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Online proceedings - EDA Publishing Association

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B. Dynamics of Energy Flows<br />

For a layout designer of switching networks, figure 4<br />

provides a quantitative prediction of the energy consumed<br />

and released by the switch. Immediately after the driving<br />

voltage is applied, a major part of energy is stored in the<br />

electrical field of the variable capacitor. The energy dissipation<br />

along the bias line resistor, caused by the induced<br />

current, is around fifty times smaller than the energy dissipated<br />

by the squeeze-film damping and therefore negligible.<br />

During the transition from up-state to down-state, the<br />

potential and kinetic energy increase with increasing cantilever<br />

deflection and velocity. At the same time, energy is<br />

dissipated by the squeeze-film damping.<br />

int[Vext(t)*i(t)]dt [microWs ]<br />

3<br />

2<br />

1<br />

0<br />

0 10 20 30 40 50 60 70<br />

time [us]<br />

Figure 4: Total energy delivered to the system and fed back.<br />

From the mechanical point of view, the system can be<br />

optimised either, to provide fast switching, to dissipate<br />

minimal energy, to minimise the actuation voltage or to reduce<br />

the stored energy in the on-state of the system. From<br />

the electrical point of view, the electrical signal can be preprocessed<br />

offering a desired wave-form in order to control<br />

the re-feeded power level, or to minimize the oscillation<br />

amplitudes and contact bouncing.<br />

VII.<br />

x 10 -4<br />

MEASUREMENTS<br />

The developed ohmic contact RF MEMS switch shows<br />

high isolation in the off-state and a low insertion<br />

loss in the on-state up to frequencies as high as<br />

[12].<br />

All processing was carried out in industrial fabrication<br />

line. The measurement results validate the theoretical<br />

11-13 <br />

May 2011, Aix-en-Provence, France<br />

<br />

Figure 5: fabricated ohmic contact MEMS switch in CPW configuration.<br />

model presented in the previous sections. All measurements<br />

are performed with switches fabricated within the same<br />

batch (figure 5).<br />

In order to ensure the initial conditions and the assumptions<br />

used in the model, concerning geometrical aspects,<br />

scanning electron microscopy is used. Scanning electron<br />

microscopy allows identifying cantilever bending and verifying<br />

geometric dimensions.<br />

The accessible electrical triggering characteristics are<br />

described by the bias threshold voltage resulting in an electrical<br />

through-connection of the signal path, and the restoring<br />

voltage, disconnecting the signal path. When performing<br />

the measurement in ambient environment, possible interaction<br />

with humidity and contamination of organic compounds<br />

on the contact surfaces can provoke an excess of<br />

force to overcome the action of an adhering passivation<br />

layer.<br />

Finally, the model is validated by the dynamic system<br />

response: the transition time, defined as the time passed between<br />

the supply of the bias potential and the event of first<br />

charge transferred by the electrical contacts, and the switching<br />

time, defined as the time passed between the supply of<br />

the bias potential and the event of continuous charge transfer<br />

by the electrical contacts.<br />

The test setup uses a Keithley 2400 voltage source, powering<br />

the collector path of a 2SC2911 npn-transistor form<br />

SANYO. The transistor gate is controlled by a HP 3312A<br />

function generator, providing a frequency variable square<br />

signal of positive half-waves with an amplitude set to<br />

131

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