Xilinx Reliability Monitor Report - Quarter 4 CY 2001

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Combined Lots: Failures: Device on test: Actual device hours: Average Test Time : Equivalent device hours @ Tj=125C: Equivalent device hours @ Tj=55C: Equivalent device hours @ Tj=25C: Jan. 1, 2002 P.34 Reliability Testing Summary High Temperature Operating Life Qualification & Monitor Combined Technology: Device Type: Package Type: Actual Junction Temperature: Assumed Activation Energy: Confidence Level: XCS05XL XCS10XL XCS20XL 1 0 45 50,715 1,127 134,622 10,476,694 1.27E+08 0.25um Si Gate CMOS XCSXXXL Microcircuit Group PQFP-208, PLCC-84 145C 0.70 ev 60% 1 0 44 49,588 1,127 131,631 10,243,878 1.24E+08 1 0 42 42,000 1,000 111,488 8,676,351 1.05E+08 ®
Combined Lots: Failures: Device on test: Actual device hours: Average Test Time : Equivalent device hours @ Tj=125C: Equivalent device hours @ Tj=55C: Equivalent device hours @ Tj=25C: Jan. 1, 2002 P.35 Reliability Testing Summary High Temperature Operating Life Qualification & Monitor Combined Technology: Device Type: Package Type: Actual Junction Temperature: Assumed Activation Energy: Confidence Level: 0.25um Si Gate CMOS XCSXXXL PQFP-208, PLCC-84 145C 0.70 ev 60% XCS30XL XCS40XL XCSXXXL 1 0 42 43,050 1,025 114,276 8,893,260 1.08E+08 3 0 125 130,040 1,040 345,189 26,863,635 3.25E+08 Failure Rate (60% C.L.) in FITS @ Tj=55C: Failure Rate (60% C.L.) in FITS @ Tj=25C: 7 0 298 315,393 1,058 837,206 65,153,817 7.88E+08 14 1 ®
Page 1 and 2: Jan. 1, 2002 P. 1 The Reliability D
Page 3 and 4: Jan. 1, 2002 P. 3 TABLE OF CONTENTS
Page 5 and 6: Jan. 1, 2002 P. 5 2.1 Wafer Process
Page 7 and 8: Jan. 1, 2002 P. 7 2.3 Device Qualif
Page 9 and 10: Jan. 1, 2002 4. Failure Analysis: A
Page 11 and 12: Jan. 1, 2002 P. 11 F/A ACRONYM DESC
Page 13 and 14: Temperature (C o ) XILINX Typical C
Page 15 and 16: Jan. 1, 2002 P. 15 ESD and Latch-up
Page 17 and 18: (1) Measured on XC1765D (2) Measure
Page 19 and 20: Jan. 1, 2002 P.19 Failure Rate Summ
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Package Details Motherboard Design
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Package Motherboard Jan. 1, 2002 P
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Package Motherboard Jan. 1, 2002 P
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Xilinx Reliability Monitor Report - Quarter 4 CY 2001

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