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Online proceedings - EDA Publishing Association

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A. Quasi-Static response<br />

In order to judge the microphone performance, we need to<br />

estimate the capacity variation ΔC induced by a known<br />

pressure. Supposing that we know the microphone frequency<br />

characteristics, we can do this estimation for DC values. The<br />

estimation of ΔC was done in three approaches. In all of them,<br />

we have compared the microphone capacity without a pressure<br />

with that with a pressure of 1 Pa applied on the diaphragm.<br />

The results obtained in the three cases are shown in Table IV.<br />

For the first approximation, we have used a non-perforated<br />

diaphragm (Fig. 7 (a)) because the electromechanical FEM<br />

simulations of the microphone with a perforated diaphragm<br />

have important computational time requirements, even if<br />

symmetry is assumed and a quarter of the model is simulated.<br />

Based on the predicted value of the pull-in voltage, V PI ,<br />

given by CoventorWare that is between 4.4 V and 4.5 V, we<br />

have decided to use the bias voltage V 0 of 1V. The<br />

corresponding capacitance variation is in Table IV (“FEM”<br />

line)<br />

We can verify these simulation results using an analytic<br />

approach. Indeed, if we consider just the maximum<br />

displacement of the diaphragm, we have the static equation:<br />

2<br />

k mem w max = F pressure + F electrostatic = PA +<br />

ε<br />

00<br />

AV<br />

−<br />

(14)<br />

2<br />

a max<br />

)<br />

And when P = 0 Pa, we have:<br />

max<br />

a<br />

P is the pressure acting on the diaphragm, A is the area of the<br />

diaphragm, V 0 is the bias voltage and B is a correction<br />

coefficient respecting the diaphragm deformation shape<br />

(Fig. 7 (b)). The pull-in effect occurs when the term on the left<br />

side of (15) reaches a maximum:<br />

∂<br />

∂w<br />

max<br />

11-13 <br />

May 2011, Aix-en-Provence, France<br />

<br />

2<br />

ha<br />

[ B ] =−<br />

0)(<br />

whw<br />

w =<br />

max<br />

When w max = w Pull-in , V<br />

leads to<br />

a max<br />

Pull−in<br />

=<br />

pull<br />

3<br />

8<br />

memhk<br />

a<br />

27ε<br />

BA<br />

0<br />

(16)<br />

− in<br />

3B<br />

(17)<br />

Thanks to (17) and knowing the pull-in voltage by FEM<br />

simulations we can calculate the correction coefficient:<br />

B = 0.385. Once B is calculated, we can solve (14) with the<br />

Cardan method and then calculate the capacitance variation.<br />

Results are summarized in Table IV (“calculation (nonperforated<br />

diaphragm)” line).<br />

simulation. We can see that the calculation and simulation<br />

results are very close. There is a small capacitance deviation is<br />

due to the parasitic capacitance that is taken into account in<br />

the FEM simulation and is not accounted in the analytic<br />

model.<br />

Now, we applied this model for the perforated diaphragm<br />

considering the same value of B that was obtained for the nonperforated<br />

diaphragm. The pull-in voltage is V PI = 4.24 V and<br />

Table IV shows the variation capacitance (“Calculation<br />

(perforated diaphragm)” line).<br />

TABLE IV<br />

CAPACITANCE VARIATION<br />

Approach Conditions w max (nm)<br />

Capacitance<br />

(pF)<br />

FEM<br />

P = 0 Pa<br />

V 0 = 1 V<br />

V 0 = 1 V<br />

53 2.123<br />

P = 1 Pa<br />

133 2.140<br />

V 0 = 1 V<br />

Calculation P = 0 Pa<br />

(nonperforated<br />

51 1.361<br />

P =1 Pa<br />

diaphragm V 0 = 1 V<br />

131 1.378<br />

Calculation<br />

(perforated<br />

diaphragm)<br />

P = 0 Pa<br />

V 0 = 1 V<br />

P = 1 Pa<br />

V 0 = 1 V<br />

57 1.151<br />

147 1.167<br />

ΔC (fF)<br />

(2 B wh<br />

According to the model, the obtained capacitance variation<br />

is very similar as in the non-perforated case. This fact can be<br />

explained either by the estimated value of the correction<br />

2<br />

2 ε<br />

00<br />

AV coefficient B or by a compensation of the decreased stiffness<br />

B<br />

max<br />

)(<br />

=−(15)<br />

whw by a smaller area of a perforated diaphragm.<br />

2kmem<br />

B. Dynamic response<br />

We have used the microphone equivalent circuit, shown in<br />

Fig. 3, to predict the dynamic response of the microphone. The<br />

microphone dimensions considered in the simulations are<br />

shown in Table I. Fig. 8 shows the frequency range and the<br />

open circuit sensitivity of the microphone.<br />

17<br />

17<br />

16<br />

(a)<br />

(b)<br />

Fig. 7. Microphone structure used for simulation (a). Schematic effective<br />

displacement (b).<br />

Fig. 8. Simulated frequency range and open circuit sensitivity of the<br />

microphone.<br />

Fig. 9 shows the spectral density of the output noise voltage.<br />

From the spectral density, we can calculate the signal-to-noise<br />

ratio (SNR) of the considered microphone. The basic<br />

microphone characteristics are summarized in Table V.<br />

Note that k mem and A have been determined for the nonperforated<br />

diaphragm to have the same conditions as for the<br />

©<strong>EDA</strong> <strong>Publishing</strong>/DTIP 2011<br />

<br />

313

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