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Tabal.1
Combinational fault logic test code of FCC unit
Fig x 1 x 2 x 3 x 4
Fig.2(a)
s-a-0
fault
{0,1,0},{0,0,0},{0,0,1} {1,0,0},{0,0,1},{0,0,0} {1,0,0},{0,1,0},{0,0,0}
s-a-1
fault
{1,1,0},{1,0,0},{1,0,1} {1,1,0},{0,1,1},{0,1,0} {1,0,1},{0,1,1},{0,0,1}
Fig.2(b)
s-a-0
fault
{0,0,0,1},{0,0,1,0},{0,0,0,0} {0,0,0,1},{0,0,1,0},{0,0,0,0} {0,0,0,1} {0,0,1,0}
s-a-1
fault
{1,0,0,1},{1,0,1,0},{1,0,0,0} {0,1,0,1},{0,1,1,0},{0,1,0,0} {0,0,1,1} {0,0,1,1}
Fig.2(c)
s-a-0
fault
{0,1,0} {1,0,0} {0,1,0},{0,0,0}{1,0,0},{1,1,0}
s-a-1
fault
{1,1,0} {1,1,0} {0,1,1},{0,0,1},{1,0,1},{1,1,1}
then
df ( X )
x
28
= ( x10
x11
+ x10
x12
+ x11x12
) x13
x14
dx28
df ( X)
x
28
= ( x10
+ x11)(
x10
+ x12)(
x11
+ x12)
x13
x14
dx28
Similarly, we have
df ( X )
x
29
= ( x14
x15
+ x14
x16
+ x15x16
) x17
x24
dx29
df ( X)
x
29
= ( x14
+ x15)(
x14
+ x16)(
x15
+ x16)
x17
x24
dx29
df ( X )
x
30
= x30
x20
x25
dx30
df ( X )
x
30
= x30
x20
x25
dx30
df ( X )
x
31
= x31
x23
x24
x25
dx31
df ( X )
x
31
= x31
x23
x24
x25
dx31
So that the combinational fault test codes of DDS
may be computede which are not listed in this paper
becaose of too numerous.
IV. CONCLUSION
(1) The method of fault test codes for identification DDS
failures are proposed and be applied in an examples;
(2) The results indicate that
a) According to the property of the Boolean difference,
the codes are available to fined DDS failures;
b) In order to identification of DDS failure it is
necessary to properly design the combinational logic unit
for ensure it has the fault test codes;
c) If the DDS failure that had been judged to be
identification, the fault test codes should always be used
in input of DDS timely to implement self fault test so that
its failure may be able to find. Through such means the
DDS functions of monitor the production status, prevent
and control the potential risk should be achieved correctly.
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