Xilinx Reliability Monitor Report - Quarter 4 CY 2001

Jan. 1, 2002
P.50
Combined Started Lot:
Combined Completed Lots:
Failures:
Device on test:
Mean Test Hours/Device:
Total Device Hours:
Failure Analysis Number:
Reliability Testing Summary-Packages
Bias Moisture Life
Qualification & Monitor Combined
Technology:
Device Type:
Package Type:
Test Condition:
Si Gate CMOS
XC4XXXXL
BGA-432, 560, PQFP-240, HT-144, PLCC-84
T = 85C, R.H. = 85%
XC4062XL XC4085XL XC4XXXXL
1
1
0
33
1,096
36,159
1
1
0
12
1,054
12,648
6
6
0
224
1,059
237,160
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