Xilinx Reliability Monitor Report - Quarter 4 CY 2001

Jan. 1, 2002
P.95
Combined Started Lot:
Combined Completed Lots:
Failures:
Device on test:
Mean Test Hours/Device:
Total Device Hours:
Reliability Testing Summary-Packages
Hast
Qualification & Monitor Combined
Technology:
Device Type:
Package Type:
Test Condition:
Si Gate CMOS
XCVXXX
PQFP-240, HQFP-240, FG-556
T = 130C, R.H. = 85%
XCV100 XCV300 XCV800 XCV1000 XCVXXX
1
1
0
22
100
2,200
2
2
0
44
148
6,500
1
1
0
24
100
2,400
1
1
0
22
100
2,200
9
9
0
193
139
26,900
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