Xilinx Reliability Monitor Report - Quarter 4 CY 2001

Combined Lots:
Failures:
Device on test:
Actual device hours:
Average Test Time :
Equivalent device hours @ Tj=125C:
Equivalent device hours @ Tj=55C:
Equivalent device hours @ Tj=25C:
Jan. 1, 2002
P.34
Reliability Testing Summary
High Temperature Operating Life
Qualification & Monitor Combined
Technology:
Device Type:
Package Type:
Actual Junction Temperature:
Assumed Activation Energy:
Confidence Level:
XCS05XL XCS10XL XCS20XL
1
0
45
50,715
1,127
134,622
10,476,694
1.27E+08
0.25um Si Gate CMOS
XCSXXXL Microcircuit Group
PQFP-208, PLCC-84
145C
0.70 ev
60%
1
0
44
49,588
1,127
131,631
10,243,878
1.24E+08
1
0
42
42,000
1,000
111,488
8,676,351
1.05E+08
®