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Ion Implantation and Synthesis of Materials - Studium

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236 15 <strong>Ion</strong> <strong>Implantation</strong> in CMOS Technology: Machine Challenges15.6 Conclusions <strong>and</strong> the Future <strong>of</strong> <strong>Ion</strong> <strong>Implantation</strong>in SemiconductorsWe have discussed some <strong>of</strong> the device <strong>and</strong> economic imperatives driving ionimplantation technology today. <strong>Ion</strong> implant remains one <strong>of</strong> the most productiveequipment sectors in a fab, despite arguably being one <strong>of</strong> the most complex. Theimplantation machine l<strong>and</strong>scape looks very different than it did ca. 1974 when lowcurrent implanters used for threshold voltage adjustment comprised more than60% <strong>of</strong> a small ($14 M) market (Rose 1998). The number <strong>of</strong> implanter types hasincreased with the number <strong>and</strong> type <strong>of</strong> implants. Medium current implanterssupplanted low current implanters in the mid-1970s. This was followed by thewidespread manufacturing use <strong>of</strong> high current <strong>and</strong> high energy implanters in theearly 1980s <strong>and</strong> the mid 1990s, respectively. Figure 15.17 shows the number <strong>of</strong>implant steps for an individual process flow as a function <strong>of</strong> node <strong>and</strong> year. Whatwill the next 20 years bring in terms <strong>of</strong> implantation technology? This questionwill be answered by some combination <strong>of</strong> the laws <strong>of</strong> physics <strong>and</strong> the vagaries <strong>of</strong>economics.The shrinking <strong>of</strong> devices over the past 30 years has been fairly accuratelydescribed by Moore’s Law, with no fundamental physical constraints encounteredin this evolution. However, in the next 5–10 years, new classes <strong>of</strong> materials <strong>and</strong>devices will be required as physical limits are reached. The most obvious example<strong>of</strong> this limit is the transition from SiO 2 (SiO x N y ) gate dielectrics, which havereached their physical thickness limit, to new higher permittivity dielectrics. Thistransition <strong>and</strong> others require unparalleled investment to prevent Moore’s Lawfrom faltering. Similarly, continuous increases in wafer size have been driven bythe economic advantage <strong>of</strong> being able to produce more devices per wafer at arelatively constant manufacturing cost. However, the next projected wafer size <strong>of</strong>450 mm requires not only a tour-de-force in crystal growth technology butenormous investment in both wafer processing <strong>and</strong> wafer transport hardware.The biggest impact on implant technology will come from the widespreadadoption <strong>of</strong> SOI technologies. Devices built on SOI substrates are now inproduction. The use <strong>of</strong> oxide instead <strong>of</strong> p–n junctions to provide much <strong>of</strong> thecircuit isolation significantly reduces the number <strong>of</strong> implants required. This isespecially true for higher energy (well) implants, since the buried oxide layer is inthe region formerly occupied by the well structures. How widely SOI technologiesare eventually adopted will depend mainly on how much the substrate cost can bereduced. In the unlikely event that 450 mm substrates are ever used, only singlewaferendstations will be practical in terms <strong>of</strong> footprint. It will be interesting tosee how all these forces play out, but one thing is certain: ion implantation willcontinue to play a central role in Si technology. The unequalled precision <strong>and</strong>versatility <strong>of</strong> doping achievable by ion implantation ensures this.

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