Xilinx Reliability Monitor Report - Quarter 4 CY 2001

Combined Lots:
Failures:
Device on test:
Actual device hours:
Average Test Time :
Equivalent device hours @ Tj=125C:
Equivalent device hours @ Tj=55C:
Equivalent device hours @ Tj=25C:
Jan. 1, 2002
P.31
Reliability Testing Summary
High Temperature Operating Life
Qualification & Monitor Combined
Technology:
Device Type:
Package Type:
Actual Junction Temperature:
Assumed Activation Energy:
confidence Level:
XC4013XLA XC4020XLA XC4044XLA
1
0
41
42,272
1,042
113,405
8,825,501
1.07E+08
0.25um Si Gate CMOS
XC4XXXXLA
PQFP-240, HQFP-240
145C
0.70 ev
60%
1
0
41
41,082
1,002
109,052
8,486,711
1.03E+08
2
0
90
54,384
604
114,362
11,234,635
1.36E+08
®