Xilinx Reliability Monitor Report - Quarter 4 CY 2001

Jan. 1, 2002
P.51
Combined Started Lot:
Combined Completed Lots:
Failures:
Device on test:
Mean Test Hours/Device:
Total Device Hours:
Failure Analysis Number:
Reliability Testing Summary-Packages
Bias Moisture Life
Qualification & Monitor Combined
Technology:
Device Type:
Package Type:
Test Condition:
Si Gate CMOS
XC4XXXXLA
HQFP- 240, PQFP- 240
T = 85C, R.H. = 85%
XC4013XLA XC4028XLA XC4062XLA XC4XXXXLA
1
1
0
37
1,071
39,627
1
1
0
45
1,012
45,556
1
1
0
45
1,013
45,585
3
3
0
127
1,030
130,768
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