Dissertation

[92] Ambacher, Oliver, „Growth and applications of Group III-nitrides”, Journal
of Physics D: Applied Physics 31, 2653 (1998). 5.2
[93] J. Dorsaz, J.-F. Carlin, S. Gradecak und M. Ilegems, „Progress in AlInN–
GaN Bragg reflectors: Application to a microcavity light emitting diode”,
J. Appl. Phys. 97, 084505 (2005). 5.2
[94] O. Ambacher, B. Foutz, J. Smart, J. R. Shealy, N. G. Weimann, K. Chu,
M. Murphy, A. J. Sierakowski, W. J. Schaff, L. F. Eastman, R. Dimitrov,
A. Mitchell und M. Stutzmann, „Two dimensional electron gases induced
by spontaneous and piezoelectric polarization in undoped and doped Al-
GaN/GaN heterostructures”, J. Appl. Phys. 87, 334 (2000). 5.2
[95] H. Hirayama, „Quaternary InAlGaN-based high-efficiency ultraviolet lightemitting
diodes”, J. Appl. Phys. 97, 091101 (2005). 5.2
[96] G. Steinhoff, M. Hermann, W. J. Schaff, L. F. Eastman, M. Stutzmann
und M. Eickhoff, „pH response of GaN surfaces and its application for pHsensitive
field-effect transistors”, Applied Physics Letters 83, 177 (2003).
5.2
[97] I. Cimalla, F. Will, K. Tonisch, M. Niebelschütz, V. Cimalla, V. Lebedev,
G. Kittler, M. Himmerlich, S. Krischok, J. A. Schaefer, M. Gebinoga, A.
Schober, T. Friedrich und O. Ambacher, „AlGaN/GaN biosensor—effect
of device processing steps on the surface properties and biocompatibility”,
Sens. Actuators B 123, 740–748 (2007). 5.2
[98] J. Jahns und S. J. Walker, „Imaging with planar optical systems”, Opt.
Commun. 76, 313–317 (1990). 5.2
[99] M. Testorf und J. Jahns, „Imaging properties of planar-integrated microoptics”,
J. Opt. Soc. Am. A 16, 1175–1183 (1999). 5.2
[100] V. Lebedev, V. Cimalla, T. Baumann, O. Ambacher, F. M. Morales, J. G.
Lozano und D. González., „Effect of dislocations on electrical and electron
transport properties of InN thin films. II. Density and mobility of the carriers”,
J. Appl. Phys. 100, 094903 (2006). 5.2
[101] K. Tonisch, V. Cimalla, C. Foerster, H. Romanus, O. Ambacher und D.
Dontsov, „Piezoelectric properties of polycrystalline AlN thin films for
MEMS application”, Sens. Actuators A 132, 658–663 (2006). 5.2
[102] M. Hofmann, X. Ma, J. Schneider und S. Sinzinger, „Highly integrated
optical microsystem for particle concentration measurement”, Proc. SPIE
7716, 77160T (2010). 5.3.1, 5.3.4, 5.4.1.2
151