Superconducting Technology Assessment - nitrd
Superconducting Technology Assessment - nitrd
Superconducting Technology Assessment - nitrd
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Different sections of a large chip, as well as different chips, may have to operate asynchronously at 50 to 100 GHz<br />
clock frequencies and above. Clocks will have to be resynchronized at specific points in the circuit. Efficient methods<br />
to resynchronize and re-clock SFQ signals have been demonstrated.<br />
Clock frequencies of 50 to 100 GHz will be limited more by circuit microarchitecture, timing and jitter in timing,<br />
and inter-gate delays, than by intra-gate delay. The inter-gate delay can be reduced by smaller gates placed closer<br />
together. This will depend on both fabrication technology and size-efficient gate design. Timing jitter is reduced by<br />
ballistic SFQ signal propagation between gates via matched passive transmission lines (PTL), rather than by active<br />
transmission lines consisting of a string of SFQ pulse repeaters (referred to as a Josephson transmission line, JTL).<br />
Since the junction impedance increases proportional to J C, higher J C enables narrower stripline/microstripline at the<br />
same dielectric thickness, again increasing potential circuit density. Most improvement in both gate density and<br />
clock frequency can be achieved by adding superconducting wiring layers as discussed above.<br />
Jitter and timing errors and are probably the most insidious factors in reducing margins as the clock frequency<br />
increases. Jitter occurs in all active devices: gates, fan-out and fan-in, and the clock distribution network. It is<br />
caused by all noise sources that can modulate the switching time: thermal noise in resistors, external noise, noise<br />
in the clock (particularly when externally supplied), and disturbs from clock and signal distribution. Jitter impacts<br />
the margins of clocked gates more than asynchronous gates because clocked gates need to synchronize the arrival<br />
of data and clock. It can reduce margins at high clock frequencies and therefore limit the useful clock frequency.<br />
Circuits are frequently designed without careful consideration of these jitter/noise sources. Consequently, when<br />
migrating to large circuits, margins could shrink rapidly.<br />
Clock distribution is an important source of jitter if a large number of JTLs and splitters are used to propagate and<br />
distribute the clock. Every stage contributes jitter that accumulates as square-root of the number of stages. The<br />
use of PTLs instead of active JTLs will alleviate one source. However, splitters required to regenerate the clock<br />
remain a major source of jitter. A multi-line clock from a coherent clock array could reduce this jitter. Nevertheless,<br />
jitter will always be the ultimate limit on performance at high clock frequency.<br />
Timing errors in design can be fatal and will occur if rigorous timing analysis is not part of the circuit design<br />
methodology. Commercial tools such as VHDL are available, but have not been widely used. Because of jitter, precise<br />
timing cannot be ensured. So, timing-error tolerant design should be used in critical circuits. Several methods to<br />
ensure proper data/clock timing within a clock cycle that add minimal circuit overhead have been demonstrated.<br />
Other Noise Sources<br />
In addition to ubiquitous thermal noise, there is noise in all input/output lines, including power lines, which feed<br />
back into the SFQ circuits. Noise measurements of circuits operating at 4 K almost universally show elevated noise<br />
levels, with typical effective noise temperatures of ~40 K. The sources for such noise are magnetic field noise and<br />
noise introduced by lines connected to warm noise sources. Even if testing is performed in a shielded environment,<br />
every wire, cable, etc., from RT to 4 K serves as an antenna that pipes signals and noise into the 4 K circuit. It is<br />
essentially impossible to provide a DC to infrared filter even in shielded rooms. Moreover, the terminations of RT test<br />
equipment generate at least 300 K wideband noise. This needs to be filtered at low temperature, preferably at 4 K.<br />
One way to avoid some of the “antenna” noise is for all digital data lines to have a digital “optical isolator” that<br />
transmits only the desired bits and rejects all analog noise. Optical interconnects, under consideration for the<br />
wideband data links, could provide this added benefit. Even if optical interconnects are not used for the RT to 4 K<br />
data links, they should be considered as RFI isolators within the shielded cryostat environment at 300 K.<br />
Power lines are particularly susceptible to transmitting various noise signals. Because of the high currents, filtering<br />
at low temperature is more difficult. One concept is to bring power from RT to ~40 K as RF, filter the RF with a<br />
narrow-band high temperature superconductor filter, and convert the RF to DC at 40 K. This has several<br />
advantages, including power transmission at high voltage and low current to reduce ohmic heating and noise<br />
filtering. From ~ 40 K, one can use zero-resistance high temperature superconductor current leads to 4 K.<br />
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