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Molecular beam epitaxial growth of III-V semiconductor ... - KOBRA

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Hetero<strong>epitaxial</strong> Growth <strong>of</strong> <strong>III</strong>-V Semiconductor on Silicon Substrates<br />

Where K s is the site-to-site hoping rate, a is the eective hopping distance<br />

between sites, E d is the diusion energy and T is the substrate temperature [33].<br />

Because <strong>of</strong> the complicated nature <strong>of</strong> the most surfaces, diusion is an complicated<br />

process. It should be pointed out that diusion is the process responsible for the<br />

degree <strong>of</strong> smoothness <strong>of</strong> the grown lm for a xed <strong>growth</strong> rate. Diusion atoms<br />

meet and bond with each other forming clusters that dier in size, depending on<br />

the deposit vapor or <strong>growth</strong> rate.<br />

Another crucial factor is the temperature <strong>of</strong> the substrate T . Increasing the<br />

temperature beyond certain limits leads to desorption <strong>of</strong> the molecules back into<br />

the reactor vacuum. Simply they do not contribute to the <strong>growth</strong>, but are lost.<br />

The desorption grows exponentially and the actual <strong>growth</strong> rate shrinks correspondingly<br />

(Eq. 3.5).<br />

R des ∝ f(θ) exp −E des<br />

K B T<br />

(3.5)<br />

The desorption rate R des is dependent on the degree <strong>of</strong> coverage (θ) and the<br />

desorption energy E des [33]. However, the small <strong>growth</strong> rates allow the adsorbed<br />

molecules to migrate on the substrate to a proper nucleation site for <strong>growth</strong>.<br />

The so called migration length is a measure <strong>of</strong> the distance the molecules can<br />

travel on the growing surface before being taken up by an attractive lattice site.<br />

Nucleation on smooth surfaces is not energetically favored. The most attractive<br />

sites are those on terraces and step edges on the growing surface as more chemical<br />

bonds to neighboring sites are possible.<br />

Growth parameters like substrate temperature T, <strong>growth</strong> rate (g) and the ratio<br />

<strong>of</strong> group V excess to group <strong>III</strong> ux (V/<strong>III</strong> ratio) have to be chosen appropriately<br />

for the desired application. The V/<strong>III</strong> ratio has a similar impact on the layer<br />

<strong>growth</strong> as the substrate temperature.<br />

Too high values shorten the migration<br />

length <strong>of</strong> the group <strong>III</strong> species, because they can nd a bonding partner more<br />

easily and the incorporation into the crystal is faster.<br />

deteriorate the layer quality as described above.<br />

However, this can also<br />

The desorption <strong>of</strong> group <strong>III</strong><br />

species can also be countered by the V/<strong>III</strong> ratio, which eectively shifts desorption<br />

temperatures [34, 20]. The sticking coecient is also dependent on the V/<strong>III</strong><br />

ratio. Too low values on the other hand increase the migration length, but also<br />

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