Molecular beam epitaxial growth of III-V semiconductor ... - KOBRA
Molecular beam epitaxial growth of III-V semiconductor ... - KOBRA
Molecular beam epitaxial growth of III-V semiconductor ... - KOBRA
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MBE Growth <strong>of</strong> Self-Assembled InAs and InGaAs Quantum Dots Embedded in<br />
Silicon Matrix<br />
optimization <strong>of</strong> silicon surface preparation recipes, have led to a controlled formation<br />
<strong>of</strong> QDs on a at silicon substrate. Moreover, the MBE <strong>growth</strong> <strong>of</strong> n-type<br />
arsenic (As) doped silicon layers with a controlled doping prole as a preparation<br />
phase for the realization <strong>of</strong> P-N junctions will be also presented in this chapter,<br />
hence this chapter deals with all the <strong>growth</strong> aspects related to silicon matrix<br />
optimization with <strong>III</strong>/V QDs.<br />
In this contribution, the focus is on the basic <strong>growth</strong> studies addressing mainly<br />
morphological and structural properties <strong>of</strong> quantum dots like structures grown<br />
directly on silicon surfaces, with a main emphasis on surface preparation and<br />
<strong>growth</strong> parameters.<br />
5.2 Experimental Details<br />
All samples for the initial study and optimization were grown by a GEN II MBE<br />
system on exactly oriented n-type (100) silicon all gures, except Fig. 5.2(b),<br />
which was grown on (111) Si substrate orientation. The silicon substrate surfaces<br />
were ex-situ cleaned using buered HF (NH 4 /HF : H 2 O) (1:1) for 4 minutes<br />
as a pre-removal step <strong>of</strong> the surface native silicon dioxide (SiO 2 ) followed by an<br />
in-situ thermal atomic hydrogen (AH) assisted surface cleaning process at 500 ◦ C<br />
(45 minutes with P H = 3.7×10 −7 T orr) in the buer chamber. The nal thermal<br />
oxide desorption was done in the <strong>growth</strong> chamber within the temperature range<br />
<strong>of</strong> 700 − 900 ◦ C. The quality <strong>of</strong> the surface preparation and the dots formation<br />
process are monitored in-situ by reection high energy diraction. Additional improvement<br />
for the cleaning and <strong>growth</strong> was achieved by exposing the Si surface to<br />
low Ga ux (0.1 ML/s) (Fig. 5.3). Dierent <strong>growth</strong> parameters such as (<strong>growth</strong><br />
temperature, V/<strong>III</strong> ratio, In <strong>growth</strong> rate and InAs coverage) on structural properties<br />
<strong>of</strong> InAs QDs without buer layer (Sec. 5.3.2) and after depositing a 50 nm<br />
silicon buer layer (Sec. 5.3.3) were investigated.<br />
5.3 Results and Discussion<br />
This section presents the results <strong>of</strong> the <strong>epitaxial</strong> nucleation and <strong>growth</strong> optimization<br />
<strong>of</strong> InAs quantum dots and dashes on silicon substrates.<br />
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