Xilinx Reliability Monitor Report - Quarter 4 CY 2001

Combined Started Lot:
Combined Completed Lots:
Jan. 1, 2002
P. 127
Failures:
Device on test:
Mean Test Hour s/Device:
Total Device Hours:
Reliability Testing Summary-Packages
Bias Moisture Life
Qualification & Monitor Combined
Technology:
Device Type:
Package Type:
Test Condition:
Si Gate CMOS
XC17XX/L, XC17XXXE, XC17SXX, XC17VXX
Various
T=85C, R.H.=85%
XC17XX/L XC17XXE XC17SXX XC17VXX
1
1
0
45
1,117
50,265
1
1
0
45
1,388
62,460
2
2
0
90
1,003
90,270
1
1
0
80
1,014
81,120
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