Superconducting Technology Assessment - nitrd
Superconducting Technology Assessment - nitrd
Superconducting Technology Assessment - nitrd
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MRAM <strong>Technology</strong> Status<br />
FS-TMR MRAM<br />
60<br />
Table 3.2-7. COMPARISON OF FIELD SWITCHED TUNNELING MAGNETORESISTIVE<br />
AND SPIN MOMENTUM TRANSFER MRAM<br />
Field Switched Tunneling Magnetoresistive MRAM<br />
– Bit is based on tunneling through a thin insulator<br />
encased by two ferromagnetic films<br />
– Large current-write-pulse produces magnetic field<br />
that flips the polarization of one ferromagnetic film<br />
– Read by smaller current through the MTJ whose<br />
resistance depends on the relative polarization<br />
of the two magnetic films<br />
– Typical resistances are 10’s of kΩ, compatible<br />
with CMOS<br />
– Commercial pre-production at Freescale<br />
■ 4Mb FS-TMR MRAM chip, 1.55 µm 2 cell, 0.18 µm CMOS is in pre-production<br />
at Freescale Semiconductor.<br />
■ Write currents 1-10 mA, ~25 ns symmetric read-write cycle.<br />
■ Circuit architectures can be optimized for lower power, higher speed, or higher density.<br />
■ IBM has recently demonstrated a 128-kb, 6 ns access-time MRAM circuit.<br />
Spin Momentum Transfer MRAM<br />
– Bit is low resistance GMR metal<br />
– Bit magnetoresistance is changed by spin<br />
momentum transfer from write current<br />
directly into the film<br />
– Read by measuring the resistance of GMR film<br />
– Typical GMRs are 1 – 100W, compatible<br />
with RSFQ and favored for hard disc drives<br />
and magnetic sensors<br />
– Opportunity to monolithically integrate fast,<br />
low power RSFQ circuits with high speed,<br />
high density SMT MRAM operating at 4 K.