12.07.2015 Views

Ion Implantation and Synthesis of Materials - Studium

Ion Implantation and Synthesis of Materials - Studium

Ion Implantation and Synthesis of Materials - Studium

SHOW MORE
SHOW LESS

You also want an ePaper? Increase the reach of your titles

YUMPU automatically turns print PDFs into web optimized ePapers that Google loves.

202 Particle Interactionsa0.8853a0L=1/22/3 2/3( Z1 + Z2).(2.22)The screening lengths presented in (2.20)–(2.22) do not differ significantly fromeach other. In all cases the screening lengths scale approximately with Z 1/3 <strong>of</strong> thecolliding atoms.ReferencesBanerjea, A., Smith, J.R.: Origins <strong>of</strong> the universal binding-energy relation. Phys. Rev. B37, 6632 (1988)Mayer, J.W., Lau, S.S.: Electronic <strong>Materials</strong> Science: For Integrated Circuits in Si <strong>and</strong>GaAs. Macmillan Publishing Company, New York (1990)Rose, J.H., Smith, J.R., Ferrante, J.: Universal binding-energy curves for metals <strong>and</strong> Bimetallicinterfaces. Phys. Rev. Lett. 47, 675 (1981)Rose, J.H., Smith, J.R., Ferrante, J.: Universal features <strong>of</strong> bonding in metals. Phys. Rev. B28, 1835 (1983)Rose, J.H., Smith, J.R., Guines, F., Ferrante, J.: Universal features <strong>of</strong> the equation <strong>of</strong> state<strong>of</strong> metals. Phys. Rev. B 29, 2963 (1984)Torrens, I.M.: Interatomic Potentials. Academic, New York (1972)Tu, K.-N., Mayer, J.W., Feldman, L.C.: Electronic Thin Film Science for Electrical Engineers<strong>and</strong> <strong>Materials</strong> Scientists. Macmillan Publishing Company, New York (1992)Wilson, W.D., Haggmark, L.G., Biersack, J.P.: Calculations <strong>of</strong> nuclear stopping, range <strong>and</strong>straggling in the low-energy region. Phys. Rev. B 15, 2458 (1977)Ziegler, J.F., Biersack, J.P., Littmark, U.: The Stopping <strong>and</strong> Range <strong>of</strong> <strong>Ion</strong>s in Solids. PergamonPress, New York (1985)Suggested ReadingBaker, E.B.: The application <strong>of</strong> the Fermi–Thomas statistical model to the calculation <strong>of</strong>potential distribution in positive ions. Phys. Rev. 36, 630 (1930)Eckstein, W.: Computer Simulation <strong>of</strong> <strong>Ion</strong>–Solid Interactions, chap. 4. Springer, BerlinHeidelberg New York (1991)Feldman, L.C., Mayer, J.W.: Fundamentals <strong>of</strong> Surface <strong>and</strong> Thin Film Analysis. North-Holl<strong>and</strong>, New York (1986)Fermi, E.: Eine Statistische Methode zur Bestimmung einiger Eigenschaften des Atoms undihre Anwendung auf die Theorie des periodischen Systems der Elemente. Z. Phys. 48,73 (1928)

Hooray! Your file is uploaded and ready to be published.

Saved successfully!

Ooh no, something went wrong!