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Online proceedings - EDA Publishing Association

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11-13 <br />

May, 2011, Aix-en-Provence, France<br />

<br />

Fabrication of High Aspect Ratio Nanoporous Array<br />

on Silicon<br />

Jing-Yu Ho 1 1, 2*<br />

and Gou-Jen Wang 1 Department of Mechanical Engineering<br />

2 Graduate Institute of Biomedical Engineering<br />

National Chung-Hsing University, Taichung 40227, Taiwan<br />

Tel:+886-4-22840725 x 320<br />

Email: gjwang@dragon.nchu.edu.tw<br />

Abstract- In this study, a simple method for the fabrication of high<br />

aspect ratio silicon nanoporous arrays is developed. A N-type<br />

silicon wafer is used as the material; a micro-scale pattern of the<br />

desired porous array is transferred to the front surface of the<br />

silicon wafer by photolithography; the wafer is placed in a<br />

home-made fixture to efficiently expel the etching generated air<br />

and promptly hold the back-side illumination light; a halogen<br />

lamp is used as the light source for backside illumination to<br />

enhance the electron-hole pairs generation; anodization is then<br />

processed using a new etchant which consists of the hydrofluoric<br />

acid and the EtOH and EMSO mixed surfactant to effectively<br />

polish the pore surface and sharp the tips of the etched pores. A<br />

nanochannel array with nano-tip being 61.4 nm is obtained.<br />

I. INTRODUCTION<br />

Porous silicon has attracted increasing interest owing to the<br />

advantages such as easily being fabricated in large area, pores<br />

being able to be arranged in order and patterned, and pores’<br />

shape being able to be adjusted by the process parameters. In<br />

addition, the semiconducting characteristic enables a porous<br />

silicon device to reveal different physical and/or chemical<br />

properties due to variation of porosity. Porous silicon can be<br />

found variety applications in light emitting diode (LED) [1],<br />

photodetector [2], solar cell [3], photonic crystal, photo sensor<br />

[4], biosensor [5], and field emission display [6].<br />

It has been nearly 50 years since the invention of porous<br />

silicon. However, the formation mechanism of porous silicon is<br />

still being developed. Parkhutik et al. [7] proposed that the<br />

relatively thinner oxide layer between the pores and the<br />

substrate enhances the electric field at each pore end; hence the<br />

silicon atom can easily acquire electric hole then dissolves. A<br />

high aspect ratio structure can thus be obtained. The basic<br />

principle is similar to that of the anodic aluminum oxide.<br />

Unagami [8] proposed that the porous silicon layer (PSL) is<br />

constructed by the local dissolution of silicon which happens<br />

only at the base of the pores. The divalent and the tetravalent<br />

reactions of silicon with hydrofluoric acid (HF) are the main<br />

driving forces for the dissolution of silicon in the pores.<br />

Theunissen et al. [9] reported that at the tip of a pore in N-type<br />

material, silicon atoms are likely to reach the breakdown<br />

voltage then dissolve due to the concentration of electric field.<br />

Beale [10] suggested that the depletion layer influences the<br />

distribution of the electric field in the silicon substrate, hence<br />

affects the porous structure. Smith et al. [11] proposed that the<br />

diffusion of the electric holes toward the interface between the<br />

silicon material and the etching solution determines the etching<br />

process. Lehmann et al. [12] pointed out that the band gap of<br />

the whole system is increased after the growth of the porous<br />

silicon such that the charge concentration in the porous silicon<br />

is reduced. A high aspect ratio pore array thus can be produced.<br />

Several factors affect the structure of a silicon porous array.<br />

Rönnebeck et al. [13] investigated the etching behavior in<br />

N-type and P-type materials. It was pointed out that the degree<br />

of doping in silicon substrate influences the etching results<br />

since it determines the thickness of the depletion layer.<br />

Carstensen et al. [14] compared the effects of HF concentration,<br />

different surfactants, and illumination intensity. Tsuboi et al.<br />

[15] studied the influences of the applied field induced<br />

polarization of the surfactant on the etching results. Among<br />

those reported studies, the size of the pores ranges from<br />

submicron to several micron. For delicate applications such as<br />

the detection of DNA sequences, nano-scale pores are desired.<br />

In this study, a simple process for the fabrication of<br />

nano-size silicon porous array is proposed. A N-type silicon<br />

wafer is used as the material; a micro-scale pattern of the<br />

desired porous array is transferred to the front surface of the<br />

silicon wafer by photolithography; the wafer is placed in a<br />

home-made fixture; the anodization is then processed using HF<br />

as the etching solution mixed with two surfactants to smoothen<br />

the etched surface under backside illumination.<br />

2.1 Materials<br />

II.<br />

MATERIALS AND METHODS<br />

(1) N-type silicon wafer<br />

As mentioned, diffusion of the electric holes plays an<br />

important role in the etching process of silicon [11]. Since the<br />

major carriers in P-type material are electric holes, the<br />

dissolution rate of silicon in P-type material is higher than that<br />

in N-type material. However, the etching process in P-type<br />

material is difficult to be well controlled. Lateral etching is the<br />

general problem. In this study, N-type material with thickness<br />

and resistivity being 525 ± 25μm and 1~100Ω-cm 2 respectively<br />

©<strong>EDA</strong> <strong>Publishing</strong>/DTIP 2011<br />

<br />

23

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