Online proceedings - EDA Publishing Association
Online proceedings - EDA Publishing Association
Online proceedings - EDA Publishing Association
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7-9 October 2009, Leuven, Belgium<br />
using a compact model of the total physical structure of a<br />
packaged die, including heat spreader.<br />
II. FROM POWER DISTRIBUTION TO TEMPERATURE<br />
DISTRIBUTION<br />
Even when the power distribution across an SoC is<br />
accurately known, the temperature distribution can still be<br />
very different, depending on the thermal behaviour of the<br />
package and the thermal design of the application. This<br />
requires a reasonably accurate model that includes the<br />
thermal properties of the chip, the bonds, the package and<br />
the system. One way to achieve this is to use Compact<br />
Thermal Models (CTM), simple board simulation tools like<br />
COMIC and a Finite Elements (FE) program [1]. CTM’s are<br />
widely used for predicting the maximum junction<br />
temperatures. However, temperature gradients do not belong<br />
to its predicting capability. In order to get to know the<br />
temperature gradient across the die, first a CTM must be<br />
derived. Next the CTM will be used in combination with<br />
COMIC to predict the thermal behaviour of the product in a<br />
simplified application. One of the calculation results is the<br />
effective Heat Transfer Coefficient (HTC) which is working<br />
on the ‘thermal’ contacts of the package with the application<br />
PCB. Next, these HTC’s will be used as thermal boundary<br />
conditions in the FE program. Since the FE model of the<br />
package contains a detailed description of the floorplan of<br />
the IC an accurate prediction of the temperature can be<br />
achieved.<br />
The chip used for case study<br />
Many thermal simulations on integrated circuits are<br />
performed on complex and high-speed processors,<br />
consuming between 50W to a 100W [2, 3]. In [2], the total<br />
temperature variation across the chip at a maximum power<br />
consumption of P total =32.3W is: ΔT=31.3 0 C, with a<br />
minimum temperature of T min =106.1 0 C and a maximum of<br />
T max =137.4 0 C. This minimum and maximum temperature<br />
values, as well as the chip locations where these occur, are<br />
very much dependent on the floorplan of the chip and of the<br />
applied package.<br />
For our research, we use an advanced video and graphics<br />
processor chip used in very advanced digital TV sets. Figure<br />
1 shows the power distribution, based on the physical<br />
position of the processor, controller, memory and interface<br />
cores, when all cores are operating at maximum<br />
performance.<br />
low-performance interfaces<br />
low-performance interfaces<br />
U3<br />
0.8W<br />
U4<br />
0.515W<br />
U2<br />
0.294W 2.94W<br />
U8<br />
0.83W<br />
DDR interface<br />
U1<br />
1.11W<br />
U5<br />
0.21W U6<br />
0.26W<br />
low-performance interfaces<br />
U7<br />
2.02W<br />
Fig. 1. Original floorplan and power distribution during full operation of all<br />
IP cores.<br />
The die would be mounted into a HBGA 40 x 40 mm<br />
package, including a copper drop-in heat spreader. Figure 2<br />
shows a cross section of the total physical structure that has<br />
been included in the model for simulations.<br />
Fig. 2. Physical structure that has been included in the model for<br />
simulations.<br />
DDR interface<br />
Low-Performance<br />
interfaces<br />
Next, the above floorplan, together with the power<br />
numbers were also fed into the finite elements model and<br />
simulated. The goal of the simulations is twofold. First it is<br />
important to predict the overall temperature distribution<br />
across the die and check whether, at some local spot, it<br />
would exceed the maximum specified temperature of 125 0 C.<br />
Second, a large temperature variation may have severe<br />
©<strong>EDA</strong> <strong>Publishing</strong>/THERMINIC 2009 32<br />
ISBN: 978-2-35500-010-2