Xilinx Reliability Monitor Report - Quarter 4 CY 2001

Jan. 1, 2002
P. 142
Combined Started Lot:
Combined Completed Lots:
Failures:
Device on test:
Mean Test Hour s/Device:
Total Device Hours:
Failure Analysis Number:
Reliability Testing Summary-Packages
Pressure Pot
Qualification & Monitor Combined
Technology:
Device Type:
Package Type:
Test Condition:
Si Gate CMOS
XC18VXX Microcircuit Group
SOIC-20
T = 121C, 100% R.H.
XC18V01 XC18VXX
2
2
0
118
141
16,584
2
2
0
118
141
16,584
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