Xilinx Reliability Monitor Report - Quarter 4 CY 2001

Jan. 1, 2002
P.68
Combined Started Lot:
Combined Completed Lots:
Failures:
Device on test:
Mean Test Hours/Device:
Total Device Hours:
Failure Analysis Number:
Reliability Testing Summary-Packages
Pressure Pot
Qualification & Monitor Combined
Technology:
Device Type:
Package Type:
Test Condition:
XCV100 XCV150 XCV200 XCV300
1
1
0
22
96
2,112
Si Gate CMOS
XCVXXX
FG-456, 556, 676, 680, BG-352, 560
HQFP-240, PQFP-240
T=121C; R.H.=100%
1
1
0
45
96
4,320
3
3
0
152
132
20,064
3
3
0
150
96
14,400
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