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(Cd,Mn)Te - Instytut Fizyki PAN

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BIBLIOGRAFIA DO ROZDZIAŁU 31. T. Piasecki, „Charakteryzacja złącza Schottky'ego metodą I-V” WydziałElektroniki Mikrosystemów i Fotoniki Wrocław (2008).2. A. Ziel, „Podstawy fizyczne elektroniki ciała stałego” WNT Warszawa (1980).3. http://www.icmm.csic.es/fis/english/evaporacion.html4. http://www.2670970.com/tyxy/images/Sputtering.JPG5. http://www.alacritas-consulting.com/sputter_deposition_for_thin_films.html6. L.Wang et al. „Electrical properties of contacts on p-type <strong>Cd</strong>Zn<strong>Te</strong> crystalsurface” Nucl. Instrum. Method A 448, (2000).7. T.E. Schlasinger, J.E. Toney, H. Yoon, E.Y. Lee, B.A. Brunett, L. Franks, R.B.James. “Cadmium zinc telluride and its use as a nuclear radiation detectormaterial” Materials Science and Engineering, R 32, (2001).8. W. Sang et al. “Primary study on the contact degradation mechanism of <strong>Cd</strong>Zn<strong>Te</strong>detectors” NIM A 527, (2004).9. S.H. Lee, „The comparison on the performance of a gamma spectrometr with thevariation of Pt(Au)/<strong>Cd</strong>Zn<strong>Te</strong>/Pt(Au interface” J. Crys. Growth 214/215 (2000).10. A. Burger et al.“Characterization of metal contacts on and surfaces of Cadmiumzinc telluride” NIM A 428 (1999).11. U. Lachish, “The role of contacts in semiconductor gamma radiation detectors”NIM A 403, (1998).12. S. Mergui, M. Hage-Ali, J. M. Koebel, P. Siffert, “Thermal annealing of golddeposited contacts on high resistivity p-type <strong>Cd</strong><strong>Te</strong> nuclear detectors” NIM A ,322, (1992).13. K. Chattopadhyay et al. “Thermal treatments of <strong>Cd</strong><strong>Te</strong> and <strong>Cd</strong>Zn<strong>Te</strong> detectors”,Proc. SPIE 4141, (2000).14. A. Rouse et al, “Interfacial chemistry and the performance of bromine-etched<strong>Cd</strong>Zn<strong>Te</strong> radiation detector devices” IEEE TNS, 49 (2002).15. A. Musa et al. “Poperties of electroless gold contacts on p-type <strong>Cd</strong><strong>Te</strong>” J. Appl.Phys. 54 (6) (1983).16. J. P. Ponpon, “On the properties of real <strong>Cd</strong><strong>Te</strong> surface” Appl. Phys. A 27 (1982).17. W. Monch, Semiconductor Surfaces and Interfaces, 2nd Edition, Vol. 347,Springer, Berlin, (1995)18. R. Arlt, V. Ivanov, A. Khusainov, SPIE Proc. 3115 (1997).76

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