Bulletin 2009/07 - European Patent Office
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Bulletin 2009/07 - European Patent Office

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(H01L) I.1(2)<br />

(72) SHIBAYAMA, Katsumi, Hamamatsu-shi, Shizuoka<br />

435-8558, JP<br />

(74) Frost, Alex John, Boult Wade Tennant<br />

Verulam Gardens 70 Gray's Inn Road,<br />

London WC1X 8BT, GB<br />

H01L 31/02 → (51) G02B 6/122<br />

H01L 31/032 → (51) H01L 31/04<br />

(51) H01L 31/0352 (11) 2 023 398 A2<br />

(25) En (26) En<br />

(21) 08019935.9 (22) 09.09.2004<br />

(84) DE FR GB<br />

(30) 09.09.2003 JP 2003316281<br />

(54) • Infrarotsensor-IC und Infrarotsensor und<br />

Herstellungsverfahren dafür<br />

• Infrared sensor IC, and infrared sensor and<br />

manufacturing method thereof<br />

• Circuit imprimé à capteur à infrarouges, et<br />

capteur à infrarouges et son procédé de<br />

fabrication<br />

(71) Asahi Kasei EMD Corporation, 23-7, Nishishinjuku<br />

1-chome, Shinjuku-ku, Tokyo 160-<br />

0023, JP<br />

(72) Ueno, Koichiro, Tokyo 101-8101, JP<br />

Kuze, Naohiro, Tokyo 101-8101, JP<br />

Moriyasu, Yoshitaka, Tokyo 101-8101, JP<br />

Nagase, Kazuhiro, Tokyo 101-8101, JP<br />

(74) Kramer - Barske - Schmidtchen, <strong>European</strong><br />

<strong>Patent</strong> Attorneys Landsberger Strasse 300,<br />

80687 München, DE<br />

(62) 04787821.0 / 1 667 239<br />

(51) H01L 31/0352 (11) 2 023 399 A2<br />

G01J 1/42<br />

(25) En (26) En<br />

(21) 08167724.7 (22) 02.09.2003<br />

(84) AT BE BG CH CY CZ DE DK EE ES FI FR GB<br />

GR HU IE IT LI LU MC NL PT RO SE SI SK<br />

TR<br />

AL LT LV MK<br />

(54) • Ein durch einen Strom aus Majoritätsträgern<br />

unterstützter Detektor für elektromagnetische<br />

Strahlung<br />

• Detector for electromagnetic radiation<br />

assisted by majority current<br />

• Détecteur de rayonnement électromagnétique<br />

assisté par un courant de porteurs<br />

majoritaires<br />

(71) Vrije Universiteit Brussel, Pleinlaan 2, 1050<br />

Brussel, BE<br />

(72) Kuijk, Maarten, 2600, Berchem-Antwerpen,<br />

BE<br />

Van Nieuwenhove, Daniel, 1981, Hofstade,<br />

BE<br />

(74) Bird, William Edward, Bird Goën & Co. Klein<br />

Dalenstraat 42A, 3020 Winksele, BE<br />

(62) 03<strong>07</strong>7744.5 / 1 513 202<br />

(51) H01L 31/04 (11) 2 023 400 A1<br />

H01L 31/032<br />

(25) Ja (26) En<br />

(21) <strong>07</strong>740431.7 (22) 29.03.20<strong>07</strong><br />

(84) AT BE BG CH CY CZ DE DK EE ES FI FR GB<br />

GR HU IE IS IT LI LT LU LV MC MT NL PL PT<br />

RO SE SI SK TR<br />

AL BA HR MK RS<br />

(86) JP 20<strong>07</strong>/056993 29.03.20<strong>07</strong><br />

(87) WO 20<strong>07</strong>/129512 20<strong>07</strong>/46 15.11.20<strong>07</strong><br />

(30) 01.05.2006 JP 2006127193<br />

(54) • VERBESSERTE DAUERHAFTIGKEITS-<br />

PRÜFMETHODE EINES AUF CIS BASIER-<br />

ENDEN DÜNNFILM-<br />

SOLARZELLENMODULS<br />

• IMPROVED DURABILITY TEST METHOD<br />

OF CIS BASED THIN FILM SOLAR CELL<br />

MODULE<br />

Europäisches <strong>Patent</strong>blatt<br />

<strong>European</strong> <strong>Patent</strong> <strong>Bulletin</strong><br />

<strong>Bulletin</strong> européen des brevets<br />

• PROCEDE DE TEST DE DURABILITE<br />

AMELIORE D'UN MODULE A CELLULE<br />

PHOTOVOLTAIQUE A FILM MINCE REPO-<br />

SANT SUR CIS<br />

(71) Showa Shell Sekiyu Kabushiki Kaisha, 2-3-2<br />

Daiba, Minato-ku Tokyo 135-8<strong>07</strong>4, JP<br />

(72) KUSHIYA, Katsumi c/o Showa Shell Sekiyu<br />

K. K., Tokyo 135-8<strong>07</strong>4, JP<br />

KURIYAGAWA, Satoru c/o Showa Shell<br />

Sekiyu K. K., Tokyo 135-8<strong>07</strong>4, JP<br />

(74) HOFFMANN EITLE, <strong>Patent</strong>- und Rechtsanwälte<br />

Arabellastrasse 4, 81925 München, DE<br />

H01L 31/04 → (51) H01M 14/00<br />

(51) H01L 31/042 (11) 2 023 401 A1<br />

G01M 11/00 G01N 21/956<br />

(25) Ja (26) En<br />

(21) <strong>07</strong>741706.1 (22) 16.04.20<strong>07</strong><br />

(84) AT BE BG CH CY CZ DE DK EE ES FI FR GB<br />

GR HU IE IS IT LI LT LU LV MC MT NL PL PT<br />

RO SE SI SK TR<br />

AL BA HR MK RS<br />

(86) JP 20<strong>07</strong>/058270 16.04.20<strong>07</strong><br />

(87) WO 20<strong>07</strong>/125778 20<strong>07</strong>/45 08.11.20<strong>07</strong><br />

(30) 28.04.2006 JP 2006126849<br />

31.05.2006 JP 2006152228<br />

(54) • SOLARBATTERIEMODUL-BEWERTUNGS-<br />

EINRICHTUNG, SOLARBATTERIEMODUL-<br />

BEWERTUNGSVERFAHREN UND SOLAR-<br />

BATTERIEMODUL-HERSTELLUNGSVER-<br />

FAHREN<br />

• SOLAR BATTERY MODULE EVALUATION<br />

DEVICE, SOLAR BATTERY MODULE<br />

EVALUATING METHOD, AND SOLAR BAT-<br />

TERY MODULE MANUFACTURING<br />

METHOD<br />

• DISPOSITIF D'EVALUATION DE MODULES<br />

DE PILES SOLAIRES, PROCEDE D'EVA-<br />

LUATION DE MODULES DE PILES SOLAI-<br />

RES, ET PROCEDE DE FABRICATION DE<br />

MODULES DE PILES SOLAIRES<br />

(71) Sharp Kabushiki Kaisha, 22-22, Nagaike-cho<br />

Abeno-ku, Osaka-shi, Osaka 545-8522, JP<br />

(72) HARADA, Takashi, Nara 639-2122, JP<br />

OHBASAMI, Masahiro, Nara 639-0252, JP<br />

UMETANI, Yoshinobu, Nara 635-0055, JP<br />

KATAYAMA, Yoshio, Hiroshima 739-0144,<br />

JP<br />

TANIGAMI, Takuji, Nara 634-0042, JP<br />

(74) Müller - Hoffmann & Partner, <strong>Patent</strong>anwälte<br />

Innere Wiener Strasse 17, 81667 München,<br />

DE<br />

(51) H01L 31/042 (11) 2 023 402 A1<br />

F24J 2/52 E04D 13/18<br />

(25) Fr (26) Fr<br />

(21) 08305425.4 (22) 28.<strong>07</strong>.2008<br />

(84) AT BE BG CH CY CZ DE DK EE ES FI FR GB<br />

GR HR HU IE IS IT LI LT LU LV MC MT NL<br />

NO PL PT RO SE SI SK TR<br />

AL BA MK RS<br />

(30) 01.08.20<strong>07</strong> FR <strong>07</strong>05622<br />

(54) • Profil und Montagevorrichtung für Photovoltaikpaneele<br />

in eine Gebäudestruktur,<br />

insbesondere in ein Dach, und diese<br />

Elemente integrierende Gebäudestruktur<br />

• Profile and device for assembling photovoltaic<br />

panels within a building structure,<br />

and in particular a roof, and building<br />

structure integrating these elements<br />

• Profilé et dispositif de montage de panneaux<br />

photovoltaïques au sein d'une<br />

structure de bâtiment, et notamment d'une<br />

toiture, et structure de bâtiment intégrant<br />

ces éléments<br />

(71) Tenesol, 12/14 Allée du Levant Parc d'Activités,<br />

69890 La Tour de Salvagny, FR<br />

348<br />

Anmeldungen<br />

Applications<br />

Demandes (<strong>07</strong>/<strong>2009</strong>) 11.02.<strong>2009</strong><br />

(72) Olivier, Guy, 69270, SAINT GENIS LES<br />

OLLIERES, FR<br />

Maureau, Stéphane, 69001, LYON, FR<br />

(74) Vuillermoz, Bruno, et al, Cabinet Laurent &<br />

Charras "Le Contemporain" 50, Chemin de la<br />

Bruyère, 69574 Dardilly Cédex, FR<br />

H01L 31/048 → (51) F24J 2/52<br />

H01L 31/<strong>07</strong>5 → (51) H01L 27/142<br />

(51) H01L 31/10 (11) 2 023 403 A1<br />

(25) Ja (26) En<br />

(21) 06756548.1 (22) 24.05.2006<br />

(84) AT BE BG CH CY CZ DE DK EE ES FI FR GB<br />

GR HU IE IS IT LI LT LU LV MC NL PL PT RO<br />

SE SI SK TR<br />

AL BA HR MK YU<br />

(86) JP 2006/310342 24.05.2006<br />

(87) WO 20<strong>07</strong>/135739 20<strong>07</strong>/48 29.11.20<strong>07</strong><br />

(54) • ULTRAVIOLETT-PHOTOSENSOR<br />

• ULTRAVIOLET PHOTOSENSOR<br />

• PHOTOCAPTEUR D'ULTRAVIOLETS<br />

(71) Meijo University, 1-501, Shiogamaguchi,<br />

Tempaku-ku, Nagoya-shi, Aichi 4688-502,<br />

JP<br />

(72) IWAYA, Motoaki, Inazawa-shi Aichi 495-<br />

0014, JP<br />

KAMIYAMA, Satoshi, Nagoya-shi Aichi 468-<br />

0004, JP<br />

AMANO, Hiroshi, Nagoya-shi Aichi 465-<br />

0011, JP<br />

AKASAKI, Isamu, Nagoya-shi Aichi 451-<br />

0061, JP<br />

(74) von Hellfeld, Axel, Wuesthoff & Wuesthoff<br />

<strong>Patent</strong>- und Rechtsanwälte Schweigerstrasse<br />

2, 81541 München, DE<br />

(51) H01L 31/10 (11) 2 023 404 A1<br />

H01L 27/14 H01L 27/06<br />

H01L 21/8222<br />

(25) Ja (26) En<br />

(21) <strong>07</strong>740858.1 (22) 03.04.20<strong>07</strong><br />

(84) AT BE BG CH CY CZ DE DK EE ES FI FR GB<br />

GR HU IE IS IT LI LT LU LV MC MT NL PL PT<br />

RO SE SI SK TR<br />

AL BA HR MK RS<br />

(86) JP 20<strong>07</strong>/057422 03.04.20<strong>07</strong><br />

(87) WO 20<strong>07</strong>/135809 20<strong>07</strong>/48 29.11.20<strong>07</strong><br />

(30) 24.05.2006 JP 2006143986<br />

(54) • OPTISCHE HALBLEITERANORDNUNG UND<br />

HERSTELLUNGSVERFAHREN DAFÜR<br />

• OPTICAL SEMICONDUCTOR DEVICE AND<br />

METHOD FOR MANUFACTURING SAME<br />

• DISPOSITIF SEMI-CONDUCTEUR OPTIQUE<br />

ET PROCÉDÉ DE FABRICATION DE CELUI-<br />

CI<br />

(71) Panasonic Corporation, 1006, Oaza Kadoma,<br />

Kadoma-shi Osaka 571-8501, JP<br />

(72) IWAI, Takaki c/o Panasonic Corporation Ip<br />

Development Center, Chou-ku, Osaka-shi,<br />

Osaka 540-62<strong>07</strong>, JP<br />

(74) TER MEER - STEINMEISTER & PARTNER<br />

GbR, <strong>Patent</strong>anwälte Mauerkircherstrasse 45,<br />

81679 München, DE<br />

(51) H01L 31/10 (11) 2 023 405 A1<br />

H01L 27/14 H01L 27/06<br />

H01L 21/8222<br />

(25) Ja (26) En<br />

(21) <strong>07</strong>740859.9 (22) 03.04.20<strong>07</strong><br />

(84) AT BE BG CH CY CZ DE DK EE ES FI FR GB<br />

GR HU IE IS IT LI LT LU LV MC MT NL PL PT<br />

RO SE SI SK TR<br />

AL BA HR MK RS<br />

(86) JP 20<strong>07</strong>/057423 03.04.20<strong>07</strong><br />

(87) WO 20<strong>07</strong>/135810 20<strong>07</strong>/48 29.11.20<strong>07</strong>

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