Online proceedings - EDA Publishing Association
Online proceedings - EDA Publishing Association
Online proceedings - EDA Publishing Association
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7-9 October 2009, Leuven, Belgium<br />
keff (W/mK)<br />
8<br />
7<br />
6<br />
5<br />
4<br />
3<br />
2<br />
1<br />
0<br />
B3 (p=2 mm) - k_eff<br />
D1 (p=1 mm) - k_eff<br />
D1 (p=1 mm) - RA<br />
B3 (p=2 mm) - RA<br />
0 0.5 1 1.5 2 2.5 3<br />
Pressure (MPa)<br />
0.001<br />
0.0009<br />
0.0008<br />
0.0007<br />
0.0006<br />
0.0005<br />
0.0004<br />
0.0003<br />
0.0002<br />
0.0001<br />
conductivity and specific thermal resistance are plotted as a<br />
function of pressure in Fig. 7. Here, while the higher featuredensity<br />
sample “D1” exhibits higher effective thermal<br />
conductivity at all pressures, its overall thermal resistance it<br />
actually higher in the upper pressure range. This is due to the<br />
inability to compress the sample to as thin a bondline as<br />
sample “B3” as indicated in Fig. 6.<br />
C. Effect of Feature Shape<br />
A direct comparison was made between the baseline case<br />
of the circular-based hollow cone (sample “B”) and a squarebased<br />
hollow pyramid of similar outer dimensions and<br />
thickness (sample “C”). The variation of pressure as a<br />
function strain is presented in Fig 8. Clearly, the squarebased<br />
pyramid requires less force to deform to a given strain.<br />
It is hypothesized this is due to stress concentrations that<br />
exist where the sides of the pyramid meet as opposed to the<br />
somewhat stiffer axisymmetric buckling that would occur in<br />
the circular hollow cone as predicted by early model results<br />
[6].<br />
From a thermal standpoint, the pyramid structure exhibits a<br />
Pressure (MPa)<br />
Fig. 7: Variation of effective thermal conductivity and specific thermal<br />
resistance with pressure for MMT-TIMs of two different pitches<br />
3<br />
2.5<br />
2<br />
1.5<br />
1<br />
0.5<br />
0<br />
0 20 40 60 80 100<br />
Strain (%)<br />
0<br />
B3 (cone)<br />
C1 (pyramid)<br />
Fig. 8: Variation of compressive pressure with strain for two conical<br />
and pyramidal MMT-TIM geometries of similar dimensions<br />
RA (m 2 K/W)<br />
keff (W/mK)<br />
4.5<br />
4<br />
3.5<br />
3<br />
2.5<br />
2<br />
1.5<br />
1<br />
0.5<br />
0<br />
B3 (cone) - k_eff<br />
C1 (pyramid) - k_eff<br />
B3 (cone) - RA<br />
C1 (pyramid) - RA<br />
0 0.5 1 1.5 2 2.5 3<br />
Pressure (MPa)<br />
0.001<br />
0.0009<br />
0.0008<br />
0.0007<br />
0.0006<br />
0.0005<br />
0.0004<br />
0.0003<br />
0.0002<br />
0.0001<br />
Fig. 9: Variation of effective thermal conductivity with pressure for<br />
conical and pyramidal MMT-TIMs<br />
somewhat lower effective thermal conductivity over the<br />
range of applied pressure, as illustrated in Fig 9. In terms of<br />
specific thermal resistance, however, at low pressures, the<br />
pyramidal MMT-TIM has a lower thermal resistance. At<br />
higher pressures, the conical shaped MMT-TIM represents<br />
the optimum geometry.<br />
D. Thermal Contact Resistance of MMT-TIMs<br />
These results serve also to highlight the main challenge in<br />
characterizing the thermal performance of MMT-TIMs:<br />
specifically distinguishing the bulk thermal resistance of the<br />
MMT-TIM from the contact thermal resistance with the<br />
meter bars of the test apparatus. Typically, for conventional,<br />
homogeneous TIMs, the contact resistance can be<br />
characterized experimentally by measuring several<br />
thicknesses of TIM, plotting the thermal resistance as a<br />
function of thickness and extrapolating contact resistance as<br />
the y-intercept where the thickness is zero [8]. For MMT-<br />
TIMs however, this method cannot be used due to the nonuniform<br />
behaviour of the bulk TIM.<br />
The specific thermal resistance of each TIM is plotted as a<br />
function of pressure at 50% strain in Fig. 10. Overall, there is<br />
a decreasing trend in thermal resistance, which demonstrates<br />
that, generally, stiffer structures offer a lower overall thermal<br />
resistance. This is indicative of the important role thermal<br />
contact resistance plays in the thermal performance of these<br />
TIMs. However, compliance is also required of thermal<br />
interface materials to avoid exerting excessive stresses on the<br />
mating parts. Thus a trade-off between thermal resistance<br />
and compressive pressure exists. To this point, sample “D2”<br />
exhibits over a 3 fold increase in compliance (i.e. reduction in<br />
pressure required to achieve 50% strain) while exhibiting a<br />
relatively small increase in thermal resistance (~0.00005<br />
m2k/W)<br />
The thermal contact resistance and electrical contact<br />
resistance are qualitatively similar as both of these<br />
phenomena depend on the ratio of actual, intimate contact<br />
area to the apparent contact area [9, 10]. However, whereas<br />
thermally the bulk resistances are on similar orders of<br />
magnitude as the contact resistances, electrically the<br />
0<br />
RA (m 2 K/W)<br />
©<strong>EDA</strong> <strong>Publishing</strong>/THERMINIC 2009 214<br />
ISBN: 978-2-35500-010-2