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Molecular beam epitaxial growth of III-V semiconductor ... - KOBRA

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5.3 Results and Discussion<br />

shorten the migration length <strong>of</strong> the group <strong>III</strong> species, because they can nd a<br />

bonding partner more easily and the incorporation into the crystal is faster. The<br />

desorption <strong>of</strong> group <strong>III</strong> species can also be countered by the V/<strong>III</strong> ratio, which<br />

eectively shifts desorption temperatures [84, 34]. The sticking coecient is also<br />

dependent on the V/<strong>III</strong> ratio. Too low V/<strong>III</strong> ratio values on the other hand<br />

increase the migration length, but also the probability <strong>of</strong> desorption.<br />

Figure 5.7: (1 × 1 µm 2 ) AFM images <strong>of</strong> 2 MLs InAs QDs grown using SK mode with<br />

dierent V/<strong>III</strong> ratios: (a) 15, (b) 25, and (c) 35.<br />

In addition, metallic droplets <strong>of</strong> group <strong>III</strong> species can liquefy on the substrate<br />

surface, which results in lower temperature In desorption and lower density QDs<br />

formation. This is a clear indication that the As 4 ux is an important parameter<br />

to control the QDs density.<br />

5.3.3.5 Indium Growth Rate<br />

In this investigation, the following <strong>growth</strong> parameters were used: 2 MLs InAs<br />

coverage, T G = 400 ◦ C and V/<strong>III</strong> ratio <strong>of</strong> 25 on n-doped Si (100) substrate. According<br />

to Fig. 5.8, the shape and size <strong>of</strong> InAs QDs are signicantly changed<br />

by increasing the In-<strong>growth</strong> rate from 108 nm/h (0.1 ML/s, Fig. 5.8(a)) to 324<br />

nm/h (0.3 ML/s, Fig. 5.8(b)). It seems that a reduction <strong>of</strong> the formation time can<br />

switch the InAs QDs shape from circular to dashed-like InAs, this dash structures<br />

is preferentially oriented on [110] crystal direction.<br />

73

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