Xilinx Reliability Monitor Report - Quarter 4 CY 2001

Jan. 1, 2002
P.48
Combined Started Lot:
Combined Completed Lots:
Failures:
Device on test:
Mean Test Hours/Device:
Total Device Hours:
Failure Analysis Number:
Reliability Testing Summary-Packages
Bias Moisture Life
Qualification & Monitor Combined
Technology:
Device Type:
Package Type:
Test Condition:
Si Gate CMOS
XC4XXXE
VQFP-100, HQFP-240
T = 85C, R.H. = 85%
XC4005E XC4020E XC4XXXE
1
1
0
74
1,069
79,106
1
1
0
45
1,128
50,760
2
2
0
119
1,091
129,866
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