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Online proceedings - EDA Publishing Association

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on devices of long-term storage at elevated temperatures<br />

without any electrical stresses applied. Purpose of<br />

Stabilization bake is usually to serve as part of a screening<br />

sequence or as a preconditioning treatment prior to the<br />

conduct of other tests. Test condition applied to both sensor<br />

cell and read-out circuit is condition A, specifically 75°C for<br />

24 hours minimum [9].<br />

Last the LTOL (Low Temperature Operating Life) test<br />

was carried out in order to determine the reliability of the<br />

device under low temperature conditions over an extended<br />

period of time. It consists of subjecting the parts to a<br />

specified bias or electrical stressing, for a specified amount<br />

of time, and at a specified low temperature. LTOL test is<br />

documented by JEDEC in a single standards spec, JEDEC<br />

JESD22-A108. Test condition applied to both solar sensor<br />

and read-out circuit is -20 °C for 24 hours minimum [10].<br />

7-9 October 2009, Leuven, Belgium<br />

For the self-made sensor cell we’ve experienced an<br />

average change of 0.24 %/°C in output voltage of the<br />

irradiation sensor (short circuit current of the sensor cell)<br />

Fig. 7. Compared to industrial sensors these values are<br />

almost two times higher (0.15 %/°C), for this reason<br />

comparing spectral response and temperature dependence<br />

measurements with an industrial solar cell (manufactured by<br />

Siemens) were performed.<br />

Observations in case of industrial cell’s temperature<br />

dependence test revealed an average change of 0.11 %/°C in<br />

output voltage Fig. 7. These values correspond to the<br />

parameters given by the industrial irradiation measurement<br />

devices. Based on the measurements performed we could<br />

conclude that the cell’s short circuit current changes not only<br />

according to temperature, but is also influenced by the<br />

structure of the solar cell.<br />

V. DISCUSSION<br />

The circuit’s temperature dependence was studied first.<br />

The reference point is a set output voltage value at T=25°C,<br />

changes that occur will be compared to this value.<br />

5<br />

T=-10°C T=0°C T=10°C T=25°C<br />

T=40°C T=60°C T=80°C<br />

3005<br />

4<br />

Output voltage [mV]<br />

3000<br />

2995<br />

2990<br />

2985<br />

2980<br />

2975<br />

2970<br />

-20 -10 0,2 9,2 20 25 30 40 49,6 59,2 70 80<br />

Temperature [°C]<br />

Short circuit current [mA]<br />

3<br />

2<br />

1<br />

0<br />

392 465 550 622,5 705 790 871,5 1023<br />

Wavelength [nm]<br />

Fig. 6. Temperature dependence of read-out circuit<br />

This resulted in an average output voltage decrease of<br />

0.005 %/°C with temperature Fig. 6.<br />

Afterwards the sensor cell’s temperature dependence was<br />

investigated.<br />

12<br />

Fig. 8. Spectral response of self-made solar cell<br />

T=-10°C T=0°C T=10°C T=25°C<br />

T=40°C T=60°C T=80°C<br />

Uout, Siemens cell [mV]<br />

Uout, our cell [mV]<br />

10<br />

Output voltage [mV]<br />

1800<br />

1700<br />

1600<br />

1500<br />

1400<br />

1300<br />

1200<br />

-20 -10 0 10,2 20 25,5 30 40,6 50 60,5 70,7 80<br />

Temperature [°C]<br />

Short circuit current [mA]<br />

8<br />

6<br />

4<br />

2<br />

0<br />

392 465 550 622,5 705 790 871,5 1023<br />

Wavelength [nm]<br />

Fig. 9. Spectral response of Siemens cell<br />

Fig. 7. Temperature dependence of self-made and Siemens solar cell<br />

The sensor cell made by us is because of the N + substrate,<br />

incorporated to ensure low series resistance, only sensitive<br />

©<strong>EDA</strong> <strong>Publishing</strong>/THERMINIC 2009 64<br />

ISBN: 978-2-35500-010-2

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