Online proceedings - EDA Publishing Association
Online proceedings - EDA Publishing Association
Online proceedings - EDA Publishing Association
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A. Quasi-Static response<br />
In order to judge the microphone performance, we need to<br />
estimate the capacity variation ΔC induced by a known<br />
pressure. Supposing that we know the microphone frequency<br />
characteristics, we can do this estimation for DC values. The<br />
estimation of ΔC was done in three approaches. In all of them,<br />
we have compared the microphone capacity without a pressure<br />
with that with a pressure of 1 Pa applied on the diaphragm.<br />
The results obtained in the three cases are shown in Table IV.<br />
For the first approximation, we have used a non-perforated<br />
diaphragm (Fig. 7 (a)) because the electromechanical FEM<br />
simulations of the microphone with a perforated diaphragm<br />
have important computational time requirements, even if<br />
symmetry is assumed and a quarter of the model is simulated.<br />
Based on the predicted value of the pull-in voltage, V PI ,<br />
given by CoventorWare that is between 4.4 V and 4.5 V, we<br />
have decided to use the bias voltage V 0 of 1V. The<br />
corresponding capacitance variation is in Table IV (“FEM”<br />
line)<br />
We can verify these simulation results using an analytic<br />
approach. Indeed, if we consider just the maximum<br />
displacement of the diaphragm, we have the static equation:<br />
2<br />
k mem w max = F pressure + F electrostatic = PA +<br />
ε<br />
00<br />
AV<br />
−<br />
(14)<br />
2<br />
a max<br />
)<br />
And when P = 0 Pa, we have:<br />
max<br />
a<br />
P is the pressure acting on the diaphragm, A is the area of the<br />
diaphragm, V 0 is the bias voltage and B is a correction<br />
coefficient respecting the diaphragm deformation shape<br />
(Fig. 7 (b)). The pull-in effect occurs when the term on the left<br />
side of (15) reaches a maximum:<br />
∂<br />
∂w<br />
max<br />
11-13 <br />
May 2011, Aix-en-Provence, France<br />
<br />
2<br />
ha<br />
[ B ] =−<br />
0)(<br />
whw<br />
w =<br />
max<br />
When w max = w Pull-in , V<br />
leads to<br />
a max<br />
Pull−in<br />
=<br />
pull<br />
3<br />
8<br />
memhk<br />
a<br />
27ε<br />
BA<br />
0<br />
(16)<br />
− in<br />
3B<br />
(17)<br />
Thanks to (17) and knowing the pull-in voltage by FEM<br />
simulations we can calculate the correction coefficient:<br />
B = 0.385. Once B is calculated, we can solve (14) with the<br />
Cardan method and then calculate the capacitance variation.<br />
Results are summarized in Table IV (“calculation (nonperforated<br />
diaphragm)” line).<br />
simulation. We can see that the calculation and simulation<br />
results are very close. There is a small capacitance deviation is<br />
due to the parasitic capacitance that is taken into account in<br />
the FEM simulation and is not accounted in the analytic<br />
model.<br />
Now, we applied this model for the perforated diaphragm<br />
considering the same value of B that was obtained for the nonperforated<br />
diaphragm. The pull-in voltage is V PI = 4.24 V and<br />
Table IV shows the variation capacitance (“Calculation<br />
(perforated diaphragm)” line).<br />
TABLE IV<br />
CAPACITANCE VARIATION<br />
Approach Conditions w max (nm)<br />
Capacitance<br />
(pF)<br />
FEM<br />
P = 0 Pa<br />
V 0 = 1 V<br />
V 0 = 1 V<br />
53 2.123<br />
P = 1 Pa<br />
133 2.140<br />
V 0 = 1 V<br />
Calculation P = 0 Pa<br />
(nonperforated<br />
51 1.361<br />
P =1 Pa<br />
diaphragm V 0 = 1 V<br />
131 1.378<br />
Calculation<br />
(perforated<br />
diaphragm)<br />
P = 0 Pa<br />
V 0 = 1 V<br />
P = 1 Pa<br />
V 0 = 1 V<br />
57 1.151<br />
147 1.167<br />
ΔC (fF)<br />
(2 B wh<br />
According to the model, the obtained capacitance variation<br />
is very similar as in the non-perforated case. This fact can be<br />
explained either by the estimated value of the correction<br />
2<br />
2 ε<br />
00<br />
AV coefficient B or by a compensation of the decreased stiffness<br />
B<br />
max<br />
)(<br />
=−(15)<br />
whw by a smaller area of a perforated diaphragm.<br />
2kmem<br />
B. Dynamic response<br />
We have used the microphone equivalent circuit, shown in<br />
Fig. 3, to predict the dynamic response of the microphone. The<br />
microphone dimensions considered in the simulations are<br />
shown in Table I. Fig. 8 shows the frequency range and the<br />
open circuit sensitivity of the microphone.<br />
17<br />
17<br />
16<br />
(a)<br />
(b)<br />
Fig. 7. Microphone structure used for simulation (a). Schematic effective<br />
displacement (b).<br />
Fig. 8. Simulated frequency range and open circuit sensitivity of the<br />
microphone.<br />
Fig. 9 shows the spectral density of the output noise voltage.<br />
From the spectral density, we can calculate the signal-to-noise<br />
ratio (SNR) of the considered microphone. The basic<br />
microphone characteristics are summarized in Table V.<br />
Note that k mem and A have been determined for the nonperforated<br />
diaphragm to have the same conditions as for the<br />
©<strong>EDA</strong> <strong>Publishing</strong>/DTIP 2011<br />
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