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Molecular beam epitaxial growth of III-V semiconductor ... - KOBRA

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REFERENCES<br />

symbol<br />

Descriptions<br />

γ f<br />

Film-vacuum surface tension<br />

γ s<br />

Substrate-vacuum surface tension<br />

γ sf<br />

Substrate-lm surface tension<br />

ξ<br />

Poisson ratio<br />

µ ∗ Chemical potential<br />

β<br />

Constant<br />

f<br />

Lattice mist<br />

a L<br />

Layer lattice constant<br />

a s<br />

Substrate lattice constant<br />

ɛ<br />

Starin<br />

ɛ t<br />

Tensile strain<br />

ɛ ||<br />

In-plane strain<br />

<strong>III</strong> − V Group three and ve elements in periodic table<br />

δ<br />

Lattice relaxation<br />

h c<br />

Critical thickness<br />

G<br />

Shear modulus<br />

b<br />

Burger vector<br />

F L<br />

Line force mist<br />

F G<br />

Glide force<br />

S<br />

Parallel mist dislocation<br />

α L<br />

Layer thermal expansion coecient<br />

α s Substrate thermal expansion coecient<br />

T ◦ Initial temperature<br />

T<br />

Final temperature<br />

φ<br />

O-cut angle or contact angle<br />

µm Micrometer<br />

nm<br />

Nanometer<br />

w<br />

Terrace width<br />

L<br />

Length<br />

c<br />

Velocity <strong>of</strong> light<br />

T<br />

Temperature<br />

e<br />

Electron charge<br />

h<br />

Plank constant<br />

g E<br />

Energy state density<br />

E, E i , E f Energy states<br />

150

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