Online proceedings - EDA Publishing Association
Online proceedings - EDA Publishing Association
Online proceedings - EDA Publishing Association
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on devices of long-term storage at elevated temperatures<br />
without any electrical stresses applied. Purpose of<br />
Stabilization bake is usually to serve as part of a screening<br />
sequence or as a preconditioning treatment prior to the<br />
conduct of other tests. Test condition applied to both sensor<br />
cell and read-out circuit is condition A, specifically 75°C for<br />
24 hours minimum [9].<br />
Last the LTOL (Low Temperature Operating Life) test<br />
was carried out in order to determine the reliability of the<br />
device under low temperature conditions over an extended<br />
period of time. It consists of subjecting the parts to a<br />
specified bias or electrical stressing, for a specified amount<br />
of time, and at a specified low temperature. LTOL test is<br />
documented by JEDEC in a single standards spec, JEDEC<br />
JESD22-A108. Test condition applied to both solar sensor<br />
and read-out circuit is -20 °C for 24 hours minimum [10].<br />
7-9 October 2009, Leuven, Belgium<br />
For the self-made sensor cell we’ve experienced an<br />
average change of 0.24 %/°C in output voltage of the<br />
irradiation sensor (short circuit current of the sensor cell)<br />
Fig. 7. Compared to industrial sensors these values are<br />
almost two times higher (0.15 %/°C), for this reason<br />
comparing spectral response and temperature dependence<br />
measurements with an industrial solar cell (manufactured by<br />
Siemens) were performed.<br />
Observations in case of industrial cell’s temperature<br />
dependence test revealed an average change of 0.11 %/°C in<br />
output voltage Fig. 7. These values correspond to the<br />
parameters given by the industrial irradiation measurement<br />
devices. Based on the measurements performed we could<br />
conclude that the cell’s short circuit current changes not only<br />
according to temperature, but is also influenced by the<br />
structure of the solar cell.<br />
V. DISCUSSION<br />
The circuit’s temperature dependence was studied first.<br />
The reference point is a set output voltage value at T=25°C,<br />
changes that occur will be compared to this value.<br />
5<br />
T=-10°C T=0°C T=10°C T=25°C<br />
T=40°C T=60°C T=80°C<br />
3005<br />
4<br />
Output voltage [mV]<br />
3000<br />
2995<br />
2990<br />
2985<br />
2980<br />
2975<br />
2970<br />
-20 -10 0,2 9,2 20 25 30 40 49,6 59,2 70 80<br />
Temperature [°C]<br />
Short circuit current [mA]<br />
3<br />
2<br />
1<br />
0<br />
392 465 550 622,5 705 790 871,5 1023<br />
Wavelength [nm]<br />
Fig. 6. Temperature dependence of read-out circuit<br />
This resulted in an average output voltage decrease of<br />
0.005 %/°C with temperature Fig. 6.<br />
Afterwards the sensor cell’s temperature dependence was<br />
investigated.<br />
12<br />
Fig. 8. Spectral response of self-made solar cell<br />
T=-10°C T=0°C T=10°C T=25°C<br />
T=40°C T=60°C T=80°C<br />
Uout, Siemens cell [mV]<br />
Uout, our cell [mV]<br />
10<br />
Output voltage [mV]<br />
1800<br />
1700<br />
1600<br />
1500<br />
1400<br />
1300<br />
1200<br />
-20 -10 0 10,2 20 25,5 30 40,6 50 60,5 70,7 80<br />
Temperature [°C]<br />
Short circuit current [mA]<br />
8<br />
6<br />
4<br />
2<br />
0<br />
392 465 550 622,5 705 790 871,5 1023<br />
Wavelength [nm]<br />
Fig. 9. Spectral response of Siemens cell<br />
Fig. 7. Temperature dependence of self-made and Siemens solar cell<br />
The sensor cell made by us is because of the N + substrate,<br />
incorporated to ensure low series resistance, only sensitive<br />
©<strong>EDA</strong> <strong>Publishing</strong>/THERMINIC 2009 64<br />
ISBN: 978-2-35500-010-2