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Online proceedings - EDA Publishing Association

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7-9 October 2009, Leuven, Belgium<br />

keff (W/mK)<br />

8<br />

7<br />

6<br />

5<br />

4<br />

3<br />

2<br />

1<br />

0<br />

B3 (p=2 mm) - k_eff<br />

D1 (p=1 mm) - k_eff<br />

D1 (p=1 mm) - RA<br />

B3 (p=2 mm) - RA<br />

0 0.5 1 1.5 2 2.5 3<br />

Pressure (MPa)<br />

0.001<br />

0.0009<br />

0.0008<br />

0.0007<br />

0.0006<br />

0.0005<br />

0.0004<br />

0.0003<br />

0.0002<br />

0.0001<br />

conductivity and specific thermal resistance are plotted as a<br />

function of pressure in Fig. 7. Here, while the higher featuredensity<br />

sample “D1” exhibits higher effective thermal<br />

conductivity at all pressures, its overall thermal resistance it<br />

actually higher in the upper pressure range. This is due to the<br />

inability to compress the sample to as thin a bondline as<br />

sample “B3” as indicated in Fig. 6.<br />

C. Effect of Feature Shape<br />

A direct comparison was made between the baseline case<br />

of the circular-based hollow cone (sample “B”) and a squarebased<br />

hollow pyramid of similar outer dimensions and<br />

thickness (sample “C”). The variation of pressure as a<br />

function strain is presented in Fig 8. Clearly, the squarebased<br />

pyramid requires less force to deform to a given strain.<br />

It is hypothesized this is due to stress concentrations that<br />

exist where the sides of the pyramid meet as opposed to the<br />

somewhat stiffer axisymmetric buckling that would occur in<br />

the circular hollow cone as predicted by early model results<br />

[6].<br />

From a thermal standpoint, the pyramid structure exhibits a<br />

Pressure (MPa)<br />

Fig. 7: Variation of effective thermal conductivity and specific thermal<br />

resistance with pressure for MMT-TIMs of two different pitches<br />

3<br />

2.5<br />

2<br />

1.5<br />

1<br />

0.5<br />

0<br />

0 20 40 60 80 100<br />

Strain (%)<br />

0<br />

B3 (cone)<br />

C1 (pyramid)<br />

Fig. 8: Variation of compressive pressure with strain for two conical<br />

and pyramidal MMT-TIM geometries of similar dimensions<br />

RA (m 2 K/W)<br />

keff (W/mK)<br />

4.5<br />

4<br />

3.5<br />

3<br />

2.5<br />

2<br />

1.5<br />

1<br />

0.5<br />

0<br />

B3 (cone) - k_eff<br />

C1 (pyramid) - k_eff<br />

B3 (cone) - RA<br />

C1 (pyramid) - RA<br />

0 0.5 1 1.5 2 2.5 3<br />

Pressure (MPa)<br />

0.001<br />

0.0009<br />

0.0008<br />

0.0007<br />

0.0006<br />

0.0005<br />

0.0004<br />

0.0003<br />

0.0002<br />

0.0001<br />

Fig. 9: Variation of effective thermal conductivity with pressure for<br />

conical and pyramidal MMT-TIMs<br />

somewhat lower effective thermal conductivity over the<br />

range of applied pressure, as illustrated in Fig 9. In terms of<br />

specific thermal resistance, however, at low pressures, the<br />

pyramidal MMT-TIM has a lower thermal resistance. At<br />

higher pressures, the conical shaped MMT-TIM represents<br />

the optimum geometry.<br />

D. Thermal Contact Resistance of MMT-TIMs<br />

These results serve also to highlight the main challenge in<br />

characterizing the thermal performance of MMT-TIMs:<br />

specifically distinguishing the bulk thermal resistance of the<br />

MMT-TIM from the contact thermal resistance with the<br />

meter bars of the test apparatus. Typically, for conventional,<br />

homogeneous TIMs, the contact resistance can be<br />

characterized experimentally by measuring several<br />

thicknesses of TIM, plotting the thermal resistance as a<br />

function of thickness and extrapolating contact resistance as<br />

the y-intercept where the thickness is zero [8]. For MMT-<br />

TIMs however, this method cannot be used due to the nonuniform<br />

behaviour of the bulk TIM.<br />

The specific thermal resistance of each TIM is plotted as a<br />

function of pressure at 50% strain in Fig. 10. Overall, there is<br />

a decreasing trend in thermal resistance, which demonstrates<br />

that, generally, stiffer structures offer a lower overall thermal<br />

resistance. This is indicative of the important role thermal<br />

contact resistance plays in the thermal performance of these<br />

TIMs. However, compliance is also required of thermal<br />

interface materials to avoid exerting excessive stresses on the<br />

mating parts. Thus a trade-off between thermal resistance<br />

and compressive pressure exists. To this point, sample “D2”<br />

exhibits over a 3 fold increase in compliance (i.e. reduction in<br />

pressure required to achieve 50% strain) while exhibiting a<br />

relatively small increase in thermal resistance (~0.00005<br />

m2k/W)<br />

The thermal contact resistance and electrical contact<br />

resistance are qualitatively similar as both of these<br />

phenomena depend on the ratio of actual, intimate contact<br />

area to the apparent contact area [9, 10]. However, whereas<br />

thermally the bulk resistances are on similar orders of<br />

magnitude as the contact resistances, electrically the<br />

0<br />

RA (m 2 K/W)<br />

©<strong>EDA</strong> <strong>Publishing</strong>/THERMINIC 2009 214<br />

ISBN: 978-2-35500-010-2

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