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sepam 20 user manual - Schneider Electric

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3<br />

Protection functions General<br />

Tripping curves<br />

Presentation of tripping curve operation and<br />

settings for protection functions using:<br />

b definite time<br />

b IDMT<br />

b timer hold.<br />

3/36<br />

MT10911<br />

DE50666<br />

Definite time protection<br />

The tripping time is constant. The time delay is started when the set point is overrun.<br />

t<br />

T<br />

Definite time protection principle.<br />

IDMT protection<br />

The operation time depends on the protected value (phase current, earth fault<br />

current, etc.) in accordance with standards IEC 60255-3, BS 142 and IEEE C-37112.<br />

Operation is represented by a characteristic curve, e.g.:<br />

b t = f(I) curve for the phase overcurrent function<br />

b t = f(I0) curve for the earth fault function.<br />

The rest of the document is based on t = f(I); the reasoning may be extended to other<br />

variables I0, etc.<br />

The curve is defined by:<br />

b its type (standard inverse, very inverse, extremely inverse, etc.)<br />

b current setting Is which corresponds to the vertical asymptote of the curve<br />

b time delay T which corresponds to the operation time for I = 10 Is.<br />

These 3 settings are made chronologically in the following order: type, Is current,<br />

time delay T.<br />

Changing the time delay T setting by x % changes all of the operation times in the<br />

curve by x %.<br />

t<br />

T<br />

Is<br />

type 1<br />

type 1,2<br />

1 1,2 10 <strong>20</strong> I/Is<br />

IDMT protection principle.<br />

The tripping time for I/Is values less than 1.2 depends on<br />

the type of curve selected.<br />

I<br />

Name of curve Type<br />

Standard inverse time (SIT) 1, 2<br />

Very inverse time (VIT or LTI) 1, 2<br />

Extremely inverse time (EIT) 1, 2<br />

Ultra inverse time (UIT) 1, 2<br />

RI curve 1<br />

IEC inverse time SIT / A 1<br />

IEC very inverse time VIT or LTI / B 1<br />

IEC extremely inverse time EIT / C 1<br />

IEEE moderately inverse (IEC / D) 1<br />

IEEE very inverse (IEC / E) 1<br />

IEEE extremely inverse (IEC / F) 1<br />

IAC inverse 1<br />

IAC very inverse 1<br />

IAC extremely inverse 1<br />

b when the monitored value is more than <strong>20</strong> times the set point, the tripping time is<br />

limited to the value corresponding to <strong>20</strong> times the set point.<br />

b if the monitored value exceeds the measurement capacity of Sepam (40 In for the<br />

phase current channels, <strong>20</strong> In0 for the residual current channels), the tripping time is<br />

limited to the value corresponding to the largest measurable value (40 In or <strong>20</strong> In0).<br />

PCRED301005EN - 06/<strong>20</strong>08

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