Xilinx Reliability Monitor Report - Quarter 4 CY 2001

Jan. 1, 2002
P. 137
Combined Started Lot:
Combined Completed Lots:
Failures:
Device on test:
Mean Test Hour s/Device:
Total Device Hours:
Reliability Testing Summary-Packages
Pressure Pot
Qualification & Monitor Combined
Technology:
Device Type:
Package Type:
Test Condition:
Si Gate CMOS
XC17SXX, XC18VXX, XC95XXX, XC95XXXXL
Various
T=121C, 100% R.H.
XC17SXX XC18VXX XC95XXX XC95XXXXL
2
2
0
89
96
8,544
2
2
0
118
141
16,584
31
31
0
1,775
132
235,008
2
2
0
117
121
14,184
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