Bulletin 2009/07 - European Patent Office
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Bulletin 2009/07 - European Patent Office

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(G01N) I.1(2)<br />

(74) Wilhelms · Kilian & Partner <strong>Patent</strong>anwälte,<br />

Eduard-Schmid-Strasse 2, 81541 München,<br />

DE<br />

(51) G01N 21/35 (11) 2 023 124 A2<br />

(25) En (26) En<br />

(21) 08014345.6 (22) 26.08.2005<br />

(84) AT BE BG CH CY CZ DE DK EE ES FI FR GB<br />

GR HU IE IS IT LI LT LU LV MC NL PL PT RO<br />

SE SI SK TR<br />

(30) 26.08.2004 GB 0419098<br />

(54) • Reduzierung der streuungsbedingten Einflüsse<br />

in der Terahertz-time-domain-<br />

Spektroskopie durch Verwendung einer<br />

diffusen Einstrahlung<br />

• Reducing scattering related features in<br />

terahertz time domain spectroscopy by<br />

using a diffuse irradiating beam<br />

• Réduction de caractéristiques liées à la<br />

diffusion optique dans la spectroscopie à<br />

domaine temporel térahertzien par une<br />

irradiation diffuse<br />

(71) Teraview Limited, Platinum Building St.<br />

John's Innovation Park, Cambridge, Cambridgeshire<br />

CB4 0WS, GB<br />

(72) Taday, Philip, Francis, Cambridgeshire, GB<br />

Shen, Yao-chun, Cambridgeshire, GB<br />

(74) Granleese, Rhian Jane, Marks & Clerk 90<br />

Long Acre, London WC2E 9RA, GB<br />

(62) 05775318.8 / 1 792 165<br />

G01N 21/35 → (51) G01J 3/32<br />

G01N 21/35 → (51) G01N 21/15<br />

(51) G01N 21/53 (11) 2 023 125 A1<br />

B60Q 1/00<br />

(25) Fr (26) Fr<br />

(21) 0816<strong>07</strong>25.1 (22) 18.<strong>07</strong>.2008<br />

(84) AT BE BG CH CY CZ DE DK EE ES FI FR GB<br />

GR HR HU IE IS IT LI LT LU LV MC MT NL<br />

NO PL PT RO SE SI SK TR<br />

AL BA MK RS<br />

(30) 03.08.20<strong>07</strong> FR <strong>07</strong>05713<br />

(54) • Verfahren zur Erfassung eines Wasserschauers<br />

hinter einem Kraftfahrzeug<br />

• Method of detecting a spray of water to the<br />

rear of a vehicle<br />

• Procédé de détection d'une gerbe d'eau à<br />

l'arrière d'un véhicule<br />

(71) VALEO VISION, 34, Rue Saint André, 93012<br />

Bobigny, FR<br />

(72) Robert, Caroline, 75011, PARIS, FR<br />

Leleve, Joël, 93800, EPINAY SUR SEINE, FR<br />

Hue, David, 78400, CHATOU, FR<br />

(51) G01N 21/57 (11) 2 023 126 A1<br />

G01N 21/86 G01N 33/34<br />

D21G 9/00<br />

(25) En (26) En<br />

(21) 08157938.5 (22) 10.06.2008<br />

(84) AT BE BG CH CY CZ DE DK EE ES FI FR GB<br />

GR HR HU IE IS IT LI LT LU LV MC MT NL<br />

NO PL PT RO SE SI SK TR<br />

AL BA MK RS<br />

(30) 27.<strong>07</strong>.20<strong>07</strong> US 829431<br />

(54) • Glanzsensor für eine Papiermaschine<br />

• Gloss sensor for a paper machine<br />

• Capteur de brillant pour une machine à<br />

papier<br />

(71) Voith <strong>Patent</strong> GmbH, Sankt Pöltener Strasse<br />

43, 89522 Heidenheim, DE<br />

(72) Typpo, Pekka, Cupertino, CA 95014, US<br />

G01N 21/64 → (51) G01N 21/78<br />

G01N 21/75 → (51) C12N 9/04<br />

Europäisches <strong>Patent</strong>blatt<br />

<strong>European</strong> <strong>Patent</strong> <strong>Bulletin</strong><br />

<strong>Bulletin</strong> européen des brevets<br />

(51) G01N 21/78 (11) 2 023 127 A1<br />

C12M 1/00 C12Q 1/02<br />

G03B 15/00 H04N 5/225<br />

G01N 21/64 G01N 33/483<br />

(25) Ja (26) En<br />

(21) <strong>07</strong>744527.8 (22) 31.05.20<strong>07</strong><br />

(84) AT BE BG CH CY CZ DE DK EE ES FI FR GB<br />

GR HU IE IS IT LI LT LU LV MC MT NL PL PT<br />

RO SE SI SK TR<br />

AL BA HR MK RS<br />

(86) JP 20<strong>07</strong>/061139 31.05.20<strong>07</strong><br />

(87) WO 20<strong>07</strong>/139201 20<strong>07</strong>/49 06.12.20<strong>07</strong><br />

(30) 31.05.2006 JP 2006152676<br />

28.03.20<strong>07</strong> JP 20<strong>07</strong>084914<br />

(54) • ORGANISMUSPRÄPARAT-ABBILDUNGS-<br />

VERFAHREN UND ORGANISMUSPRÄPA-<br />

RAT-ABBILDUNGSVORRICHTUNG<br />

• ORGANISM SPECIMEN IMAGING METHOD<br />

AND ORGANISM SPECIMEN IMAGING<br />

DEVICE<br />

• PROCEDE ET DISPOSITIF D'IMAGERIE<br />

D'UN ORGANISME ECHANTILLON<br />

(71) Olympus Corporation, 43-2, Hatagaya 2chome<br />

Shibuya-ku, Tokyo 151-0<strong>07</strong>2, JP<br />

(72) NAMBA, Akihiro, Shibuya-ku, Tokyo<br />

1510<strong>07</strong>2, JP<br />

SUZUKI, Hirobumi, Shibuya-ku, Tokyo<br />

1510<strong>07</strong>2, JP<br />

(74) von Hellfeld, Axel, et al, Wuesthoff &<br />

Wuesthoff <strong>Patent</strong>- und Rechtsanwälte<br />

Schweigerstrasse 2, 81541 München, DE<br />

G01N 21/78 → (51) C<strong>07</strong>F 5/02<br />

G01N 21/86 → (51) G01N 21/57<br />

G01N 21/952 → (51) A24C 5/34<br />

(51) G01N 21/954 (11) 2 023 128 A1<br />

(25) Ja (26) En<br />

(21) <strong>07</strong>743475.1 (22) 16.05.20<strong>07</strong><br />

(84) AT BE BG CH CY CZ DE DK EE ES FI FR GB<br />

GR HU IE IS IT LI LT LU LV MC MT NL PL PT<br />

RO SE SI SK TR<br />

AL BA HR MK RS<br />

(86) JP 20<strong>07</strong>/060040 16.05.20<strong>07</strong><br />

(87) WO 20<strong>07</strong>/135914 20<strong>07</strong>/48 29.11.20<strong>07</strong><br />

(30) 23.05.2006 JP 2006143034<br />

23.05.2006 JP 2006143399<br />

(54) • INSPEKTIONSKOPFTRÄGERSTRUKTUR IN<br />

OBERFLÄCHENINSPEKTIONSVORRICH-<br />

TUNG SOWIE OBERFLÄCHENINSPEK-<br />

TIONSVORRICHTUNG<br />

• INSPECTION HEAD SUPPORTING STRUC-<br />

TURE IN SURFACE INSPECTING APPAR-<br />

ATUS, AND SURFACE INSPECTING<br />

APPARATUS<br />

• STRUCTURE DE SUPPORT DE TÊTE<br />

D'INSPECTION DANS UN APPAREIL<br />

D'INSPECTION DE SURFACE, ET APPA-<br />

REIL D'INSPECTION DE SURFACE<br />

(71) Kirin Techno-System Company, Limited, 17-<br />

1, Namamugi 1-chome Tsurumi-ku, Yokohama-shi<br />

Kanagawa 230-0052, JP<br />

KTS Optics Corporation, 17-1, Namamugi 1chome<br />

Tsurumi-ku, Yokohama-shi, Kanagawa<br />

230-0052, JP<br />

(72) HORIUCHI, Kazuhiro, Yokohama-shi, Kanagawa<br />

230-0052, JP<br />

ARITO, Tatsunari, Yokohama-shi, Kanagawa<br />

230-0052, JP<br />

(74) HOFFMANN EITLE, <strong>Patent</strong>- und Rechtsanwälte<br />

Arabellastrasse 4, 81925 München, DE<br />

(51) G01N 21/954 (11) 2 023 129 A1<br />

(25) Ja (26) En<br />

(21) <strong>07</strong>743476.9 (22) 16.05.20<strong>07</strong><br />

315<br />

Anmeldungen<br />

Applications<br />

Demandes (<strong>07</strong>/<strong>2009</strong>) 11.02.<strong>2009</strong><br />

(84) AT BE BG CH CY CZ DE DK EE ES FI FR GB<br />

GR HU IE IS IT LI LT LU LV MC MT NL PL PT<br />

RO SE SI SK TR<br />

AL BA HR MK RS<br />

(86) JP 20<strong>07</strong>/060041 16.05.20<strong>07</strong><br />

(87) WO 20<strong>07</strong>/135915 20<strong>07</strong>/48 29.11.20<strong>07</strong><br />

(30) 23.05.2006 JP 2006143181<br />

25.09.2006 JP 2006258263<br />

(54) • OBERFLÄCHENUNTERSUCHUNGSVOR-<br />

RICHTUNG<br />

• SURFACE EXAMINING DEVICE<br />

• DISPOSITIF D'EXAMEN DE SURFACE<br />

(71) Kirin Techno-System Company, Limited, 17-<br />

1, Namamugi 1-chome Tsurumi-ku, Yokohama-shi<br />

Kanagawa 230-0052, JP<br />

(72) FUKAMI, Yukiko, Yokohama-shi, Kanagawa<br />

230-0052, JP<br />

(74) HOFFMANN EITLE, <strong>Patent</strong>- und Rechtsanwälte<br />

Arabellastrasse 4, 81925 München, DE<br />

(51) G01N 21/956 (11) 2 023 130 A1<br />

H01L 21/66<br />

(25) Ja (26) En<br />

(21) <strong>07</strong>742906.6 (22) <strong>07</strong>.05.20<strong>07</strong><br />

(84) AT BE BG CH CY CZ DE DK EE ES FI FR GB<br />

GR HU IE IS IT LI LT LU LV MC MT NL PL PT<br />

RO SE SI SK TR<br />

AL BA HR MK RS<br />

(86) JP 20<strong>07</strong>/059471 <strong>07</strong>.05.20<strong>07</strong><br />

(87) WO 20<strong>07</strong>/129691 20<strong>07</strong>/46 15.11.20<strong>07</strong><br />

(30) 09.05.2006 JP 2006129894<br />

09.05.2006 JP 2006129895<br />

(54) • ENDABSCHNITT-INSPEKTIONSVORRICH-<br />

TUNG<br />

• END SECTION INSPECTING APPARATUS<br />

• APPAREIL DE CONTRÔLE DE PARTIE<br />

D'EXTRÉMITÉ<br />

(71) Nikon Corporation, 2-3, Marunouchi 3chome,<br />

Chiyoda-ku, Tokyo 100-8331, JP<br />

(72) SAKAGUCHI, Naoshi, Tokyo 100-8331, JP<br />

(74) Walaski, Jan Filip, et al, Venner Shipley LLP<br />

20 Little Britain, London EC1A 7DH, GB<br />

G01N 21/956 → (51) H01L 31/042<br />

(51) G01N 25/72 (11) 2 023 131 A1<br />

(25) De (26) De<br />

(21) <strong>07</strong>015631.0 (22) 08.08.20<strong>07</strong><br />

(84) AT BE BG CH CY CZ DE DK EE ES FI FR GB<br />

GR HU IE IS IT LI LT LU LV MC MT NL PL PT<br />

RO SE SI SK TR<br />

AL BA HR MK RS<br />

(54) • Verfahren und Vorrichtung zur zerstörungsfreien<br />

Prüfung eines Objektes, das<br />

Materialanteile enthält, die magnetisch und<br />

elektrisch leitend sind<br />

• Method and device for interference-free<br />

testing of an object containing material<br />

fractions which are magnetic and conductive<br />

• Procédé et dispositif destinés à la vérification<br />

sans destruction d'un objet contenant<br />

des parties de matériel magnétiques et<br />

électriques<br />

(71) Fraunhofer-Gesellschaft zur Förderung der<br />

angewandten Forschung e.V., Hansastrasse<br />

27c, 80686 München, DE<br />

(72) Netzelmann, Udo, Dr., 66113 Saarbrücken,<br />

DE<br />

Walle, Günter, 66399 Mandelbachtal, DE<br />

Strauss, Holger, 66802 Altforweiler, DE<br />

(74) Rösler, Uwe, Rösler <strong>Patent</strong>anwaltskanzlei<br />

Landsberger Strasse 480a, 81241 München,<br />

DE<br />

G01N 27/02 → (51) G01N 17/04

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