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Molecular beam epitaxial growth of III-V semiconductor ... - KOBRA

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2.3 Low-Dimensional Semiconductor (Nanostrtuctures)<br />

where ɛ is the dielectric constant <strong>of</strong> the material, e is the electron charge, m ∗<br />

is the eective reduced mass <strong>of</strong> the exciton 1/m ∗ = 1/m e + 1/m h , with m e and<br />

m h being the electron and hole eective masses, respectively.<br />

When the size <strong>of</strong> the quantum dot is smaller than the critical characteristic<br />

length or Exciton Bohr radius (Eq. 2.7), the electrons crowding lead to the<br />

splitting <strong>of</strong> the original energy levels into smaller ones with smaller gaps between<br />

each successive level. The Exciton Bohr radius is larger than the Bohr radius<br />

due to the eect <strong>of</strong> dielectric screening and the inuence <strong>of</strong> periodic lattice structure<br />

<strong>of</strong> the crystal. The quantum dots that have radii larger than the Exciton<br />

Bohr radius are said to be in the (weak connement regime). On the other hand,<br />

the ones that have radii smaller than the Exciton Bohr radius are said to be in<br />

the (strong connement regime) [22]. The strong connement <strong>of</strong> excitons in the<br />

quantum dots enhances the electron and hole interaction due to increased overlap<br />

<strong>of</strong> electron and hole wave functions in two ways. First, the overlap is enhanced<br />

because <strong>of</strong> reduced-dimensionality in 0D dots. Second, the electron and hole<br />

overlap is determined by the size and shape <strong>of</strong> the quantum dot, and the barrier<br />

height. Both eects signicantly aect the exciton binding energy. Therefore,<br />

the energy <strong>of</strong> the emitted photon is determined by the size <strong>of</strong> the quantum dot<br />

due to quantum connement eects.<br />

As it was mentioned in the thesis approach, this thesis will bring the focus in<br />

the next chapters to the <strong>growth</strong> and characterization <strong>of</strong> the <strong>III</strong>-V QDs on silicon<br />

substrate via molecular <strong>beam</strong> epitaxy (MBE) technique.<br />

19

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