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COLLECTION OF PAPERS PRESENTED AT THE 15 th International Workshop on THERMal INvestigation of ICs and Systems Leuven, Belgium 7-9 October 2009 Sponsored by: The Institute of Electrical & Electronics Engineers, Inc. IEEE Components, Packaging and Manufacturing Technology Society
7-9 October 2009, Leuven, Belgium ©EDA Publishing Association /THERMINIC2009 ISBN: 978-2-35500-010-2 IEEE Catalog Number: CFP09TII Abstracting / Indexing: • Cambridge Scientific Abstracts • INSPEC • PASCAL • CEDOCAR • British Library’s OPAC • TIB • BNF • SUDOC Repositories: • IEEE XPLORE • CNRS/HAL Open Archives • ArXiv Open Archives • EU Funded Driver Project Open Archives Additional copies of this PROCEEDINGS or copies of previous years may be purchased from: CMP, 46 Avenue Félix Viallet, 38031 Grenoble, France. Fax: +33 4 76 47 38 14 – Order forms available at: http://cmp.imag.fr/conferences Visit EDA Publishing Association http://www.eda-publishing.org Since 2005 proceedings are available on-line. ©EDA Publishing/THERMINIC 2009 II ISBN: 978-2-35500-010-2
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Page 9 and 10: Poster session: Introduction* 7-9 O
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Page 21 and 22: x −1 V(x) = , f(y) = x + 1 y + 1
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OASIS files Final 2D layout design_
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Thermal behaviour causes some varia
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on devices of long-term storage at
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Fig. 3. Standard package simulation
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∂ 2 T ∂ x ∂2 T T 2 ∂ y 2
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q h T h 7-9 October 2009, Leuven, B
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is used to model the forward polari
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III. SUMMARY In this study it was s
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where V is open-circuit voltage, r
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V. THERMAL MATCHING IN LOW-DIMENSIO
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Fig. 8. Low-power wireless medical
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III. FINITE ELEMENT MODELLING OF BG
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I OLED 7-9 October 2009, Leuven, Be
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Fig. 5 Computed absolute temperatur
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ETF ∫ VCO f vco (T) output 7-9 Oc
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profile describes the temperature v
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In Fig. 9 (a) the same integer work
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meshes with highest heat removal ra
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[5] P. Lee and S. Garimella, “Hot
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In contrast to earlier results pres
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7-9 October 2009, Leuven, Belgium (
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hosing fittings etc.) were ‘off t
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©EDA Publishing/THERMINIC 2009 174
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The spray boiling curves obtained i
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along the measure zone over the hea
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III. TEMPERATURE AND THICKNESS DEPE
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an increasing function of its TE fi
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The regime transition at λ β = 1.
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transient is measured by the transi
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onding it was compressed down to ~6
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