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Ion Implantation and Synthesis of Materials - Studium

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226 15 <strong>Ion</strong> <strong>Implantation</strong> in CMOS Technology: Machine Challenges15.3.3 Molecular <strong>Implantation</strong>Another way to take advantage <strong>of</strong> improved transport at higher beam energies is toimplant a molecule containing the desired dopant atom, e.g., BF 2 (borondifluoride). With a molecular mass <strong>of</strong> 49, compared with 11 for atomic B, theBF + 2 ion can be implanted at 4.5× the energy while still achieving the sameprojected range for the boron atom. Of course, one also gets an implant <strong>of</strong> theother atom in the molecule, in this case F at twice the boron dose. The extraspecies might <strong>of</strong>fer some process advantage, but at the least it must not lead to aprocess disadvantage.The list <strong>of</strong> molecular species in common use at this time includes borondifluoride, BF + 2 , the phosphorus <strong>and</strong> arsenic dimer ions P +2 <strong>and</strong> As + 2 , <strong>and</strong>tetramers P + 4<strong>and</strong> As + 4. Additional molecular ion species currently underconsideration include decaborane, B 10H + 14, icosaborane (a decaborane dimer),B20H + 28, <strong>and</strong> octadecaborane B18H + 22. The molecular ions containing more thanone dopant atom per ion <strong>of</strong>fer an additional advantage in that there is effectivelymore atoms implanted per unit <strong>of</strong> ion current. A figure <strong>of</strong> merit for the use <strong>of</strong>molecular implants is the relative atomic mass ratio which gives directly thehigher energies needed for molecular implants (Fig. 15.8). These higher energiesresult in more efficient beam transport because <strong>of</strong> lower space charge effects.15.4 Low Energy Productivity: Beam UtilizationIncreasing beam currents through improvements in beam transport is only part <strong>of</strong>the solution for improving productivity. The other part is to minimize the time thebeam spends <strong>of</strong>f the water, characterized as beam utilization. We present here atreatment <strong>of</strong> utilization, developed by Brown et al. (2004). We then include acategorization <strong>of</strong> implanters commercialized over the last 35 years, in terms <strong>of</strong>beam type <strong>and</strong> scanning mechanism <strong>and</strong> the implication <strong>of</strong> each implanter’sarchitecture on beam utilization.atom ormoleculerelativeperveanceB BF 2 B 10 H 14 B 18 H 22 P P 2 As As 21 0.22 0.09 0.05 1 0.5 1 0.5Fig. 15.8. Relative mass ratios <strong>of</strong> atomic <strong>and</strong> molecular dopant ions

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