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Molecular beam epitaxial growth of III-V semiconductor ... - KOBRA

Molecular beam epitaxial growth of III-V semiconductor ... - KOBRA

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Optimization <strong>of</strong> MEE and MBE <strong>growth</strong> <strong>of</strong> GaP Buer on Silicon Substrate<br />

Figure 7.8: (5 × 5 µm 2 ) AFM images <strong>of</strong> 40 nm GaP-MBE/10 nm GaP-MEE /Si. The<br />

RMS value is 1.3 nm without <strong>growth</strong> stop and with increased Ga <strong>growth</strong> rate from 100<br />

nm to 300 nm during the <strong>growth</strong> temperature ramping from MEE to MBE mode.<br />

We can conclude that the thin GaP-MEE/Si shows great promise as a virtual<br />

substrate for <strong>III</strong>-V on Si <strong>growth</strong>. These results are highly encouraging for further<br />

<strong>III</strong>-V/GaP/Si integrations for the potential applications.<br />

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