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Ion Implantation and Synthesis of Materials - Studium

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8 Channeling8.1 IntroductionAll theories examined earlier concerning the ranges <strong>of</strong> ions <strong>and</strong> radiation damage<strong>of</strong> materials were based on the assumption that the stopping medium is disordered,i.e., amorphous. In practice, we are dealing with polycrystalline or monocrystallinesubstances. The main parameters determining the range <strong>of</strong> an ion are its energy, E,its atomic number, Z 1 , <strong>and</strong> the atomic number <strong>of</strong> the substrate, Z 2 . In the case <strong>of</strong>single crystals, the orientation <strong>of</strong> the substrate <strong>and</strong> the vibrational amplitude (i.e.,temperature) <strong>of</strong> the lattice atoms are also important parameters.With single-crystal substrates <strong>of</strong> Si or GaAs, for example, the orientation <strong>of</strong>the ion beam with respect to the crystallographic axes <strong>of</strong> the substrate can have apronounced effect on the range distribution. Figure 8.1 shows the rangedistribution in Si for 100 keV As implanted with the beam aligned parallel to the〈100〉 crystal axis (solid line) <strong>and</strong> oriented away from any crystal axes or planes(dashed line). As is evident in the figure, implantation along crystal axes can leadto a fraction <strong>of</strong> the total number <strong>of</strong> ions that penetrate several times Rp.The crystal orientation influence on ion penetration is called channeling or thechanneling effect. When an ion trajectory is aligned along atomic rows, thepositive atomic potentials <strong>of</strong> the line <strong>of</strong> atoms steers where the positively chargedion goes within the open space, or channels, between the atomic rows. Thesechanneled ions do not make close-impact collisions with the lattice atoms <strong>and</strong>have a much lower rate <strong>of</strong> energy loss, dE/dx, <strong>and</strong> hence a greater range than those<strong>of</strong> nonchanneled ions. The depth distribution <strong>of</strong> channeled ions is difficult tocharacterize under routine implantation conditions. The channeling distributiondepends on surface preparation, substrate temperature, beam alignment, <strong>and</strong> thedisorder introduced during the implantation process itself. The channeled ions thatpenetrate beyond R p <strong>of</strong>ten have a distribution that falls <strong>of</strong>f exponentially withdistance as exp(−x/λ c ), where λ c R .pAnother consequence <strong>of</strong> channeling is that the energy spectrum <strong>of</strong> particlesscattered back from a crystal aligned with the beam is dramatically different fromthat <strong>of</strong> a noncrystalline solid (Fig. 8.2). In the aligned spectrum the scattering yieldfrom the bulk <strong>of</strong> the solid is reduced by almost two orders <strong>of</strong> magnitude, <strong>and</strong>a peak occurs at a position corresponding to scattering from the surface atoms.Both the surface peak <strong>and</strong> the reduction in yield are due to shadowing – the ability

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