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Online proceedings - EDA Publishing Association

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7-9 October 2009, Leuven, Belgium<br />

Impact of Moisture Absorption on Warpage of Large<br />

BGA packages during a lead-free reflow process<br />

B. Vandevelde 1 , R. Deweerdt 2 , F. Duflos 2 , M. Gonzalez 1 ,<br />

D. Vanderstraeten 3 , Eddy Blansaer 3 , Guy Brizar 3 , Renaud Gillon 3<br />

1 IMEC, Kapeldreef 75, B-3001 Leuven, Belgium<br />

2 Groep T, Leuven, Belgium<br />

3 On Semi, Oudenaarde, Belgium<br />

Abstract- During a solder reflow process, IC components<br />

deform under a rather excessive temperature loading. A too<br />

high warpage at temperatures above solder melting, can cause<br />

either that the joints in the corner are not soldered to the PCB<br />

pads, or that the solder joints are shorted due to compressing of<br />

the corner joints.<br />

In this work, the warpage of a 35by35 mm 2 large PBGA<br />

package has been measured during a temperature profile which<br />

is similar to a lead-free soldering process. It was found that the<br />

warpage becomes very high when the applied temperature is<br />

above the glass transition temperature of the overmould<br />

material. At that moment, there exists a very large CTE<br />

mismatch between the overmould and the BT laminate.<br />

The warpage measurements have been successfully verified<br />

by Finite Element Modelling adapting the right material<br />

properties. This proves that modeling can be used as an<br />

estimator of warpage for packages.<br />

Also the impact of initial moisture uptake has been<br />

experimentally investigated and it was shown that it has a<br />

dominant effect on its warpage behaviour.<br />

Keywords – Warpage, PBGA, topography measurements<br />

thermo-mechanical stress, solder reflow, FEM simulation<br />

I. INTRODUCTION<br />

Packages consist of different materials, having a different<br />

coefficient of thermal expansion (CTE). Under a temperature<br />

change, the different mechanical expansions cause internally<br />

acting forces and this finally results in internal mechanical<br />

stresses and an out-of-plane deformation of the package.<br />

In this paper, the solder reflow process is considered as<br />

temperature profile, where components are subjected to<br />

rather excessive temperature loading. As a consequence,<br />

excessive warpage can cause shorts due to compression of<br />

neighbouring balls in the corner area under global warpage,<br />

as indicated in the schematic drawing in Fig. 1. For other<br />

package concepts, e.g. QFN’s, the opposite can happen that<br />

packages are warped upwards in the corner, resulting in open<br />

connections, or even worse, so-called frozen connections<br />

only made by mechanical contact, giving no failure at room<br />

temperature but starts to disconnect again at higher<br />

temperatures.<br />

20°C<br />

250°C<br />

(SAC reflow<br />

temperature)<br />

Fig. 1: Schematic drawing of shorts at the corner due to excessive<br />

warpage (happens during liquid soldering)<br />

This phenomenon of interconnection problems due to<br />

excessive warpage during solder reflow, is strengthen by the<br />

change to lead-free, which requires typically 30°C higher<br />

melting temperature, and also by moisture absorption, as will<br />

be shown in this paper. As warpage is typically proportional<br />

to the square of the package size, large packages are also<br />

more vulnerable. Also the overmould properties play a very<br />

important role: both its Tg (glass transition point) and the<br />

amount of moisture it will absorb, will determine the<br />

warpage profile..<br />

II. EXPERIMENTAL WORK<br />

A. Sample description<br />

For this study, a PBGA package encapsulated by an<br />

overmould material has been selected. The size of the<br />

package is 35 by 35 mm 2 , the die size is 13 by 13 mm 2 .<br />

Fig. 2: Picture and schematic drawing of the PBGA 35x35 mm 2<br />

package<br />

©<strong>EDA</strong> <strong>Publishing</strong>/THERMINIC 2009 113<br />

ISBN: 978-2-35500-010-2

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