Online proceedings - EDA Publishing Association
Online proceedings - EDA Publishing Association
Online proceedings - EDA Publishing Association
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7-9 October 2009, Leuven, Belgium<br />
Impact of Moisture Absorption on Warpage of Large<br />
BGA packages during a lead-free reflow process<br />
B. Vandevelde 1 , R. Deweerdt 2 , F. Duflos 2 , M. Gonzalez 1 ,<br />
D. Vanderstraeten 3 , Eddy Blansaer 3 , Guy Brizar 3 , Renaud Gillon 3<br />
1 IMEC, Kapeldreef 75, B-3001 Leuven, Belgium<br />
2 Groep T, Leuven, Belgium<br />
3 On Semi, Oudenaarde, Belgium<br />
Abstract- During a solder reflow process, IC components<br />
deform under a rather excessive temperature loading. A too<br />
high warpage at temperatures above solder melting, can cause<br />
either that the joints in the corner are not soldered to the PCB<br />
pads, or that the solder joints are shorted due to compressing of<br />
the corner joints.<br />
In this work, the warpage of a 35by35 mm 2 large PBGA<br />
package has been measured during a temperature profile which<br />
is similar to a lead-free soldering process. It was found that the<br />
warpage becomes very high when the applied temperature is<br />
above the glass transition temperature of the overmould<br />
material. At that moment, there exists a very large CTE<br />
mismatch between the overmould and the BT laminate.<br />
The warpage measurements have been successfully verified<br />
by Finite Element Modelling adapting the right material<br />
properties. This proves that modeling can be used as an<br />
estimator of warpage for packages.<br />
Also the impact of initial moisture uptake has been<br />
experimentally investigated and it was shown that it has a<br />
dominant effect on its warpage behaviour.<br />
Keywords – Warpage, PBGA, topography measurements<br />
thermo-mechanical stress, solder reflow, FEM simulation<br />
I. INTRODUCTION<br />
Packages consist of different materials, having a different<br />
coefficient of thermal expansion (CTE). Under a temperature<br />
change, the different mechanical expansions cause internally<br />
acting forces and this finally results in internal mechanical<br />
stresses and an out-of-plane deformation of the package.<br />
In this paper, the solder reflow process is considered as<br />
temperature profile, where components are subjected to<br />
rather excessive temperature loading. As a consequence,<br />
excessive warpage can cause shorts due to compression of<br />
neighbouring balls in the corner area under global warpage,<br />
as indicated in the schematic drawing in Fig. 1. For other<br />
package concepts, e.g. QFN’s, the opposite can happen that<br />
packages are warped upwards in the corner, resulting in open<br />
connections, or even worse, so-called frozen connections<br />
only made by mechanical contact, giving no failure at room<br />
temperature but starts to disconnect again at higher<br />
temperatures.<br />
20°C<br />
250°C<br />
(SAC reflow<br />
temperature)<br />
Fig. 1: Schematic drawing of shorts at the corner due to excessive<br />
warpage (happens during liquid soldering)<br />
This phenomenon of interconnection problems due to<br />
excessive warpage during solder reflow, is strengthen by the<br />
change to lead-free, which requires typically 30°C higher<br />
melting temperature, and also by moisture absorption, as will<br />
be shown in this paper. As warpage is typically proportional<br />
to the square of the package size, large packages are also<br />
more vulnerable. Also the overmould properties play a very<br />
important role: both its Tg (glass transition point) and the<br />
amount of moisture it will absorb, will determine the<br />
warpage profile..<br />
II. EXPERIMENTAL WORK<br />
A. Sample description<br />
For this study, a PBGA package encapsulated by an<br />
overmould material has been selected. The size of the<br />
package is 35 by 35 mm 2 , the die size is 13 by 13 mm 2 .<br />
Fig. 2: Picture and schematic drawing of the PBGA 35x35 mm 2<br />
package<br />
©<strong>EDA</strong> <strong>Publishing</strong>/THERMINIC 2009 113<br />
ISBN: 978-2-35500-010-2