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Online proceedings - EDA Publishing Association

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7-9 October 2009, Leuven, Belgium<br />

using a compact model of the total physical structure of a<br />

packaged die, including heat spreader.<br />

II. FROM POWER DISTRIBUTION TO TEMPERATURE<br />

DISTRIBUTION<br />

Even when the power distribution across an SoC is<br />

accurately known, the temperature distribution can still be<br />

very different, depending on the thermal behaviour of the<br />

package and the thermal design of the application. This<br />

requires a reasonably accurate model that includes the<br />

thermal properties of the chip, the bonds, the package and<br />

the system. One way to achieve this is to use Compact<br />

Thermal Models (CTM), simple board simulation tools like<br />

COMIC and a Finite Elements (FE) program [1]. CTM’s are<br />

widely used for predicting the maximum junction<br />

temperatures. However, temperature gradients do not belong<br />

to its predicting capability. In order to get to know the<br />

temperature gradient across the die, first a CTM must be<br />

derived. Next the CTM will be used in combination with<br />

COMIC to predict the thermal behaviour of the product in a<br />

simplified application. One of the calculation results is the<br />

effective Heat Transfer Coefficient (HTC) which is working<br />

on the ‘thermal’ contacts of the package with the application<br />

PCB. Next, these HTC’s will be used as thermal boundary<br />

conditions in the FE program. Since the FE model of the<br />

package contains a detailed description of the floorplan of<br />

the IC an accurate prediction of the temperature can be<br />

achieved.<br />

The chip used for case study<br />

Many thermal simulations on integrated circuits are<br />

performed on complex and high-speed processors,<br />

consuming between 50W to a 100W [2, 3]. In [2], the total<br />

temperature variation across the chip at a maximum power<br />

consumption of P total =32.3W is: ΔT=31.3 0 C, with a<br />

minimum temperature of T min =106.1 0 C and a maximum of<br />

T max =137.4 0 C. This minimum and maximum temperature<br />

values, as well as the chip locations where these occur, are<br />

very much dependent on the floorplan of the chip and of the<br />

applied package.<br />

For our research, we use an advanced video and graphics<br />

processor chip used in very advanced digital TV sets. Figure<br />

1 shows the power distribution, based on the physical<br />

position of the processor, controller, memory and interface<br />

cores, when all cores are operating at maximum<br />

performance.<br />

low-performance interfaces<br />

low-performance interfaces<br />

U3<br />

0.8W<br />

U4<br />

0.515W<br />

U2<br />

0.294W 2.94W<br />

U8<br />

0.83W<br />

DDR interface<br />

U1<br />

1.11W<br />

U5<br />

0.21W U6<br />

0.26W<br />

low-performance interfaces<br />

U7<br />

2.02W<br />

Fig. 1. Original floorplan and power distribution during full operation of all<br />

IP cores.<br />

The die would be mounted into a HBGA 40 x 40 mm<br />

package, including a copper drop-in heat spreader. Figure 2<br />

shows a cross section of the total physical structure that has<br />

been included in the model for simulations.<br />

Fig. 2. Physical structure that has been included in the model for<br />

simulations.<br />

DDR interface<br />

Low-Performance<br />

interfaces<br />

Next, the above floorplan, together with the power<br />

numbers were also fed into the finite elements model and<br />

simulated. The goal of the simulations is twofold. First it is<br />

important to predict the overall temperature distribution<br />

across the die and check whether, at some local spot, it<br />

would exceed the maximum specified temperature of 125 0 C.<br />

Second, a large temperature variation may have severe<br />

©<strong>EDA</strong> <strong>Publishing</strong>/THERMINIC 2009 32<br />

ISBN: 978-2-35500-010-2

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