PUBLICATION (21) Application No.1965/CHENP/2012 A
(19) INDIA
(22) Date of filing of Application :02/03/2012 (43) Publication Date : 21/06/2013
(54) Title of the invention : DISTRIBUTED X-RAY SOURCE AND X-RAY IMAGING SYSTEM COMPRISING SAME
(51) International classification :H01J35/06
(31) Priority Document No :09170298.5
(32) Priority Date :15/09/2009
(33) Name of priority country :EPO
(86) International Application No
Filing Date
(87) International Publication No : NA
(61) Patent of Addition to Application
:NA
Number
:NA
Filing Date
(62) Divisional to Application Number
Filing Date
:PCT/IB2010/054113
:13/09/2010
:NA
:NA
(71)Name of Applicant :
1)KONINKLIJKE PHILIPS ELECTRONICS N.V.
Address of Applicant :GROENEWOUDSEWEG 1
EINDHOVEN 5621 BA NETHERLANDS
(72)Name of Inventor :
1)LEWALTER Astrid
2)PIETIG Rainer
3)CHROST Wolfgang
(57) Abstract :
A distributed X-ray source (3) and an imaging system (1) comprising such an X-ray source (3) are proposed. The X-ray source (3)
comprises an electron beam source arrangement (19) and an anode arrangement (17). The electron beam source arrangement (19)
is adapted to emit electron beams (24) towards at least two locally distinct focal spots (27) on the anode arrangement (17).
Therein the X-ray source is adapted for displacing the anode arrangement (17) with respect to the electron beam source
arrangement (19). While the provision of a plurality of focal spots allows acquisition of projection images under different
projection angles thereby allowing reconstruction of three-dimensional X-ray images e.g. in tomosynthesis application a
displacement motion of the anode arrangement (17) with respect to the electron beam source arrangement (19) may allow for
distributed heat flux to the anode arrangement thereby possibly reducing cooling requirements.
No. of Pages : 22 No. of Claims : 13
The Patent Office Journal 21/06/2013 13969