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Molecular beam epitaxial growth of III-V semiconductor ... - KOBRA

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Chapter 6<br />

MBE Growth <strong>of</strong> InAs and InGaAs<br />

Quantum Dots Embedded in GaAs<br />

Matrix<br />

6.1 Overview<br />

The hetro<strong>epitaxial</strong> <strong>growth</strong> <strong>of</strong> GaAs on Si has been investigated to provide heterogeneous<br />

substrates including both Si and <strong>III</strong>-V <strong>semiconductor</strong> layers [91, 92, 93].<br />

In this chapter, new approaches or methods to integrate GaAs with silicon substrate<br />

will be investigated. The rst approach is basically based on self-assembled<br />

eects <strong>of</strong> MBE <strong>growth</strong> <strong>of</strong> InAs QDs on the top <strong>of</strong> GaAs islands using islands mechanism<br />

<strong>growth</strong> on at silicon substrate. The advantage to use GaAs as barrier prior<br />

to InAs quantum dots <strong>growth</strong> is the reduced lattice mismatch <strong>of</strong> ∼ 7% compared<br />

to Si matrix <strong>of</strong> about ∼ 11%. Moreover, this approach provide also the possibility<br />

to increase the distance between the Si/InAs interface by a GaAs spacer layer,<br />

and gradually reducing the strain energy prior to the active layer <strong>growth</strong>. A further<br />

approach is based mainly on the <strong>growth</strong> <strong>of</strong> GaAs/InGaAs/GaAs structure<br />

on pre-patterned Si substrates. However, the hetro<strong>epitaxial</strong> <strong>growth</strong> <strong>of</strong> <strong>III</strong>-V QDs<br />

directly on at silicon substrates has proven to be very challenging due to the<br />

defects formation caused by dislocations and anti-phase domains, which originate<br />

from the large lattice and thermal expansion mismatch and polar/non-polar<br />

nature <strong>of</strong> <strong>III</strong>/V and Si systems [1, 2, 94]. These structural defects are closely<br />

103

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